Nonstoichiometry and Doping of Zinc Oxide

1996 ◽  
Vol 453 ◽  
Author(s):  
Arthur W. Sleight ◽  
Ruiping Wang

AbstractContrary to the commonly accepted model, we conclude that the zinc interstitials in Zn1+xO are not ionized. Instead, the electron pair associated with the interstitial zinc is trapped in a metal—metal bond. The increase in conductivity on initial reduction of zinc oxide is associated with impurities such as silicon which are compensated by extra oxygen unless removed by reduction. Zinc oxide powders and thin films were prepared with the dopants B, Al, Ga, In, and Ge. By using high temperatures and highly reducing conditions, conductivities 1000 times higher than previously reported for powders were obtained for some of our powders.

2017 ◽  
Vol 24 (Supp01) ◽  
pp. 1850006 ◽  
Author(s):  
YANG WANG ◽  
CHENGBIAO WANG ◽  
ZHIJIAN PENG ◽  
QI WANG ◽  
XIULI FU

Oxygen-deficient zinc oxides thin films with different levels of defects were prepared by using radio frequency magnetron sputtering method with sintered zinc oxide disk as target at different sputtering powers. The composition, structure and electrical properties of the prepared films were investigated. Under the present conditions, all the obtained films possessed würtzite structure, which were growing preferentially along the [Formula: see text]-axis. The thickness of the films, the size of the zinc oxide grains and the content of Zn atoms increased with increasing sputtering power. In the films deposited at a sputtering power from 52[Formula: see text]W to 212[Formula: see text]W, the main defect was interstitial zinc. With increasing sputtering power, due to the enhanced number of interstitial zinc in the films, their room-temperature electrical resistivity would decrease, which was controlled by electron conduction. At increasing measurement temperature, their electrical resistivity would increase, owing to the decrease of defect concentration caused by oxidization.


1967 ◽  
Vol 20 (1) ◽  
pp. 85 ◽  
Author(s):  
VJ Norman

A method is described which enables the position of interstitial zinc within the crystals of zinc oxide powders to be determined. The crystals are etched to various depths with acid, and the excess zinc content of each fraction is estimated. It is shown that the distribution of the interstitial zinc is dependent upon the species of chemisorbed oxygen prevalent, and that a marked concentration of excess zinc in the surface fraction of the crystals is apparent only in those samples of zinc oxide on which the oxygen chemisorbed is predominantly of the reactive variety. The method provides a convenient means of following the diffusion of interstitial zinc on heating. The changes in the distribution of interstitial zinc in both types of zinc oxide that occur on heating in air are shown and discussed.


2011 ◽  
Vol 26 (9) ◽  
pp. 993-997
Author(s):  
Zhan-Yun HUANG ◽  
Ping LUO ◽  
Di-Hu CHEN

2020 ◽  
Vol 1664 ◽  
pp. 012004
Author(s):  
Abbas Sabah Shaker ◽  
Abdalhussain A. Khadayeir

2021 ◽  
Vol 26 ◽  
pp. 102162
Author(s):  
Refik Arat ◽  
Guobin Jia ◽  
Jan Dellith ◽  
Andrea Dellith ◽  
Jonathan Plentz

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