Surface Structure and Morphology of Mg-Segregated, Epitaxial Fe3O4 Thin Films on Mgo(001)

1997 ◽  
Vol 474 ◽  
Author(s):  
J. F. Anderson ◽  
Markus Kuhn ◽  
Ulrike Diebold ◽  
K. Shaw ◽  
P. Stroyanov ◽  
...  
Keyword(s):  
Thin Films ◽  
Electron Diffraction ◽  
Photoelectron Spectroscopy ◽  
Quantum Interference ◽  
Surface Characterization ◽  
High Energy ◽  
Energy Electron ◽  
Scanning Tunneling ◽  
Prolonged Heating ◽  
X Ray

ABSTRACTWe have investigated the structural and compositional changes that are induced by the segregation of substrate Mg to the surface of 1μm-thick Fe3O4 films on MgO(001). The thin films have been grown with plasma-assisted MBE, and characterization with RHEED (reflection high-energy electron diffraction), x-ray diffraction (XRD), and Superconducting Quantum Interference Device (SQUID) magnetometry show slightly strained, single-crystalline Fe3O4 films. For the surface studies, we have combined Low-Energy Electron Diffraction (LEED) and Scanning Tunneling Microscopy (STM). Initial and final surface characterization employed X-ray Photoelectron Spectroscopy (XPS) and Ion Scattering Spec-troscopy (ISS) respectively. The surfaces of the MBE-grown samples are flat and show a (√2 × √2)R45° reconstruction with respect to the Fe3O4 surface unit cell. We observe the onset of Mg segregation to the surface at around 700 K, with long, narrow extensions of terraces being observed growing along the [110] and [110] directions. Upon prolonged heating at 800 K, massive Mg segregation to the surface is observed. Heating in an oxygen atmosphere induces a 1×4 surface reconstruction, and results in extremely long (≈ 1000 Å), wide terraces.

scholarly journals The Reflection High Energy Electron Diffraction and X-ray Photoelectron Spectroscopy Studies of CeO2 Thin Films on Bi-based Superconducting Bulk Single Crystals.

Shinku ◽  
1994 ◽  
Vol 37 (3) ◽  
pp. 183-186
Author(s):  
Yusuke GOTO ◽  
Hiroyuki TSUCHIDA ◽  
Heizo TOKUTAKA ◽  
Satoru KISHIDA ◽  
Kikuo FUJIMURA ◽  
...  
Keyword(s):  
Thin Films ◽  
Electron Diffraction ◽  
Single Crystals ◽  
Photoelectron Spectroscopy ◽  
High Energy ◽  
Energy Electron ◽  
High Energy Electron ◽  
X Ray ◽  
Bulk Single Crystals ◽  
Spectroscopy Studies

Study of KTiOPO4 surface by x-ray photoelectron spectroscopy and reflection high-energy electron diffraction

2002 ◽  
Vol 34 (1) ◽  
pp. 320-323 ◽  
Author(s):  
V. V. Atuchin ◽  
V. G. Kesler ◽  
N. Yu. Maklakova ◽  
L. D. Pokrovsky ◽  
V. N. Semenenko
Keyword(s):  
Electron Diffraction ◽  
Photoelectron Spectroscopy ◽  
High Energy ◽  
Energy Electron ◽  
High Energy Electron ◽  
X Ray

Formation of a Ba-Te Surface on GaAs

2003 ◽  
Vol 782 ◽  
Author(s):  
Kevin A. Boulais ◽  
Francisco Santiago ◽  
Karen J. Long ◽  
Victor H. Gehman
Keyword(s):  
Electron Diffraction ◽  
Photoelectron Spectroscopy ◽  
Molecular Beam ◽  
High Energy ◽  
Energy Electron ◽  
High Energy Electron ◽  
X Ray ◽  
Low Energy Electron Diffraction ◽  
Low Energy Electron ◽  
Polycrystalline Form

ABSTRACTThe formation of a Ba-Te surface on GaAs has been investigated. The surface was created using molecular beam epitaxy (MRS). A GaAs (100) surface was first exposed to Te and characterized using x-ray photoelectron spectroscopy (XPS), reflective high energy electron diffraction (RHEED) and low energy electron diffraction (LEED). The Te-reacted surface was then exposed to BaF2 flux producing a second reaction. In this reaction, the BaF2 dissociated leaving barium on the surface but no fluorine. This is in contrast to the clean (no tellurium) GaAs (100) surface in which BaF2 has been shown to grow single crystal. Although high order exists during early stages of the Ba-Te growth, further exposure gives way to a polycrystalline form. This paper discusses the formation and analysis of the Ba-Te surface.

Influence of Structure on the Soft X-Ray Optical Properties of Metallic Multilayers

1991 ◽  
Vol 229 ◽  
Author(s):  
J. M. Slaughter ◽  
Patrick A. Kearney ◽  
Charles M. Falco
Keyword(s):  
Optical Properties ◽  
Electron Diffraction ◽  
High Energy ◽  
Energy Electron ◽  
Ex Situ ◽  
Scanning Tunneling ◽  
X Rays ◽  
Actual Performance ◽  
Rutherford Back Scattering ◽  
X Ray

AbstractMultilayer thin film structures for reflecting soft x-rays are now being fabricated in a number of laboratories. However, understanding of. the optical properties of these structures is presently limited by lack of knowledge of the microstructure of the layers, as well as of the details of the interfaces. In this paper we present results from our studies of multilayers grown by molecular beam epitaxy (MBE), characterized in situ by reflection high energy electron diffraction (RHEED), low energy electron diffraction (LEED), Auger, and x-ray photoelectron spectroscopy (XPS), and characterized ex situ by scanning tunneling microscopy (STM), transmission electron microscopy (TEM), x-ray diffraction, and Rutherford back scattering (RBS). In the case of Mo/Si multilayers, we observe the formation of an amorphous interfacial silicide, which can have a positive effect on the performance of these evaporated multilayer mirrors. We observe a contraction in the period of these multilayers as the deposition temperature is raised from 50 °C to 250 °C, corresponding to an increase in the thickness of the interfacial silicide. This contraction indicates that the silicide is more dense than the average atomic density of its components. We also discuss Ag/B and Pd/B multilayers, which have very similar theoretical performance. However, due to differences in the multilayer structures formed, the actual performance of multilayers made from these materials is radically different. The structural differences originate from different growth modes for Ag and Pd on B.

scholarly journals Thermal effects on (100) CdZnTe substrates as studied by x‐ray photoelectron spectroscopy and reflection high energy electron diffraction

1992 ◽  
Vol 60 (15) ◽  
pp. 1878-1880 ◽  
Author(s):  
Y. S. Wu ◽  
C. R. Becker ◽  
A. Waag ◽  
R. N. Bicknell‐Tassius ◽  
G. Landwehr
Keyword(s):  
Electron Diffraction ◽  
Photoelectron Spectroscopy ◽  
Thermal Effects ◽  
High Energy ◽  
Energy Electron ◽  
High Energy Electron ◽  
X Ray ◽  
Cdznte Substrates
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