scholarly journals Thermal Stability Study of Oxygen Implanted Algaas/Gaas Single Quantum Well Structures Using PhotoreflectancE

1994 ◽  
Vol 354 ◽  
Author(s):  
P J Hughes ◽  
E H Li ◽  
B L Weiss ◽  
H E Jackson ◽  
J S Roberts

AbstractThe effects of interdiffusion on the band structure of two MxGaUxAs/GaAs single quantum well (SQW) structures were studied using room temperature photoreflectance. Rapid thermal annealing of the SQW structures at temperatures of 800°C, 900°C and 1000°C for times up to 180 seconds resulted in limited interdiffusion. Low dose (1014 cm”2) oxygen implantation reduced the thermal stability of these structures where the extent of the interdiffusion was found to be greater for the implanted samples for identical annealing conditions.

2003 ◽  
Vol 426 (1-2) ◽  
pp. 186-190 ◽  
Author(s):  
Feng Zhao ◽  
I.W. Choi ◽  
Shu Yuan ◽  
C.Y. Liu ◽  
J. Jiang ◽  
...  

2000 ◽  
Vol 638 ◽  
Author(s):  
Y.Q. Wang ◽  
Y. Ishikawa ◽  
N. Shibata

AbstractAmorphous silicon dioxide/silicon/amorphous silicon dioxide single quantum well structures were fabricated by oxygen implantation followed by thermal oxidation. No photoluminescence (PL) was observed from the as grown samples. We found that annealing in hydrogen allows the single quantum well (SQW) structures to emit two-peak (blue and yellow) PL at room temperature (RT). The blue PL (2.9 eV) does not change with the thickness of Si layers or the temperature. The yellow peak varied from 2.0 eV to 2.4 eV with thinning of the Si layer from 5 nm to 0.5 nm. Lowering the temperature also changed the yellow peak position of the 1.5 nm Si-SQW structure from 2.3 eV (RT) to 2.6 eV (8.4 K). We conclude that the blue PL is from SiO2 and the yellow PL is caused by a recombination process in the Si-SQW.


2015 ◽  
Vol 30 (9) ◽  
pp. 094016 ◽  
Author(s):  
O Donmez ◽  
A Erol ◽  
M C Arikan ◽  
H Makhloufi ◽  
A Arnoult ◽  
...  

1993 ◽  
Vol 300 ◽  
Author(s):  
S. Subramanian ◽  
B. M. Arora ◽  
A. K. Srivastava ◽  
S. Banerjee ◽  
G. Fernandes

ABSTRACTIn this paper we report a modified Kroemer's analysis for the determination of the band offset (ΔEc) of single quantum well (SQW) structures from simple C-V measurements. The experimental carrier profile from an MOVPE grown pseudomorphic GaAs/InGaAs/GaAs strained SQW structure shows a sharp accumulation peak bounded by depletion regions on either side. The full width at half maximum of the accumulation peak is comparable to the width of the quantum well. The value of ΔEC obtained from C-V measurement is in good agreement with the values determined by simulation and photoluminescence measurements. DLTS measurements on our SQW samples do not show any peaks which is contrary to the published reports. We believe that it is necessary to carefully isolate the role of interface states, before assigning a DLTS peak to emission from the quantum well.


1992 ◽  
Vol 60 (3) ◽  
pp. 365-367 ◽  
Author(s):  
H. Kawanishi ◽  
Y. Sugimoto ◽  
T. Ishikawa ◽  
H. Hidaka

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