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Serial Section Scanning Electron Microscopy of Adult Brain Tissue Using Focused Ion Beam Milling
Journal of Neuroscience
◽
10.1523/jneurosci.3189-07.2008
◽
2008
◽
Vol 28
(12)
◽
pp. 2959-2964
◽
Cited By ~ 425
Author(s):
G. Knott
◽
H. Marchman
◽
D. Wall
◽
B. Lich
Keyword(s):
Electron Microscopy
◽
Scanning Electron Microscopy
◽
Brain Tissue
◽
Serial Section
◽
Focused Ion Beam
◽
Ion Beam
◽
Adult Brain
◽
Scanning Electron
◽
Focused Ion Beam Milling
Download Full-text
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◽
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◽
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◽
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◽
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◽
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Focused-ion-beam milling, scanning-electron microscopy, and focused-droplet deposition in a single microcircuit surgery tool
Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena
◽
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◽
1988
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Nanoscale Imaging of Collagen Gels with Focused Ion Beam Milling and Scanning Electron Microscopy
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◽
10.1016/j.bpj.2016.08.039
◽
2016
◽
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◽
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◽
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Author(s):
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◽
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◽
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Resolving physical interactions between bacteria and nanotopographies with focused ion beam scanning electron microscopy.
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Scanning Electron Microscopy
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Focused Ion Beam
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Degradation of a Metal–Polymer Interface Observed by Element-Specific Focused Ion Beam-Scanning Electron Microscopy
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Scanning Electron Microscopy
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Focused Ion Beam
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Beam Scanning
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◽
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◽
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◽
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◽
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◽
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◽
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Attempt of quantitative analysis of morphological synaptic connectivity by combining focused ion beam milling and scanning electron microscopy (FIB–SEM) and confocal laser-scanning microscope
Neuroscience Research
◽
10.1016/j.neures.2011.07.1351
◽
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◽
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◽
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◽
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◽
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◽
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◽
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◽
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Electron Microscopy
◽
Scanning Electron Microscopy
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◽
Focused Ion Beam
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Ion Beam
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◽
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◽
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◽
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◽
Beam Scanning
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