Composition and Lattice Constant Evaluation of the Garnet System (Dy, Gd)3Ga5O12

1972 ◽  
Vol 16 ◽  
pp. 177-185
Author(s):  
L. A. Moudy ◽  
S. B. Austerman
Keyword(s):  
Thin Film ◽  
Rare Earth ◽  
Lattice Constant ◽  
Direct Measurement ◽  
Magnetic Thin Film ◽  
X Ray Diffraction ◽  
X Ray ◽  
Lattice Matching ◽  
Lattice Constants ◽  
Constant Control

AbstractCompositional and lattice constant control of non-magnetic garnet substrates are required for suitable lattice matching with epitaxially deposited magnetic thin film. Suitable substrates for this purpose are the simple and mixed rare earth garnets. Lattice constants were obtained on Czochralski grown crystals by conventional x-ray diffraction powder techniques with a precision of ± .0005Å. An x-ray fluorescence method was developed to determine crystal composition with a precision of ± 0.5 percent. The precision with which a can be determined indirectly by x-ray fluorescence is ± 0.0082Å, which is comparable with that from direct measurement.

scholarly journals The Use of Curium as a Rare Earth Substitute in High Tc‐Related Compounds

1989 ◽  
Vol 169 ◽  
Author(s):  
L Soderholm ◽  
C.W. Williams ◽  
U. Welp
Keyword(s):  
Rare Earth ◽  
Magnetic Measurements ◽  
X Ray Diffraction ◽  
High Tc ◽  
X Ray ◽  
Lattice Constants ◽  
Effective Moment ◽  
Free Ion ◽  
Related Compounds ◽  
Cu Ions

AbstractWe report the synthesis of Cm2CuO4. The lattice constants of this material, determined by x‐ray diffraction, show it to be a new member of the isostructural series R2CuO4 (R=Pr, Nd, Sm, Eu, and Gd). Analysis of magnetic measurements is consistent with a free‐ion effective moment for Cm3+, with no contribution to the susceptibility from Cu‐ions.

Lattice parameters and optical absorption of CuIn1-xGaxSe2 thin films

1999 ◽  
Vol 77 (7) ◽  
pp. 515-520
Author(s):  
AAI Al-Bassam
Keyword(s):  
Thin Film ◽  
Crystal Structure ◽  
Thin Films ◽  
Grain Size ◽  
Lattice Parameters ◽  
X Ray Diffraction ◽  
X Ray ◽  
Lattice Constants ◽  
Cubic Structure ◽  
Ga Content

Thin film polycrystalline solar cells based on CuIn1–xGaxSe2 have been fabricated and studied with x values from 0 to 1.0. The lattice parameters, grain size, and band gap were measured. Crystal structure and X-ray data of CuIn1–xGaxSe2 were determined using X-ray diffractometry. These materials had a cubic structure with x ≥ 0.5 and a tetragonal structure with x ≤ 0.5. The lattice constants vary linearly with composition. Grain size was measured using X-ray diffraction where the grain size increased linearly with Ga content. A grain size of 1.83-3.52 μm was observed with x ≤ 0.5, while it increased to 4.53 μm for x = 0.58.PACS No.: 70.73

CoPt/C NANOGRANULAR MAGNETIC THIN FILM

2005 ◽  
Vol 19 (14) ◽  
pp. 2261-2271 ◽  
Author(s):  
TONG LI ◽  
HUI YAN ◽  
HAI WANG ◽  
WU ZHENG
Keyword(s):  
Thin Film ◽  
Grain Size ◽  
Carbon Matrix ◽  
Magnetic Interactions ◽  
High Coercivity ◽  
Magnetic Thin Film ◽  
X Ray Diffraction ◽  
X Ray ◽  
High Density Recording ◽  
Deposition Mode

Granular Co 30 Pt 70/ C and Co 45 Pt 55/ C films, consisting of nanoparticle CoPt phases embedded in a carbon matrix, have been made by co-sputtering from CoPt and C targets using a tandem deposition mode. X-ray diffraction shows the existence of hard CoPt phase embedded in an amorphous C matrix after annealing. The coercivities for CoPt/C are strongly dependent on C and Pt composition. Films with coercivity of up to 5.4 kOe and grain size of 7 nm can be obtained. The development of shoulder in hysteresis loop may be contributed to the co-existence of magnetic soft CoPt 3 and hard CoPt phases and the magnetic interactions between them. High remanence Mr/Ms (>0.8) found in our samples indicates the presence of the intergranular interactions in the samples. Observed positive contributions of δm also give evidence of the existence of exchange interaction. High coercivity and large Mr/Ms make granular CoPt/C film with magnetic nanoparticles very attractive for next-generation high-density recording.

Absolute Präzisionsbestimmung von Gitterkonstanten an Germanium- und Aluminium-Einkristallen mit Elektroneninterferenzen

1967 ◽  
Vol 22 (1) ◽  
pp. 92-95 ◽  
Author(s):  
W. Witt
Keyword(s):  
Electron Diffraction ◽  
Lattice Constant ◽  
Bulk Material ◽  
X Ray Diffraction ◽  
Full Agreement ◽  
X Ray ◽  
Lattice Constants ◽  
Precision Determination ◽  
Subsequent Chemical

An absolute precision determination of lattice constants by electron diffraction is made with thin monocrystalline films of germanium and aluminium, having a thickness between 1000 and 5000 A. The films are prepared from the bulk material by mechanical polishing and subsequent chemical polishing or etching. The obtained values for the lattice constant α of both materials are within the accuracy Δα/α= ±3·10-5 of measurement in full agreement with the corresponding values obtained by X-ray diffraction (Smakula and Kalnajs).

Electrodeposition of Nanocrystalline CoNiFe Thin Films Prepared by Cyclic Voltammetry

2009 ◽  
Vol 620-622 ◽  
pp. 731-734 ◽  
Author(s):  
Chao Cai ◽  
Qiu Ping Wang ◽  
Zhao Zhang ◽  
Jian Feng Yang
Keyword(s):  
Thin Film ◽  
Cyclic Voltammetry ◽  
Growth Process ◽  
Magnetic Flux Density ◽  
Magnetic Thin Film ◽  
X Ray Diffraction ◽  
Soft Magnetic ◽  
X Ray ◽  
Xrd Techniques ◽  
Scanning Electron

The electroplating behavior of nanocrystalline CoNiFe soft magnetic thin film with high saturation magnetic flux density and low coercivity was investigated using cyclic voltammetry and chronoamperometry methods in conjunction with the scanning electron microscopy (SEM/EDX) and X-ray diffraction (XRD) techniques. The results show that, the co-deposition of CoNiFe alloy behaves anomalously. And the nucleation/growth process of CoNiFe ternary alloy followed 3D instantaneous mechanism at higher potentials, while in the case of lower potentials it followed 3D progressive mechanism.

Palladium Nanowire Thin Films via Template Growth

2003 ◽  
Vol 775 ◽  
Author(s):  
Donghai Wang ◽  
David T. Johnson ◽  
Byron F. McCaughey ◽  
J. Eric Hampsey ◽  
Jibao He ◽  
...  
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Thin Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Conductive Substrate ◽  
Palladium Nanowires ◽  
Efficient Route ◽  
Silica Thin Film

AbstractPalladium nanowires have been electrodeposited into mesoporous silica thin film templates. Palladium continually grows and fills silica mesopores starting from a bottom conductive substrate, providing a ready and efficient route to fabricate a macroscopic palladium nanowire thin films for potentially use in fuel cells, electrodes, sensors, and other applications. X-ray diffraction (XRD) and transmission electron microscopy (TEM) indicate it is possible to create different nanowire morphology such as bundles and swirling mesostructure based on the template pore structure.

scholarly journals High Pressure X-ray Diffraction as a Tool for Designing Doped Ceria Thin Films Electrolytes

Coatings ◽  
2021 ◽  
Vol 11 (6) ◽  
pp. 724
Author(s):  
Sara Massardo ◽  
Alessandro Cingolani ◽  
Cristina Artini
Keyword(s):  
Thin Films ◽  
High Pressure ◽  
Rare Earth ◽  
Ionic Conductivity ◽  
Bulk Material ◽  
Threshold Temperature ◽  
Doped Ceria ◽  
X Ray Diffraction ◽  
X Ray ◽  
Rare Earth Doped

Rare earth-doped ceria thin films are currently thoroughly studied to be used in miniaturized solid oxide cells, memristive devices and gas sensors. The employment in such different application fields derives from the most remarkable property of this material, namely ionic conductivity, occurring through the mobility of oxygen ions above a certain threshold temperature. This feature is in turn limited by the association of defects, which hinders the movement of ions through the lattice. In addition to these issues, ionic conductivity in thin films is dominated by the presence of the film/substrate interface, where a strain can arise as a consequence of lattice mismatch. A tensile strain, in particular, when not released through the occurrence of dislocations, enhances ionic conduction through the reduction of activation energy. Within this complex framework, high pressure X-ray diffraction investigations performed on the bulk material are of great help in estimating the bulk modulus of the material, and hence its compressibility, namely its tolerance toward the application of a compressive/tensile stress. In this review, an overview is given about the correlation between structure and transport properties in rare earth-doped ceria films, and the role of high pressure X-ray diffraction studies in the selection of the most proper compositions for the design of thin films.

scholarly journals High-pressure synthesis of REB5O8(OH)2 (RE = Ho, Er, Tm)

2020 ◽  
Vol 0 (0) ◽  
Author(s):  
Michael Zoller ◽  
Hubert Huppertz
Keyword(s):  
High Pressure ◽  
Rare Earth ◽  
Ir Spectroscopy ◽  
Earth Metal ◽  
Monoclinic Space Group ◽  
X Ray Diffraction ◽  
X Ray ◽  
Structure Solution ◽  
Pressure Synthesis ◽  
The Rare Earth

AbstractThe rare earth oxoborates REB5O8(OH)2 (RE = Ho, Er, Tm) were synthesized in a Walker-type multianvil apparatus at a pressure of 2.5 GPa and a temperature of 673 K. Single-crystal X-ray diffraction data provided the basis for the structure solution and refinement. The compounds crystallize in the monoclinic space group C2 (no. 5) and are composed of a layer-like structure containing dreier and sechser rings of corner sharing [BO4]5− tetrahedra. The rare earth metal cations are coordinated between two adjacent sechser rings. Further characterization was performed utilizing IR spectroscopy.

scholarly journals Deep learning for visualization and novelty detection in large X-ray diffraction datasets

2021 ◽  
Vol 7 (1) ◽  
Author(s):  
Lars Banko ◽  
Phillip M. Maffettone ◽  
Dennis Naujoks ◽  
Daniel Olds ◽  
Alfred Ludwig
Keyword(s):  
Thin Film ◽  
Crystal Structure ◽  
Artificial Intelligence ◽  
Deep Learning ◽  
Novelty Detection ◽  
Structural Similarity ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Patterns ◽  
Post Hoc

AbstractWe apply variational autoencoders (VAE) to X-ray diffraction (XRD) data analysis on both simulated and experimental thin-film data. We show that crystal structure representations learned by a VAE reveal latent information, such as the structural similarity of textured diffraction patterns. While other artificial intelligence (AI) agents are effective at classifying XRD data into known phases, a similarly conditioned VAE is uniquely effective at knowing what it doesn’t know: it can rapidly identify data outside the distribution it was trained on, such as novel phases and mixtures. These capabilities demonstrate that a VAE is a valuable AI agent for aiding materials discovery and understanding XRD measurements both ‘on-the-fly’ and during post hoc analysis.

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