Effects of Processing Parameters on the Excimer Laser Deposition of Yba2Cu3O7-δ Thin Films

1989 ◽  
Vol 169 ◽  
Author(s):  
R. E. Muenchausen ◽  
X. D. Wu ◽  
R. C. Dye ◽  
K. M. Hubbard ◽  
R. C. Estler ◽  
...  

AbstractSystematic studies of the effects of pulsed laser deposition processing parameters on plume dynamics and resultant film properties have been performed. Plume angular distributions, cosm(θ), were observed to be variable between 1 > m > 15 depending on laser energy density and spot size. Under optimized conditions, epitaxial, superconducting thin films could be grown in‐situ on a variety of single‐crystal substrates. High quality, 2000 Å  ss thick films were obtained at deposition rates approaching 150 Å/sec.

1990 ◽  
Vol 201 ◽  
Author(s):  
N. S. Nogar ◽  
R. Castain ◽  
R. C. Dye ◽  
S. Foltyn ◽  
R. E. Muenchausen ◽  
...  

AbstractY2O3 pressed powders were ablated by pulses from a XeCl excimer laser, operating at 308 nm, 150 mj/pulse, ≈15 nsec/pulse and 20 Hz. Emission spectra from Y∗ and YO∗ were recorded as a function of ambient oxygen pressure in the range 10−5 − 4×10−1 Torr, at a laser fluence of ≈ 4 J/cm2. A kinetic model is developed to describe the results, and the application to production of laser-deposited high-temperature superconductor thin films is discussed.


1989 ◽  
Vol 169 ◽  
Author(s):  
Q.Y. Ying ◽  
H.S. Kim ◽  
D.T. Shaw ◽  
H.S. Kwok

AbstractThe electric resistance was measured in real time during laser evaporation deposition of superconducting thin films. It was found that different substrates led to different behaviors in the temporal change of the resistance. The results are consistent with the processes of nucleation, interface reaction and bulk‐like growth. Structural transformation was also observed due to oxygen backfilling at the final stage of the deposition.


1990 ◽  
Author(s):  
H. S. Kwok ◽  
D. T. Shaw ◽  
Q. Y. Ying ◽  
J. P. Zheng ◽  
S. Witanachchi ◽  
...  

1989 ◽  
Vol 169 ◽  
Author(s):  
R. K. Singh ◽  
C. B. Lee ◽  
P. Tiwari ◽  
J. Narayan

AbstractWe have performed transport critical current density, Jc, measurements on epitaxial superconducting thin films which were in‐situ patterned during the laser deposition process. Shadow masks of various dimensions were placed close to the substrate to generate different patterns. Epitaxial films of YBa2Cu3O7 on (100) SrTiO3, (100) YSZ, and (100) LaA1O3 substrates were fabricated at low processing temperatures (500‐650°Q by the biased laser deposition technique in an oxygen ambient of 200 mtorr. Excellent quality superconducting thin films were formed on patterned areas. The critical temperature of the films was found to be in the range of 88 to 90 K, and the best critical current density values (at 77K, and zero magnetic field) greater than 6.5 x106 Amps/cm2 were obtained for silver doped YBa2Cu3O7 films on (100)LaAlO3 substrates.


1998 ◽  
Vol 20 (1-4) ◽  
pp. 87-94
Author(s):  
Atsushi Ito ◽  
Akihiko Machida ◽  
Minoru Obara

1995 ◽  
Vol 395 ◽  
Author(s):  
R.D. Vispute ◽  
H. Wu ◽  
K. Jagannadham ◽  
J. Narayan

ABSTRACTAIN thin films have been grown epitaxially on Si(111) and Al2O3(0001) substrates by pulsed laser deposition. These films were characterized by FTIR and UV-Visible, x-ray diffraction, high resolution transmission electron and scanning electron microscopy, and electrical resistivity. The films deposited on silicon and sapphire at 750-800°C and laser energy density of ∼ 2 to 3J/cm2 are epitaxial with an orientational relationship of AIN[0001]║ Si[111], AIN[2 110]║Si[011] and AlN[0001]║Al2O3[0001], AIN[1 2 1 0]║ Al2O3[0110] and AIN[1010] ║ Al2O3[2110]. The both AIN/Si and AIN/Al2O3 interfaces were found to be quite sharp without any indication of interfacial reactions. The absorption edge measured by UV-Visible spectroscopy for the epitaxial AIN film grown on sapphire was sharp and the band gap was found to be 6.1eV. The electrical resistivity of the films was about 5-6×l013Ω-cm with a breakdown field of 5×106V/cm. We also found that the films deposited at higher laser energy densities ≥10J/cm2 and lower temperatures ≤650°C were nitrogen deficient and containing free metallic aluminum which degrade the microstructural, electrical and optical properties of the AIN films


2001 ◽  
Vol 353 (1-2) ◽  
pp. 1-4 ◽  
Author(s):  
A. Brinkman ◽  
D. Mijatovic ◽  
G. Rijnders ◽  
V. Leca ◽  
H.J.H. Smilde ◽  
...  

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