Textured Pb(Zr0.54Ti0.46)O3 Thin Films with YBa2Cu3O7-δ and Yttria-Stabilized Zirconia Buffer Layers on (001)Si

1993 ◽  
Vol 310 ◽  
Author(s):  
Tsvetanka Zheleva ◽  
P. Tiwari ◽  
J. Narayan

AbstractCharacteristics of textured Pb(Zr0.54Ti0.46)O3 (PZT) thin films on (001)Si with YBa2Cu3O7-δ (YBCO) and yttria-stabilized zirconia (YSZ) buffer layers have been studied using X-ray diffraction and high resolution electron microscopy techniques. Excimer KrF laser has been used for deposition of PZT, YBCO and YSZ thin films. The YBCO layer was utilized to provide a seed for PZT growth, while YSZ layer acted as a seed and a buffer layer for the growth of YBCO on (001)Si. High-resolution transmission electron microscopy (HRTEM) and X-ray diffraction were used to determine the texture and the nature of defects, interfaces and grain boundaries. Predominant orientation relationships were found to be [001]PZT//[001]YBCO; [001]YBCO//[001]YSZ; and [001]YSZ//[001]Si.

Author(s):  
G. Benay ◽  
G. Modolo ◽  
R. Odoj

In the scope of the co-conversion of actinides solutions obtained from partitioning spent nuclear fuel, the internal gelation of ceria-doped yttria-stabilized zirconia was investigated. This dust-free method to fabricate kernels, which can be used as fuel or pressed into pellets, is technically easy to implement and compatible with remote handling. The effects of the quantity of reactants used on the properties of the material were studied. Gels, kernels and pellets were analyzed by thermal analysis, electron microscopy and X-ray diffraction. It was found that the initial broth composition played an important role in the structure of kernels and the formation of cracks during thermal treatment. Pellets obtained with a repressing method were found to present densities up to 86% TD.


1997 ◽  
Vol 3 (S2) ◽  
pp. 441-442
Author(s):  
P.A. Crozier ◽  
I.Y. Chan ◽  
C.Y. Chen ◽  
L.W. Finger ◽  
R.C. Medrud ◽  
...  

Low-dose high resolution electron microscopy (HREM) is a useful technique for elucidating the structure of zeolites. In recent years a number of zeolite structures have been solved using combinations of different characterization techniques including adsorption measurements, powder x-ray diffraction and low-dose high resolution electron microscopy (for example see ref. 2). We have used these techniques to study the structure of a novel zeolite material. However, great care must be exercised when interpreting data from these techniques in terms of crystal structural units. In this particular case, the structure was recently determined using single crystal x-ray diffraction and showed some surprises.Details of the synthesis of this zeolite are given elsewhere. The high adsorption capacity suggested that this zeolite possessed two interpenetrating channels (either a 10 and a 12 ring or two 12 ring channels). X-ray powder diffraction showed the material to be monoclinic with a= 18.5Å, b= 13.4 Å, c= 7.6 Å β = 101.5°).


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