An Atom Probe Field Ion Microscope Investigation Of The Role Of Boron In Precipitates And At Grain Boundaries In NiAl

1991 ◽  
Vol 238 ◽  
Author(s):  
Raman Jayaram ◽  
M. K. Miller

ABSTRACTThe high resolution analytical technique of Atom Probe Field Ion Microscopy (APFTM) haseen used to characterize grain boundaries and the matrix of a stoichiometric NiAl alloy doped with 0.04 (100 wppm) and 0.12 at. % (300 wppm) boron. Field ion images revealed boron segregation to the grain boundaries. Atom probe elemental analysis of the grain boundaries measured a boron coverage of up to 30% of a monolayer. Extensive atom probe analyses also revealed a fine dispersion of nanoscale boride precipitates in the matrix. The boron segregation to the grain boundaries was found to correlate with the observed suppression of intergranular fracture. However, the decrease in ductility of boron-doped NiAl is attributed in part to the precipitation hardening effect of the boride phases.

Author(s):  
M. K. Miller ◽  
R. Jayaram ◽  
K. F. Russell

One of the important parameters in the design of new materials is the distribution of the alloyingelements in the microstructure and whether these elements are involved in the formation of precipitates or in segregation to internal interfaces such as grain boundaries. The atom probe field ion microscope is an extremely effective tool for these types of fine scale characterizations. Recently, therehas been a large effort to develop new, more efficient materials for high temperature applications such as gas turbines. A candidate material for this application is NiAl. However, the low temperature ductility of NiAl is extremely small and hinders fabrication. Therefore, attempts have been made to alleviate these problems with the use of microalloying additions such as boron. The atom probe has beenused to determine the location of boron in the microstructure and correlate its distribution with themechanical properties. Atom probe analyses have revealed that the solubility of boron in NiAl is extremely low and most of the excess boron is precipitated in the form of ultrafine MB2 precipitates as shown in Fig. 1. In addition, boron segregation to the grain boundaries has been observed, Fig. 2. Theobserved increase in the yield strength is therefore primarily due to a precipitation hardening mechanism with a contribution from solid solution hardening and this offsets the beneficial effect of the boron at the grain boundaries.


1994 ◽  
Vol 364 ◽  
Author(s):  
Naoya Masahashi

AbstractAuger electron microscopy (AES) analysis of boron doped Ni3Al have shown boron segregation at grain boundary (GB). Boron segregation was enhanced with increasing bulk boron content independent of stoichiometry, suggesting that hypo-stoichiometric alloy is intrinsically ductile even without boron. A slight Ni cosegregation is confirmed using atom probe field ion microscope (APFIM). In Ni3(Si,Ti), no distinct composition fluctuation was identified between matrix and GB vicinity. These results suggest that atomic bonding atmosphere modification from covalent to metallic in the vicinity of GB is one of factors to modify ductility for Ll2-type intermetallics.


Author(s):  
Raman Jayaram ◽  
M.K Miller

The low temperature brittleness of nickel aluminides has been a serious impediment to their technological applications. A commonly employed technique to ductilize these materials involves the addition of suitable microalloying elements and correlating grain boundary chemistry with fracture mode. In the well documented case of Ni3Al, boron segregation to grain boundaries is accompanied by suppression of intergranular fracture and a significant increase in ductility. The high resolution microanalytical technique of atom probe field ion microscopy (APFIM) has been used in this study to analyze grain boundaries in order to characterize similar attempts to ductilize NiAl. APFIM specimens were prepared from tensile specimens of stoichiometric NiAl doped with either 0.04 or 0.12 at. % boron or 0.1 at % carbon, respectively. A field ion image of a grain boundary in a B-doped NiAl specimen is shown in Fig. 1. The brightly-imaging spots decorating the boundary were determined by atom probe analysis to be boron atoms. The boron enrichment factor at the boundary depends on the assumed thickness of the segregation as shown in Fig. 2 with an enrichment factor of ∼850 times for a monolayer coverage (i.e. 0.2 nm).


1988 ◽  
Vol 133 ◽  
Author(s):  
J. A. Horton ◽  
M. K. Miller ◽  
C. T. Liu ◽  
E. P. George ◽  
J. Bentley

ABSTRACTIn alloys containing 0.24% boron, atom-probe field-ion microscopy (APFIM) revealed the presence of boron clusters in Ni-25 at. % Al and Ni-26 Al but not in Ni-24 Al. The observed boron clusters generally consisted of two to three boron atoms with a maximum size of 10 atoms. Quench rates that ranged from rapid solidification to furnace cooling had little effect on the clustering. The occurrence of the clustering coincides with a higher rate of boron strengthening as measured by an increase in the yield stress per atomic percent boron, and it also coincides with a reduced amount of boron segregation to grain boundaries. The levels of nickel and boron were highly variable on grain boundaries in rapidly solidified material and therefore no consistent indication of nickel enrichment at the grain boundaries associated with boron segregation was found. This result suggests that cosegregation of nickel with boron may not be necessary for the ductilization of Ni3Al by boron, since the rapidly solidified material is also ductilized by boron and exhibits segregation of only boron to the grain boundaries.


1994 ◽  
Vol 364 ◽  
Author(s):  
R. Jayaram ◽  
M.K. Miller

AbstractAtom probe field ion microscopy (APFIM) has been used to characterize NiAl microalloyed with molybdenum and zirconium. Field ion images and atom probe analyses revealed segregation of zirconium to dislocation strain fields and ribbon-like morphological features that are probably related to dislocations. These results provide direct experimental evidence in support of the suggestion that the tremendous increase in the ductile-to-brittle transition temperature (DBTT) in zirconium-doped NiAl is due to pinning of dislocations by zirconium atoms. Atom probe analyses also revealed segregation of zirconium to grain boundaries. This result is consistent with the change from an intergranular fracture mode in undoped NiAl to a mixture of intergranular and transgranular fracture mode in zirconium-doped NiAl. The NiAl matrix was severely depleted of the solutes molybdenum and zirconium. Small Mo-rich precipitates, detected in the matrix and grain boundaries, are likely to contribute to the significant increase in the room-temperature yield stress of microalloyed NiAl through a precipitation hardening mechanism.


1996 ◽  
Vol 2 (3) ◽  
pp. 113-128 ◽  
Author(s):  
Sundar Ramamurthy ◽  
Michael P. Mallamaci ◽  
Catherine M. Zimmerman ◽  
C. Barry Carter ◽  
Peter R. Duncombe ◽  
...  

Dense, polycrystalline MgO was infiltrated with monticellite (CaMgSiO4) liquid to study the penetration of liquid along the grain boundaries of MgO. Grain growth was found to be restricted with increasing amounts of liquid. The inter-granular regions were generally found to be comprised of a two-phase mixture: crystalline monticellite and a glassy phase rich in the impurities present in the starting MgO material. MgO grains act as seeding agents for the crystallization of monticellite. The location and composition of the glassy phase with respect to the MgO grains emphasizes the role of intergranular liquid during the devitrification process in “snowplowing” impurities present in the matrix.


1990 ◽  
Vol 213 ◽  
Author(s):  
H. Li ◽  
A. J. Ardell

ABSTRACTThe results of miniaturized disk-bend tests on samples of Ni 3Al of different stoichiometry and boron content are presented. The yield strengths and ductilities of alloys containing 24, 25 or 26 %Al. either boron-free or doped with 0.3 or 0.35 %B, were measured. Specimens 3 mm in diameter and approximately 200 μm thick were tested, some of these having been cut from the grip sections of previously tested tensile bars. The yield strengths were in excellent agreement with the results obtained from the uniaxial tensile tests. The load-displacement curves for the brittle alloys (all but the boron-doped 24 %Al alloy) exhibited a maximum load corresponding to crack initiation. The shapes of the deformed specimens confirmed the assumption that they deform as if they were clamped even though they are not. The fracture surfaces of the brittle alloys are consistent with intergranular failure. Nevertheless, the ductility of the alloys increases with decreasing Al content and decreasing grain size, even for the boron-free alloys which are all brittle. The fracture stress of the boron-doped 26 %Al alloy is about 30% greater than that of the boron-free alloy. It is argued that this is most likely a consequence of the depletion of aluminum at grain boundaries, coupled with boron segregation. Independent evidence suggests that this should increase the cohesive strength of grain boundaries in the boron-doped 26 %Al alloy.


1994 ◽  
Vol 343 ◽  
Author(s):  
Susanne Schneider ◽  
Ralf Busch ◽  
Konrad Samwer

ABSTRACTThe atom probe/field ion microscope is introduced as a new powerful investigation device to study the early stages of the solid state amorphization reaction (SSAR). A bilayer of Zr and Co was condensed under UHV conditions on W wire tips and analyzed in a field ion microscope (FIM) combined with an atom probe (AP). The reaction of Co with Zr has been studied at room temperature. FIM pictures and AP analysis have shown that even at low temperatures an amorphous phase is formed at the Zr/Co interface and in the Zr grain boundaries. In these areas concentration profiles have been taken on a nanometer scale. Most likely, the extended solid solution of Co found in α- Zr grain boundaries causes the formation of the amorphous phase. Further, Rutherford backscattering spectrometry (RBS) suggests that even point defects and dislocations at the surface of an α- Zr single crystal are sufficient to initiate the SSAR between a polycrystalline Co layer vapour- deposited onto that single crystal.


MRS Bulletin ◽  
1994 ◽  
Vol 19 (7) ◽  
pp. 27-34 ◽  
Author(s):  
M.K. Miller ◽  
G.D.W. Smith

The atom probe field ion microscope is the most powerful and direct method for the analysis of materials at the atomic level. Since analyses are performed by collecting atoms one at a time from a small volume, it is possible to conduct fundamental characterization of materials at this level. The atom probe technique is applicable to a wide range of materials since its only restriction is that the material under analysis must possess at least some limited electrical conductance. Therefore, since its introduction in 1968, the atom probe field ion microscope has been used in many diverse applications in most branches of materials science. Many of the applications have exploited its high spatial resolution capabilities to perform microstructural characterizations of features such as grain boundaries and other interfaces and ultrafine scale precipitation that are not possible with other microanaly tical techniques. This article briefly outlines some of the capabilities and applications of the atom probe. The details of the atom probe technique are described elsewhere.The power of the atom probe may be demonstrated by its ability to see and identify a single atom, which is particularly useful in characterizing solute segregation to grain boundaries or other interfaces. An example of a brightly-imaging solute atom at a grain boundary in a nickel aluminide is shown in Figure 1. In order to conclusively determine its identity, its image is aligned with the probe aperture in the center of the imaging screen and then the selected atom is carefully removed by field evaporation and analyzed in the time-of-flight mass spectrometer. This and many other bright spots in this material were shown to be boron atoms. This example also illustrates the light element analytical capability of the atom probe. In fact, the atom probe may to used to analyze all elements in the periodic table and has had applications ranging from characterizing the distribution of implanted hydrogen to phase transformations in uranium alloys.


1999 ◽  
Vol 580 ◽  
Author(s):  
Y. Zhang ◽  
N. Wanderka ◽  
U. Czubayko ◽  
F. Zhu ◽  
H. Wollenberger

AbstractUsing atom probe field ion microscopy (APFIM) we examined the local chemical compositions of Fe-7Zr-5B-lAu and Fe-14B amorphous alloys in the course of primary crystallization. Au rich clusters are formed during primary crystallization of Fe-7Zr-5B-lAu alloy. However, these clusters do not act as nucleation sites for α-Fe particles. In the early stage of primary crystallization, heterogeneities of Fe and B evolve in the amorphous phase. Heterogeneous distribution of B was found in the as-melt-spun Fe-14B amorphous alloy. During primary crystallization, B is highly supersaturated not only in the nanometer sized α-Fe particles in Fe-7Zr-5B-lAu alloy, but also in those of large diameters in Fe-14B alloy. From the results it is concluded that presence of B lowers the nucleation barrier for primary crystallization.


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