Pushing the detection limit of thin film magnetoelectric heterostructures

Suppose the thickness of a thin film of a crystal varies periodically like a regular array of surface steps, kinematical intensities of diffracted waves from this crystal are modulated by a shape transform,

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Detection Limit of Large Area Id Thin Film Position Sensitive Detectors Based in a-Si:H P.I.N. Diodes

MRS Proceedings ◽

10.1557/proc-377-791 ◽

1995 ◽

Vol 377 ◽

Cited By ~ 1

Author(s):

R. Martins ◽

G. Lavareda ◽

F. Soares ◽

E. Fortunato

Keyword(s):

Thin Film ◽

Experimental Data ◽

Steady State ◽

Detection Limit ◽

Large Area ◽

Position Sensitive ◽

Position Sensitive Detectors

ABSTRACTThe aim of this work is to provide the basis for the interpretation of the steady state lateral photoeffect observed in p-i-n a-Si:H ID Thin Film Position Sensitive Detectors (ID TFPSD). The experimental data recorded in ID TFPSD devices with different performances are compared with the predicted curves and the obtained correlation's discussed.

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Deposition and characterization of nanostructured Cu2O thin-film for potential photovoltaic applications

Journal of Materials Research ◽

10.1557/jmr.2013.150 ◽

2013 ◽

Vol 28 (13) ◽

pp. 1740-1746 ◽

Cited By ~ 21

Author(s):

Nishant Gupta ◽

Rajendra Singh ◽

Fan Wu ◽

Jagdish Narayan ◽

Colin McMillen ◽

...

Keyword(s):

Thin Film ◽

Photovoltaic Applications ◽

Cu2o Thin Film ◽

Image Position

Abstract

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First demonstration of “Leaky Integrate and Fire” artificial neuron behavior on (V0.95Cr0.05)2O3 thin film

MRS Communications ◽

10.1557/mrc.2018.90 ◽

2018 ◽

Vol 8 (03) ◽

pp. 835-841 ◽

Cited By ~ 4

Author(s):

Coline Adda ◽

Laurent Cario ◽

Julien Tranchant ◽

Etienne Janod ◽

Marie-Paule Besland ◽

...

Keyword(s):

Thin Film ◽

Artificial Neuron ◽

Integrate And Fire ◽

Image Position

Abstract

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Microstructure and electrochemical properties of nanoporous gold produced by dealloying Au-based thin film nanoglass

Journal of Materials Research ◽

10.1557/jmr.2018.176 ◽

2018 ◽

Vol 33 (18) ◽

pp. 2661-2670 ◽

Cited By ~ 1

Author(s):

Pierre Denis ◽

Hans-Jörg Fecht ◽

Yanpeng Xue ◽

Eirini Maria Paschalidou ◽

Paola Rizzi ◽

...

Keyword(s):

Thin Film ◽

Electrochemical Properties ◽

Nanoporous Gold ◽

Image Position

Abstract

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Linear, third order nonlinear and optical limiting studies on MZO/FTO thin film system fabricated by spin coating technique for electro-optic applications

Journal of Materials Research ◽

10.1557/jmr.2018.310 ◽

2018 ◽

Vol 33 (22) ◽

pp. 3880-3889 ◽

Cited By ~ 15

Author(s):

Mohd. Shkir ◽

Mohd. Arif ◽

Vanga Ganesh ◽

Mohamed A. Manthrammel ◽

Arun Singh ◽

...

Keyword(s):

Thin Film ◽

Spin Coating ◽

Optical Limiting ◽

Spin Coating Technique ◽

Film System ◽

Third Order ◽

Coating Technique ◽

Thin Film System ◽

Electro Optic ◽

Image Position

Abstract

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Signal detection limit of a portable Raman spectrometer for the SERS detection of gunshot residue

MRS Communications ◽

10.1557/mrc.2019.100 ◽

2019 ◽

Vol 9 (3) ◽

pp. 948-955 ◽

Cited By ~ 1

Author(s):

Evan Thayer ◽

Wilson Turner ◽

Stephen Blama ◽

Mary Sajini Devadas ◽

Ellen M. Hondrogiannis

Keyword(s):

Detection Limit ◽

Signal Detection ◽

Gunshot Residue ◽

Raman Spectrometer ◽

Sers Detection ◽

Image Position ◽

Portable Raman

Abstract

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Stabilizing new bismuth compounds in thin film form

Journal of Materials Research ◽

10.1557/jmr.2016.391 ◽

2016 ◽

Vol 31 (22) ◽

pp. 3530-3537 ◽

Cited By ~ 4

Author(s):

Aiping Chen ◽

Honghui Zhou ◽

Yuanyuan Zhu ◽

Leigang Li ◽

Wenrui Zhang ◽

...

Keyword(s):

Thin Film ◽

Thin Film Form ◽

Bismuth Compounds ◽

Image Position ◽

Film Form

Abstract

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Trace Analysis Using EDS: Applications to Thin-Film and Heterogeneous Samples

Advances in X-ray Analysis ◽

10.1154/s0376030800014336 ◽

1990 ◽

Vol 34 ◽

pp. 57-70 ◽

Cited By ~ 2

Author(s):

B. J. Cross ◽

J. E. Augenstine

Keyword(s):

Thin Film ◽

Detection Limit ◽

Trace Analysis ◽

Chemical Component ◽

Minimum Detection Limit ◽

False Detection ◽

Heterogeneous Samples ◽

Analysis Measurement ◽

Detection And Quantification

Critical to “Trace Analysis” measurement are the concepts of detection and quantification. Detection means positively identifying a chemical component. The term Minimum Detection Limit (MDL), used here, follows that of Currie, and is the smallest concentration that yields a net count, above system background, which will be detected with a 95% probability (with only a 5% probability of false detection).

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