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High electron mobility germanium (Ge) metal oxide semiconductor field effect transistors (MOSFETs)
Silicon–Germanium (SiGe) Nanostructures
◽
10.1533/9780857091420.4.528
◽
2011
◽
pp. 528-550
Author(s):
A. Toriumi
Keyword(s):
Metal Oxide
◽
Electron Mobility
◽
Field Effect
◽
Field Effect Transistors
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
High Electron
◽
High Electron Mobility
Download Full-text
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High electron mobility due to sodium ions in the gate oxide of SiC-metal-oxide-semiconductor field-effect transistors
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◽
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◽
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◽
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Novel Insulators for Gallium Nitride Metal-Oxide Semiconductor Field Effect Transistors and AlGaN-GaN Metal-Oxide Semiconductor High Electron Mobility Transistors
Engineering Materials and Processes - Gallium Nitride Processing for Electronics, Sensors and Spintronics
◽
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◽
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◽
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Keyword(s):
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Parasitic subthreshold drain current and low frequency noise in GaN/AlGaN metal-oxide-semiconductor high-electron-mobility field-effect-transistors
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◽
Oxide Semiconductor
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Frequency Noise
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◽
High Electron Mobility
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Electron Mobility
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◽
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Electron mobility characteristics of n-channel metal-oxide-semiconductor field-effect transistors fabricated on Ge-rich single- and dual-channel SiGe heterostructures
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