ASSESSMENT OF THE SIGNAL/NOISE RATIO IN A BINARY SIGNAL

2012 ◽  
Vol 71 (5) ◽  
pp. 445-453
Author(s):  
M. D. Rasnikov ◽  
I. T. Rozhkov
Author(s):  
R. F. Egerton

An important parameter governing the sensitivity and accuracy of elemental analysis by electron energy-loss spectroscopy (EELS) or by X-ray emission spectroscopy is the signal/noise ratio of the characteristic signal.


Author(s):  
Ryan Xiao ◽  
William Wang ◽  
Ang Li ◽  
Shengqiu Xu ◽  
Binghai Liu

Abstract With the development of semiconductor technology and the increment quantity of metal layers in past few years, backside EFA (Electrical Failure Analysis) technology has become the dominant method. In this paper, abnormally high Signal Noise Ratio (SNR) signal captured by Electro-Optical Probing (EOP)/Laser Voltage Probing (LVP) from backside is shown and the cause of these phenomena are studied. Based on the real case collection, two kinds of failure mode are summarized, and simulated experiments are performed. The results indicate that when a current path from power to ground is formed, the high SNR signal can be captured at the transistor which was on this current path. It is helpful of this consequence for FA to identify the failure mode by high SNR signal.


2008 ◽  
Vol 08 (02) ◽  
pp. L229-L235 ◽  
Author(s):  
LEI ZHANG ◽  
JUN HE ◽  
AIGUO SONG

Recently, it was reported that some saturation nonlinearities could effectively act as noise-aided signal-noise-ratio amplifiers. In the letter we consider the signal detection performance of saturation nonlinearities driven by a sinusoidal signal buried in Gaussian white noise. It is showed that the signal detection statistics still undergo a nonmonotonic evolution as noise is raised. We also particularly show that an improvement of the SNR in terms of the first harmonic does not imply the possibility to improve the signal detection performance through stochastic resonance. The study might also complement other reports about stochastic resonance in saturation nonlinearities.


2018 ◽  
Vol 115 (10) ◽  
pp. 2034-2043 ◽  
Author(s):  
Seongjin Lim ◽  
Hyeono Nam ◽  
Jessie S. Jeon

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