Residual Stress Measurement of Silicon Nitride and Silicon Carbide by X-Ray Diffraction Using Gaussian Curve Method

1989 ◽  
pp. 459-469 ◽  
Author(s):  
Masanori Kurita ◽  
Ikuo Ihara ◽  
Nobuyuki Ono
Keyword(s):  
Residual Stress ◽  
Silicon Carbide ◽  
Silicon Nitride ◽  
Stress Measurement ◽  
Residual Stress Measurement ◽  
X Ray Diffraction ◽  
X Ray ◽  
Gaussian Curve ◽  
Curve Method

X-Ray Diffraction Measurement of Residual Stresses in Thick, Multi-Pass Steel Weldments

1985 ◽  
Vol 107 (2) ◽  
pp. 185-191 ◽  
Author(s):  
C. O. Ruud ◽  
R. N. Pangborn ◽  
P. S. DiMascio ◽  
D. J. Snoha
Keyword(s):  
Residual Stress ◽  
Measurement Accuracy ◽  
Stress Measurement ◽  
Three Dimensional ◽  
Residual Stress Measurement ◽  
Stress Fields ◽  
Diffraction Measurement ◽  
X Ray Diffraction ◽  
X Ray ◽  
Removal Technique

A unique X-ray diffraction instrument for residual stress measurement has been developed that provides for speed, ease of measurement, accuracy, and economy of surface stress measurement. Application of this instrument with a material removal technique, e.g., electropolishing, has facilitated detailed, high resolution studies of three-dimensional stress fields. This paper describes the instrumentation and techniques applied to conduct the residual stress measurement and presents maps of the residual stress data obtained for the surfaces of a heavy 2 1/4 Cr 1 Mo steel plate weldment.

1011 Residual Stress Measurement of Butt Weld of Thick Plates Using X-ray Diffraction Technique

2009 ◽  
Vol 2009.46 (0) ◽  
pp. 385-386
Author(s):  
Koji Hattori ◽  
Mitsuyoshi Nakatani ◽  
Tomoki Takehashi ◽  
Masamitsu Abe ◽  
Toshihiko Sasaki
Keyword(s):  
Residual Stress ◽  
Stress Measurement ◽  
Residual Stress Measurement ◽  
X Ray Diffraction ◽  
Butt Weld ◽  
Thick Plates ◽  
X Ray
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