Solution Deposition of Ferroelectric Thin Films

MRS Bulletin ◽  
1996 ◽  
Vol 21 (6) ◽  
pp. 49-54 ◽  
Author(s):  
B.A. Tuttle ◽  
R.W. Schwartz

Solution deposition has been used by almost every electroceramic research-and-development organization throughout the world to evaluate thin films. Ferrite, high-temperature-superconductor, dielectric, and antireflection coatings are among the electroceramics for which solution deposition has had a significant impact. Lithium niobate, lithium tantalate, potassium niobate, lead scandium tantalate, lead magnesium niobate, and bismuth strontium tantalate are among the ferroelectric thin films processed by solution deposition. However, lead zir-conate titanate (PZT) thin films have received the most intensive study and will be emphasized in this article.Solution deposition facilitates stoichiometric control of complex mixed oxides better than other techniques such as sputter deposition and metalorganic chemical vapor deposition (MOCVD). Solution deposition is a fast, cost-efficient method to survey extensive ranges of film composition. Further it is a process compatible with many semiconductor-fabrication technologies, and it may be the deposition method of choice for applications that do not require conformal depositions and that have device dimensions of 2 μm or greater. Specific applications for which solution deposition is commercially viable include decoupling capacitors, uncooled pyroelectric infrared detectors, piezoelectric micromotors, and chemical microsensors based on surface-acoustic-wave technology. Reviews of some of the more fundamental aspects of solution-deposition processing may be found in the scientific literature.

1995 ◽  
Vol 34 (Part 1, No. 9B) ◽  
pp. 5083-5085 ◽  
Author(s):  
Yutaka Takeshima ◽  
Kosuke Shiratsuyu ◽  
Hiroshi Takagi ◽  
Kunisaburo Tomono

1990 ◽  
Vol 12 (2) ◽  
pp. 29-34 ◽  
Author(s):  
P. Ravindranathan ◽  
S. Komarneni ◽  
A. S. Bhalla ◽  
L. E. Cross ◽  
R. Roy

2017 ◽  
Vol 100 (9) ◽  
pp. 3961-3972 ◽  
Author(s):  
Ryan Keech ◽  
Carl Morandi ◽  
Margeaux Wallace ◽  
Giovanni Esteves ◽  
Lyndsey Denis ◽  
...  

Crystals ◽  
2019 ◽  
Vol 9 (3) ◽  
pp. 124
Author(s):  
Awais Saleemi ◽  
Ali Abdullah ◽  
Muhammad Saeed ◽  
M. Anis-ur-Rehman ◽  
Ayyaz Mahmood ◽  
...  

The control of the morphologies and thus the optical, electrical, and magnetic effect of 2D thin films is a challenging task for the development of cost-efficient devices. In particular, the angular dependent magnetoresistance (MR) of surface thin films up to room temperature is an interesting phenomenon in materials science. Here, we report amorphous carbon thin films fabricated through chemical vapor deposition at a SiO2 substrate. Their structural and angular magnetoresistance properties were investigated by several analytical tools. Specifically, we used a physical property measurement system to estimate the magnitude of the angular MR of these as-prepared sample thin films from 2 K to 300 K. An angular MR magnitude of 1.6% for the undoped a-carbon thin films was found up to 300 K. Under the magnetic field of 7 T, these films possessed an angular MR of 15% at a low temperature of 2 K. A high disorder degree leads to a large magnitude of MR. The grain boundary scattering model was used to interpret the mechanism of this angular MR.


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