THIN-LAYER HOLOGRAPHIC PHOTOPOLYMER MATERIALS WITH A LARGE CHANGE IN THE REFRACTIVE INDEX

2021 ◽  
Vol 57 (6) ◽  
pp. 29-37
Author(s):  
D. I. Derevianko ◽  
E. F. Pen ◽  
V. V. Shelkovnikov ◽  
S. I. Aliev
Keyword(s):  
Refractive Index ◽  
Thin Layer ◽  
Large Change

Waveguide Capillary Cell for Low-Refractive-Index Liquids

1997 ◽  
Vol 51 (10) ◽  
pp. 1554-1558 ◽  
Author(s):  
Robert Altkorn ◽  
Ilia Koev ◽  
Amos Gottlieb
Keyword(s):  
Refractive Index ◽  
Thin Layer ◽  
Reflection Loss ◽  
Total Internal Reflection ◽  
Visible Region ◽  
Fused Silica ◽  
Internal Reflection ◽  
Silica Tube ◽  
Transparent Liquid ◽  
Low Refractive Index

We describe a waveguide capillary cell based on a fused-silica tube coated externally with a thin layer of a low-refractive-index ( n = 1.31) fluoropolymer. When filled with a transparent liquid of refractive index greater than that of the fluoropolymer, the cell is capable of transmitting light through total internal reflection. Loss below 1 dB/m is demonstrated throughout much of the visible region for a 530-μm-i.d., 660-μm-o.d. cell filled with water.

The Effect of Refractive Index of the Medium on the Position of the Camera Lens in Schlieren Optics

1973 ◽  
Vol 51 (20) ◽  
pp. 3309-3312 ◽  
Author(s):  
L. Ivan Epstein ◽  
Percival Nixon ◽  
Alfred J. Richard
Keyword(s):  
Refractive Index ◽  
Linear Relation ◽  
Large Change ◽  
Optic Axis ◽  
Liquid Column ◽  
Camera Lens ◽  
Component Systems ◽  
Schlieren Optics

A linear relation has been established between the plane of focus for schlieren optics in the ultracentrifuge cell along the optic axis, and the refractive index of the liquid contained in the cell. Such a relation shows that there occurs a defocussing effect when a large change in refractive index is generated in the liquid column during centrifugation of multi-component systems.

scholarly journals Modeling and Analysis of D–shaped Plasmonic Refractive Index and Temperature Sensor Using Photonic Crystal Fiber

2022 ◽  
Author(s):  
Amin Sayyad Tondro ◽  
mojtaba sadeghi ◽  
Abbas Kamaly ◽  
Zahra Adelpour ◽  
A. Emamghorashi
Keyword(s):  
Refractive Index ◽  
Photonic Crystal ◽  
Thin Layer ◽  
Photonic Crystal Fiber ◽  
Elliptical Hole ◽  
Silver Nanowire ◽  
Maximum Temperature ◽  
Modeling And Analysis ◽  
Crystal Fiber ◽  
Dual Functional

Abstract A plasmonic D–shaped photonic crystal fiber (PCF) sensor for refractive index (RI) and temperature is designed and studied in this paper. The RI channel is made up of a silver thin layer deposited on the plane of the D–type structure, and the temperature sensing channel is formed by a silver nanowire and benzene filled in an elliptical hole in the PCF. The designed structure can be used for temperature and RI sensing via coupling between the core–guided modes and the surface plasmon modes around Ag nanowire and Ag thin layer. The coupling characteristic and sensing performance of the proposed dual–functional sensor is studied in the present work. Results show that the maximum sensitivity in terms of RI units (RIU) is 6.9 µm/RIU in the range of 1.33–1.38, and the maximum temperature sensitivity is 3 µm /°C in the range of 27°C–67°C.

Pore Seal Property of Ultra-thin Layer for Porous Low-k Films revealed by Ellipsometric Porosimetry

2012 ◽  
Vol 1428 ◽  
Author(s):  
Shoko Sugiyama Ono ◽  
Yasuhisa Kayaba ◽  
Tsuneji Suzuki ◽  
Hirofumi Tanaka ◽  
Kazuo Kohmura
Keyword(s):  
Dielectric Constant ◽  
Refractive Index ◽  
Thin Layer ◽  
Porous Structure ◽  
Bottom Part ◽  
Ellipsometric Porosimetry ◽  
Single Pass ◽  
Small Pore ◽  
First Time ◽  
Low K

ABSTRACTIt was found for the first time that the control of the size of pore sealant is important to prevent diffusions of pore sealant into pores of porous low-k films and to achieve a good toluene seal property. Two pore sealants (PS-A, B) were prepared and the seal property and porous structure were studied using toluene based ellipsometric porosimetry (EP) measurements. It was revealed that small pore sealant (PS-B) diffuses into pores of porous low-k (PLK) films and did not show any seal property, while large pore sealant (PS-A) does not diffuse into pores of porous low-k films and shows a good toluene seal property. Ellipsometry shows that PS-A forms conformal layer only on the vicinity of surface of porous low-k films, but porous structure of porous low-k films at the bottom part is kept, according the fact that the refractive index did not increase.Furthermore, we developed a new pore seal material (PS-C) to form ultra-thin conformal layer by a single pass, which shows a good toluene seal property. The dielectric constant increased from 2.10 to 2.25 by covering with PS-C. The obtained layer also shows the effect as the protect layer of porous low-k films from plasma damages.

The scattering of light by a chaotically convecting fluid

1987 ◽  
Vol 174 ◽  
pp. 155-185 ◽  
Author(s):  
Susan C. Ryrie
Keyword(s):  
Refractive Index ◽  
Temperature Field ◽  
Phase Shift ◽  
Thin Layer ◽  
Mathematical Models ◽  
Light Field ◽  
Scattered Light ◽  
Quantitative Information ◽  
Fourier Representation ◽  
Chaotic Convection

The way in which light, scattered by a thin layer of fluid, may be used to obtain quantitative information about the temperature field in the fluid is investigated. Expressions for the phase shift imposed by the fluid, and the intensity of the scattered light are derived in terms of the Fourier representation of the temperature field, under the assumption of small variations in the refractive index. The method is applied to the particular case of chaotic convection, with a view to studying the connection between strange attractors and turbulence. Two simple mathematical models of chaotic convection are studied; particular emphasis is attached to the statistical properties of the flow and of the scattered light field, which are calculated numerically.

Refractive index and absorption measurement in a thin layer by two reflection measurements

1984 ◽  
Vol 86 (2) ◽  
pp. 485-490 ◽  
Author(s):  
D. Fasold ◽  
K. Hehl ◽  
S. Jetschke
Keyword(s):  
Refractive Index ◽  
Thin Layer ◽  
Absorption Measurement
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