Development of Si(100) Surface Roughness at the Initial Stage of Etching in F2 and XeF2 Gases - Ellipsometric Study

1996 ◽  
Vol 440 ◽  
Author(s):  
V.S. Aliev ◽  
V.N. Kruchinin

AbstractThe development of the roughness of the Si (100) surface has been investigated at the initial stage of etching in the molecular flow of F2 and XeF2 gases. It was discovered that roughness grew during etching in XeF2 gas and decreased during etching in F2 gas, that is, F2 gas polishes Si surface unlike XeF2. This difference was explained with the help of ellipsometric study of the kinetics of adsorption layer formation.

2009 ◽  
Vol 113 (14) ◽  
pp. 5664-5671 ◽  
Author(s):  
Alexey G. Bykov ◽  
Shi-Yow Lin ◽  
Giuseppe Loglio ◽  
Reinhard Miller ◽  
Boris A. Noskov

2018 ◽  
Vol 20 (4) ◽  
pp. 2403-2412 ◽  
Author(s):  
Dominik Kosior ◽  
Jan Zawala

We show, for the first time, the influence of the initial adsorption coverage over a bubble on the kinetics of dynamic adsorption layer formation.


1990 ◽  
Vol 87 ◽  
pp. 1597-1607 ◽  
Author(s):  
L Benedetti ◽  
M Borsari ◽  
C Fontanesi ◽  
G Battistuzzi Gavioli

2016 ◽  
Vol 47 (4) ◽  
pp. 367-388 ◽  
Author(s):  
Alexander Ivanovich Erofeev ◽  
Alexander Petrovich Nikiforov ◽  
Sergei Borisovich Nesterov ◽  
Ramul'ya Amirovna Nezhmetdinova

1992 ◽  
Vol 280 ◽  
Author(s):  
J. F. Egler ◽  
N. Otsuka ◽  
K. Mahalingam

ABSTRACTGrowth kinetics on non-singular surfaces were studied by Monte Carlo simulations. In contrast to the growth on singular and vicinal surfaces, the sticking coefficient on the non-singular surfaces was found to decrease with increase of the surface roughness. Simulations of annealing processes showed that surface diffusion of atoms leads to a stationary surface roughness, which is explained by multiple configurations having the lowest energy in the non-singular surface.


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