The Microchemistry Studies of Ductile Ll2 Ni-Based Intermetallics

1994 ◽  
Vol 364 ◽  
Author(s):  
Naoya Masahashi
Keyword(s):  
Electron Microscopy ◽  
Auger Electron ◽  
Boron Content ◽  
Atom Probe ◽  
Probe Field ◽  
Composition Fluctuation ◽  
Boron Segregation ◽  
Boron Doped ◽  
Field Ion Microscope ◽  
Stoichiometric Alloy

AbstractAuger electron microscopy (AES) analysis of boron doped Ni3Al have shown boron segregation at grain boundary (GB). Boron segregation was enhanced with increasing bulk boron content independent of stoichiometry, suggesting that hypo-stoichiometric alloy is intrinsically ductile even without boron. A slight Ni cosegregation is confirmed using atom probe field ion microscope (APFIM). In Ni3(Si,Ti), no distinct composition fluctuation was identified between matrix and GB vicinity. These results suggest that atomic bonding atmosphere modification from covalent to metallic in the vicinity of GB is one of factors to modify ductility for Ll2-type intermetallics.

Fabrication and characterization - by High Resolution Electron Microscopy and atom probe microanalysis - of Co-based metallic multilayer films

1990 ◽  
Vol 48 (4) ◽  
pp. 772-773
Author(s):  
Amanda K. Petford-Long ◽  
A. Cerezo ◽  
M.G. Hetherington
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
High Resolution Electron Microscopy ◽  
Atom Probe ◽  
Multilayer Films ◽  
Interface Roughness ◽  
Probe Field ◽  
Resolution Electron ◽  
Potential Applications ◽  
Field Ion Microscope

The fabrication of multilayer films (MLF) with layer thicknesses down to one monolayer has led to the development of materials with unique properties not found in bulk materials. The properties of interest depend critically on the structure and composition of the films, with the interfacial regions between the layers being of particular importance. There are a number of magnetic MLF systems based on Co, several of which have potential applications as perpendicular magnetic (e.g Co/Cr) or magneto-optic (e.g. Co/Pt) recording media. Of particular concern are the effects of parameters such as crystallographic texture and interface roughness, which are determined by the fabrication conditions, on magnetic properties and structure.In this study we have fabricated Co-based MLF by UHV thermal evaporation in the prechamber of an atom probe field-ion microscope (AP). The multilayers were deposited simultaneously onto cobalt field-ion specimens (for AP and position-sensitive atom probe (POSAP) microanalysis without exposure to atmosphere) and onto the flat (001) surface of oxidised silicon wafers (for subsequent study in cross-section using high-resolution electron microscopy (HREM) in a JEOL 4000EX. Deposi-tion was from W filaments loaded with material in the form of wire (Co, Fe, Ni, Pt and Au) or flakes (Cr). The base pressure in the chamber was around 8×10−8 torr during deposition with a typical deposition rate of 0.05 - 0.2nm/s.

The Application of Atom-Probe Techniques in Materials Science and Technology

1981 ◽  
Vol 39 ◽  
pp. 12-15
Author(s):  
Brian Ralph ◽  
A.R. Waugh ◽  
S.A. Hill ◽  
M.J. Southon ◽  
M.P. Thomas
Keyword(s):  
Electron Microscopy ◽  
Materials Science ◽  
Atom Probe ◽  
Original Form ◽  
Surface Process ◽  
Fine Scale ◽  
Probe Field ◽  
Transmission Electron ◽  
Field Ion Microscope ◽  
Imaging Atom Probe

This brief review attempts to summarize the main uses to which the atom-probe field-ion microscope and its variants have been put in the examination of materials. No attempt is made to produce a comprehensive list of all the studies made to date, rather the type of application is illustrated from recent studies.The original form of the field-ion microscope was really limited to the acquisition of geometrical and crystallographic information on the fine scale distribution of defects and phases (e.g. 1). Even in these early applications, the study proved considerably more fruitful when other microstructural techniques, such as transmission electron microscopy, were applied in parallel. The advent of the atom-probe (AP) and imaging atom-probe (IAP) instruments allowed precise microchemical information to be obtained and these instruments have now been used for a number of detailed investigations of materials. In the main, these have divided into (I) studies of surface process and films (e.g. 2) and (II) investigations of phase distributions and segregation in the bulk (e.g. 3).

An Atom Probe Field Ion Microscope Investigation Of The Role Of Boron In Precipitates And At Grain Boundaries In NiAl

1991 ◽  
Vol 238 ◽  
Author(s):  
Raman Jayaram ◽  
M. K. Miller
Keyword(s):  
Grain Boundaries ◽  
Atom Probe ◽  
Probe Field ◽  
Analytical Technique ◽  
Boron Segregation ◽  
Boron Doped ◽  
Nial Alloy ◽  
The Matrix ◽  
Boride Phases

ABSTRACTThe high resolution analytical technique of Atom Probe Field Ion Microscopy (APFTM) haseen used to characterize grain boundaries and the matrix of a stoichiometric NiAl alloy doped with 0.04 (100 wppm) and 0.12 at. % (300 wppm) boron. Field ion images revealed boron segregation to the grain boundaries. Atom probe elemental analysis of the grain boundaries measured a boron coverage of up to 30% of a monolayer. Extensive atom probe analyses also revealed a fine dispersion of nanoscale boride precipitates in the matrix. The boron segregation to the grain boundaries was found to correlate with the observed suppression of intergranular fracture. However, the decrease in ductility of boron-doped NiAl is attributed in part to the precipitation hardening effect of the boride phases.

High-resolution x-ray imaging of small copper-rich precipitates in steels

1988 ◽  
Vol 46 ◽  
pp. 528-529
Author(s):  
J. R. Michael ◽  
K. A. Taylor
Keyword(s):  
Electron Microscopy ◽  
Thermomechanical Processing ◽  
Atom Probe ◽  
Ferrite Matrix ◽  
Scanning Transmission Electron Microscope ◽  
Probe Field ◽  
X Ray ◽  
Subsequent Transformation ◽  
Transmission Electron ◽  
Scanning Transmission

Although copper is considered an incidental or trace element in many commercial steels, some grades contain up to 1-2 wt.% Cu for precipitation strengthening. Previous electron microscopy and atom-probe/field-ion microscopy (AP/FIM) studies indicate that the precipitation of copper from ferrite proceeds with the formation of Cu-rich bcc zones and the subsequent transformation of these zones to fcc copper particles. However, the similarity between the atomic scattering amplitudes for iron and copper and the small misfit between between Cu-rich particles and the ferrite matrix preclude the detection of small (<5 nm) Cu-rich particles by conventional transmission electron microscopy; such particles have been imaged directly only by FIM. Here results are presented whereby the Cu Kα x-ray signal was used in a dedicated scanning transmission electron microscope (STEM) to image small Cu-rich particles in a steel. The capability to detect these small particles is expected to be helpful in understanding the behavior of copper in steels during thermomechanical processing and heat treatment.

scholarly journals Atomic Level Characterization of the Morphology of Phases in Chromindur Magnetic Alloys

1991 ◽  
Vol 232 ◽  
Author(s):  
M. K Miller ◽  
P. P. Camus ◽  
M. G. Hetherington
Keyword(s):  
Atom Probe ◽  
Heat Treatments ◽  
Miscibility Gap ◽  
Probe Field ◽  
Magnet Alloy ◽  
Two Phases ◽  
Isothermal Heat Treatments ◽  
Field Ion Microscope ◽  
Permanent Magnet Alloy

ABSTRACTThe atom probe field ion microscope has been used to characterize the morphology and determine the compositions of the iron-rich a and chromium-enriched α′ phases produced during isothermal and step cooled heat treatments in a Chromindur II ductile permanent magnet alloy. The good magnetic properties of this material are due to a combination of the composition of the two phases and the isolated nature and size of the ferromagnetic a phase. The morphology of the a phase is produced as a result of the shape of the miscibility gap and the step-cooled heat treatment and is distinctly different from that formed during isothermal heat treatments.

Atom probe field ion microscope studies of palladium silicide on silicon

1995 ◽  
Vol 87-88 ◽  
pp. 279-283
Author(s):  
R.A. King ◽  
R.A.D. Mackenzie ◽  
G.D.W. Smith ◽  
N.A. Cade
Keyword(s):  
Atom Probe ◽  
Probe Field ◽  
Palladium Silicide ◽  
Field Ion Microscope
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