Use of X-Ray Diffraction with the Gaussian Curve Method to Evaluate the Hardening in Quenched Steels

1986 ◽  
Vol 14 (1) ◽  
pp. 33 ◽  
Author(s):  
AS Kleinberg ◽  
B Grugan ◽  
K Greene ◽  
B Benzing ◽  
JR Schroeder ◽  
...  
1990 ◽  
Vol 34 ◽  
pp. 633-642
Author(s):  
Masanori Kurita ◽  
Kenzo Chiaki

AbstractPlastic deformation of metals will broaden the x-ray diffraction line. The diffraction line around its peak can he approximated by a Gaussian function. The broadness of the diffraction line can be evaluated by the standard deviation, called Gaussian curve parameter (GCP), of a Gaussian function approximating the diffraction peak. Plastic strains applied to mild steels by simple and combined tension, compression, and tortion were correlated with GCP. Two kinds of GCP's were determined; the one, GCP α', was determined from the diffraction line corrected for the background counts, and the other, GCP α, was from the line uncorrected for the background, The GCP α' can be obtained from the GCP α asα' = 0.936α + 0.011This equation shows that the background subtraction can be omitted in determining GCP. The equivalent plastic strain ɛeq can be evaluated from the GCP a asɛeq - 0.000108 x 103.97αThis x-ray method allows rapid measurement of complex plastic strain without touching specimens.


2008 ◽  
Vol 2008 ◽  
pp. 1-6 ◽  
Author(s):  
Guido Ennas ◽  
Maria F. Casula ◽  
Sergio Marras ◽  
Gabriele Navarra ◽  
Alessandra Scano ◽  
...  

A nanocomposite with an FeOOH/SiO2ratio equal to 17.7 wt% and the pertinent matrix, obtained by etching away the nanoparticles through reaction with hydrochloric acid, were investigated by XRD, TGA-DTA, heliostereopicnometry, BET, and TEM techniques. The study shows the presence in the nanocomposite of ferrihydrite nanoparticles phase with average dimensions around 4 nm. The FeOOH nanoparticles structure was analyzed by synchrotron X-ray diffraction data using the distribution difference curve method. The porous structure of the matrix resulting by etching away the nanoparticles differs significantly from that of a pureSiO2sample obtained by hydrolysis of TEOS under the same operative conditions followed in the nanocomposite preparation.


2005 ◽  
Vol 76 (3) ◽  
pp. 036106 ◽  
Author(s):  
L. D. Doucette ◽  
M. Pereira da Cunha ◽  
R. J. Lad

1988 ◽  
Vol 32 ◽  
pp. 459-469 ◽  
Author(s):  
Masanori Kurita ◽  
Ikuo Ihara ◽  
Nobuyuki Ono

The residual stress induced by grinding or some thermal treatment has a large effect on the strength of ceramics. The X-ray technique can be used to nondestructively measure the residual stress in small areas on the surface of polycrystalline materials. The X-ray stress measurement is based on. the continuum mechanics for macroscopically isotropic polycrystalline materials. In this method, the stress value is calculated selectively from strains of a particular diffraction plane in the grains which are favorably oriented for the diffraction. In general, however, the elastic constants of a single crystal depend on the plane of the lattice, since a single crystal is anisotropic, The behavior of the deformation of individual crystals in the aggregate of polycrystalline materials under applied stress has not yet been solved successfully. Therefore, the stress constant and elastic constants for a particular diffracting plane should be determined experimentally in order to determine the residual stress accurately by X-ray diffraction.


1984 ◽  
Vol 12 (1) ◽  
pp. 13 ◽  
Author(s):  
R Horstman ◽  
KA Peters ◽  
RL Meltzer ◽  
MB Vieth ◽  
M Kurita ◽  
...  

2008 ◽  
Vol 584-586 ◽  
pp. 518-522 ◽  
Author(s):  
Antonia Neels ◽  
Philippe Niedermann ◽  
Alex Dommann

In single crystal silicon (SCSi) MEMS devices, crystalline imperfection is recognized to favor failure. A DRIE etched SCSi structure was built to study the crystal strain profile in dependence of the SCSi deformation by applying a mechanical force. High resolution X-ray diffraction methods such as the rocking curve method and reciprocal space mapping were used to determine the strain as well as the defect concentration in the crystal. The investigations also include the numerical simulation of deformations.


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