Absolute Präzisionsbestimmung von Gitterkonstanten an Germanium- und Aluminium-Einkristallen mit Elektroneninterferenzen

1967 ◽  
Vol 22 (1) ◽  
pp. 92-95 ◽  
Author(s):  
W. Witt
Keyword(s):  
Electron Diffraction ◽  
Lattice Constant ◽  
Bulk Material ◽  
X Ray Diffraction ◽  
Full Agreement ◽  
X Ray ◽  
Lattice Constants ◽  
Precision Determination ◽  
Subsequent Chemical

An absolute precision determination of lattice constants by electron diffraction is made with thin monocrystalline films of germanium and aluminium, having a thickness between 1000 and 5000 A. The films are prepared from the bulk material by mechanical polishing and subsequent chemical polishing or etching. The obtained values for the lattice constant α of both materials are within the accuracy Δα/α= ±3·10-5 of measurement in full agreement with the corresponding values obtained by X-ray diffraction (Smakula and Kalnajs).

Structure determination of modulated structures by powder X-ray diffraction and electron diffraction

2016 ◽  
Vol 3 (11) ◽  
pp. 1351-1362 ◽  
Author(s):  
Zhengyang Zhou ◽  
Lukáš Palatinus ◽  
Junliang Sun
Keyword(s):  
Electron Diffraction ◽  
Structure Determination ◽  
X Ray Diffraction ◽  
X Ray ◽  
Modulated Structures ◽  
Conventional Methods

The combination of PXRD and ED is applied to determine modulated structures which resist solution by more conventional methods.

Interrupted silicogermanate with 10-ring channels: synthesis and structure determination by combining rotation electron diffraction and powder X-ray diffraction

2017 ◽  
Vol 4 (10) ◽  
pp. 1654-1659 ◽  
Author(s):  
Yilin Wang ◽  
Yunchen Wang ◽  
Jie Su ◽  
Xiaowei Song ◽  
Wei Wan ◽  
...  
Keyword(s):  
Electron Diffraction ◽  
Structure Determination ◽  
X Ray Diffraction ◽  
X Ray

Structure determination of silicogermanate with sti layers pillared by D4R/Ge7 units by rotation electron diffraction and powder X-ray diffraction.

Characterization of CdCrTe Layers Obtained by Pulsed Laser Deposition

2013 ◽  
Vol 203-204 ◽  
pp. 193-197
Author(s):  
Piotr Sagan ◽  
Volodymyr Popovych ◽  
Mariusz Bester ◽  
Marian Kuzma
Keyword(s):  
Solid Solution ◽  
Electron Diffraction ◽  
Lattice Constant ◽  
Pulse Length ◽  
Pulsed Laser ◽  
Thin Layers ◽  
Laser Deposition ◽  
X Ray Diffraction ◽  
X Ray

In this paper we have obtained CdCrTe thin layers by PLD method using the YAG:Nd3+ laser with pulse length 250μs. Synthesized CdCrTe solid solution with 50% at. of Cr has been taken as a target. The layers were deposited on KCl substrate. The target and films were analyzed using X-ray diffraction, TEM microscope and THEED electron diffraction. The morphology of the layers are homogenous. However, we have detected several crystallographic phases: cubic CdTe, hexagonal Cr and hexagonal Te. From the measurements of lattice constant of the layer, their composition was determined to be x=0,14

Composition and Lattice Constant Evaluation of the Garnet System (Dy, Gd)3Ga5O12

1972 ◽  
Vol 16 ◽  
pp. 177-185
Author(s):  
L. A. Moudy ◽  
S. B. Austerman
Keyword(s):  
Thin Film ◽  
Rare Earth ◽  
Lattice Constant ◽  
Direct Measurement ◽  
Magnetic Thin Film ◽  
X Ray Diffraction ◽  
X Ray ◽  
Lattice Matching ◽  
Lattice Constants ◽  
Constant Control

AbstractCompositional and lattice constant control of non-magnetic garnet substrates are required for suitable lattice matching with epitaxially deposited magnetic thin film. Suitable substrates for this purpose are the simple and mixed rare earth garnets. Lattice constants were obtained on Czochralski grown crystals by conventional x-ray diffraction powder techniques with a precision of ± .0005Å. An x-ray fluorescence method was developed to determine crystal composition with a precision of ± 0.5 percent. The precision with which a can be determined indirectly by x-ray fluorescence is ± 0.0082Å, which is comparable with that from direct measurement.

scholarly journals Three-dimensional electron diffraction for porous crystalline materials: structural determination and beyond

2021 ◽  
Author(s):  
Zhehao Huang ◽  
Tom Willhammar ◽  
Xiaodong Zou
Keyword(s):  
Electron Diffraction ◽  
Three Dimensional ◽  
Structural Determination ◽  
New Materials ◽  
Dimensional Electron ◽  
X Ray Diffraction ◽  
Crystalline Materials ◽  
X Ray ◽  
Structural Details

Three-dimensional electron diffraction is a powerful tool for accurate structure determination of zeolite, MOF, and COF crystals that are too small for X-ray diffraction. By revealing the structural details, the properties of the materials can be understood, and new materials and applications can be designed.

Absolute Präzisionsbestimmungen von Gitterkonstanten an Silicium-Einkristallen mit Elektroneninterferenzen *

1967 ◽  
Vol 22 (1) ◽  
pp. 79-91
Author(s):  
H. Kiendl
Keyword(s):  
Electron Diffraction ◽  
X Ray Diffraction ◽  
Present Measurement ◽  
X Ray ◽  
Lattice Constants ◽  
Solid Crystal ◽  
Accuracy Of Measurement ◽  
A New Technique ◽  
Relative Measurements ◽  
Ray Methods

Absolute precise determinations of lattice constants by electron diffraction, so far carried out for polycrystals with an accuracy of Δ a/a= ± 3 ·10-5 are now applied to thin single crystals. This precision is comparable with that of absolute X-ray methods. The factors determining the accuracy of measurement are discussed. — The lattice constants of thin silicon specimens, prepared by a new technique from a solid crystal, show none of the anomalies known from specimens prepared by vacuum evaporation and are in agreement with the value obtained by X-ray diffraction. These specimens therefore can be used as a standard for relative measurements of lattice constants. — The present measurement supports a new value of the conversion constant Λ between X-units and Angstrom units, which has been published (but not yet recommended) in 1965.

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