Enhanced electrochromic properties of heat treated nanostructured tungsten trioxide thin films

2008 ◽  
Vol 23 (1) ◽  
pp. 274-280 ◽  
Author(s):  
Gisia Beydaghyan ◽  
Jean-Luc M. Renaud ◽  
Georges Bader ◽  
P.V. Ashrit

Nanostructured tungsten trioxide films were fabricated with the technique of glancing angle deposition (GLAD) in a thermal evaporation chamber with a base pressure of 1.3 × 10−4 Pa. Films were deposited at vapor incidence angles of 0°, 20°, 40°, and 50° with film thickness varying between 160 and 200 nm, as determined by spectroscopic ellipsometry. After deposition, samples were heated for 1 h in air at 400 °C and were subsequently intercalated with small amounts (5 to 15 nm) of lithium by dry lithiation, a technique developed in our laboratory. Compared with our previous work on as-deposited nanostructured films, these samples showed significantly enhanced coloration in the infrared region. It was found that the films exhibited an absorption- based coloration in the lower wavelengths as well as an increased reflection in the infrared region. Morphological investigation by atomic force microscopy (AFM) showed grain agglomeration and increased surface roughness upon heating. Our studies further indicate that grain agglomeration significantly contributes to the superior coloration properties of the films.

2017 ◽  
Vol 49 (1) ◽  
pp. 73-79
Author(s):  
Jelena Potocnik ◽  
Milos Nenadovic ◽  
Bojan Jokic ◽  
Maja Popovic ◽  
Zlatko Rakocevic

In this work, Glancing Angle Deposition technique was used for obtaining nanostructured nickel thin film with vertical posts on glass substrate which was positioned 75 degrees with respect to the substrate normal and rotated with a suitable constant speed. The obtained nickel thin film was characterized by Scanning Electron Microscopy, Atomic Force Microscopy and X-ray Photoelectron Spectroscopy. It was found that the deposited thin film consists of 94.0 at.% of nickel. Magnetic properties of the deposited thin film were determined by Magneto-Optical Kerr Effect Microscopy. According to the obtained coercivity values, it can be concluded that the nickel thin film shows uniaxial magnetic anisotropy.


2016 ◽  
Vol 48 (1) ◽  
pp. 51-56 ◽  
Author(s):  
Jelena Potocnik ◽  
Milos Nenadovic ◽  
Bojan Jokic ◽  
Maja Popovic ◽  
Zlatko Rakocevic

Zig-zag structure of the nickel thin film has been obtained using Glancing Angle Deposition (GLAD) technique. Glass substrate was positioned 75 degrees with respect to the substrate normal. The obtained nickel thin film was characterized by X-ray Photoelectron Spectroscopy, Scanning Electron Microscopy and Atomic Force Microscopy. Surface energy of the deposited thin film was determined by measuring the contact angle using the static sessile drop method.


2010 ◽  
Vol 518 (15) ◽  
pp. 4095-4099 ◽  
Author(s):  
Derya Deniz ◽  
David J. Frankel ◽  
Robert J. Lad

2014 ◽  
Vol 979 ◽  
pp. 196-199
Author(s):  
T. Plirdpring ◽  
M. Horprathum ◽  
P. Eiamchai ◽  
S. Limwichean ◽  
C. Chananonnawathorn ◽  
...  

This study investigates tantalum oxide (Ta2O5) nanorods prepared by the dc magnetron sputtering with the glancing angle deposition (GLAD) technique. Silicon (100) wafer and glass slides were used as the substrates. The effect of the glancing angle varying from 73-87°, on the structural and optical properties were investigated by field-emission scanning electron microscopy (FE-SEM), atomic force microscope (AFM) and spectrophotometry. The results show that the deposition rate and diameter of Ta2O5 nanorod films were decreased with the increase in the glancing angle. At the highest glancing angle of 87°, the prepared Ta2O5 nanorod yielded the highest porosity from the vertically aligned columnar structure, and were must suitable for many functional applications.


2021 ◽  
pp. 2100071
Author(s):  
Fernando Fresno ◽  
María U. González ◽  
Lidia Martínez ◽  
Marcial Fernández‐Castro ◽  
Mariam Barawi ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document