Structure of a-Si:H/SnO2 Interface Characterized By Xps

1990 ◽  
Vol 192 ◽  
Author(s):  
H. Koinuma ◽  
M. Nakano ◽  
S. Gonda
Keyword(s):  
Glow Discharge ◽  
Bottom Layer ◽  
Interface Structure ◽  
Atomic Scale ◽  
Photoelectron Emission ◽  
In Situ Xps

ABSTRACTThe interface structure of a-Si:H films deposited by glow discharge decomposition of Si2H6 on SnO2 was characterized on an atomic scale with the use of in situ XPS. The method analyzes the variation of the intensity of photoelectron emission originating from the bottom SnO2 layer and transmitting through the upper a-Si:H layers of various thicknesses. It was evaluated that a-Si:H was partially oxidized as it grew to a thickness of about 15 A, while the SnO2 bottom layer was reduced to metallic Sn and SnOx (0 < x < 2) states as deep as 2 A and 12 A from the interface, respectively,

scholarly journals In Situ Observation of Electron-Beam-Induced Formation of Nano-Structures in PbTe

Nanomaterials ◽  
2021 ◽  
Vol 11 (1) ◽  
pp. 163
Author(s):  
Iryna Zelenina ◽  
Igor Veremchuk ◽  
Yuri Grin ◽  
Paul Simon
Keyword(s):  
Electron Beam ◽  
Gas Phase ◽  
Threshold Current ◽  
Threshold Current Density ◽  
Atomic Scale ◽  
In Situ Observation ◽  
Nano Structures ◽  
Transmission Electron ◽  
Initial Crystal

Nano-scaled thermoelectric materials attract significant interest due to their improved physical properties as compared to bulk materials. Well-shaped nanoparticles such as nano-bars and nano-cubes were observed in the known thermoelectric material PbTe. Their extended two-dimensional nano-layer arrangements form directly in situ through electron-beam treatment in the transmission electron microscope. The experiments show the atomistic depletion mechanism of the initial crystal and the recrystallization of PbTe nanoparticles out of the microparticles due to the local atomic-scale transport via the gas phase beyond a threshold current density of the beam.

scholarly journals Front Cover: Structure Matters – Direct In‐situ Observation of Cluster Nucleation at Atomic Scale in a Liquid Phase (2/2021)

ChemNanoMat ◽  
2021 ◽  
Vol 7 (2) ◽  
pp. 100-100
Author(s):  
Trond R. Henninen ◽  
Debora Keller ◽  
Rolf Erni
Keyword(s):  
Liquid Phase ◽  
Atomic Scale ◽  
In Situ Observation ◽  
Phase 2 ◽  
Front Cover

scholarly journals Microstructure and properties of nano-laminated Y3Si2C2 ceramics fabricated via in situ reaction by spark plasma sintering

2021 ◽  
Vol 10 (3) ◽  
pp. 578-586
Author(s):  
Lin-Kun Shi ◽  
Xiaobing Zhou ◽  
Jian-Qing Dai ◽  
Ke Chen ◽  
Zhengren Huang ◽  
...  
Keyword(s):  
Spark Plasma Sintering ◽  
Atomic Scale ◽  
Max Phase ◽  
X Ray Diffraction ◽  
Selected Area Electron Diffraction ◽  
Plasma Sintering ◽  
Transmission Electron ◽  
Spark Plasma ◽  
Diffraction Patterns

AbstractA nano-laminated Y3Si2C2 ceramic material was successfully synthesized via an in situ reaction between YH2 and SiC using spark plasma sintering technology. A MAX phase-like ternary layered structure of Y3Si2C2 was observed at the atomic-scale by high resolution transmission electron microscopy. The lattice parameters calculated from both X-ray diffraction and selected area electron diffraction patterns are in good agreement with the reported theoretical results. The nano-laminated fracture of kink boundaries, delamination, and slipping were observed at the tip of the Vickers indents. The elastic modulus and Vickers hardness of Y3Si2C2 ceramics (with 5.5 wt% Y2O3) sintered at 1500 °C were 156 and 6.4 GPa, respectively. The corresponding values of thermal and electrical conductivity were 13.7 W·m-1·K-1 and 6.3×105 S·m-1, respectively.

Atomic-scale analysis of the interface structure and lattice mismatch relaxation of Bi2Sr2CaCu2O8+δ/SrTiO3 heterostructure

2020 ◽  
Author(s):  
Jian Zhang ◽  
Weizhen Wang ◽  
Tianlin Wang ◽  
Lili Jiang ◽  
Nan Wang ◽  
...  
Keyword(s):  
Lattice Mismatch ◽  
Interface Structure ◽  
Atomic Scale ◽  
Scale Analysis

scholarly journals In-Situ XPS Monitoring and Characterization of Electrochemically Prepared Au Nanoparticles in an Ionic Liquid

ACS Omega ◽  
2017 ◽  
Vol 2 (2) ◽  
pp. 478-486 ◽  
Author(s):  
Merve T. Camci ◽  
Burak Ulgut ◽  
Coskun Kocabas ◽  
Sefik Suzer
Keyword(s):  
Ionic Liquid ◽  
Au Nanoparticles ◽  
In Situ Xps

Multimodal Optical Nanoprobe for Advanced In-Situ Electron Microscopy

2012 ◽  
Vol 20 (6) ◽  
pp. 32-37 ◽  
Author(s):  
Y. Zhu ◽  
M. Milas ◽  
M.-G. Han ◽  
J.D. Rameau ◽  
M. Sfeir
Keyword(s):  
Electron Microscopy ◽  
Driving Forces ◽  
Atomic Scale ◽  
Magnetic Domains ◽  
Photovoltaic Devices ◽  
Electromagnetic Devices ◽  
In Situ Electron Microscopy ◽  
Electric And Magnetic Fields ◽  
Anions And Cations

In-situ electron microscopy has gained considerable attention in recent years. It provides a “live” view of a material or device under study at various length scales. For example, by heating or cooling a sample one can study structural change at the atomic scale to understand the driving forces and mechanisms of phase transitions. By applying electric and magnetic fields on a ferroelectric or magnetic architecture in operation, one can directly observe how electric and magnetic domains switch, how anions and cations shift their positions, and how spins change their configuration across a domain wall, aiding the development of better electromagnetic devices. In the study of photovoltaic devices and junctions, a major challenge is to directly correlate light-induced electric currents with local structural inhomogeneities and dynamics. Such a capability would allow us to evaluate the performance of individual p-n junctions and to improve optoelectronic efficiency.

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