Investigation of Relationship between Hot Carrier Degradation and Kink Effect in Low Temperature Poly-Si TFTs

1999 ◽  
Vol 30 (1) ◽  
pp. 452 ◽  
Author(s):  
Satoshi Inoue ◽  
Tatsuya Shimoda
Keyword(s):  
Low Temperature ◽  
Hot Carrier ◽  
Kink Effect ◽  
Hot Carrier Degradation

Inhibiting the Kink Effect and Hot-Carrier Stress Degradation Using Dual-Gate Low-Temperature Poly-Si TFTs

2020 ◽  
Vol 41 (1) ◽  
pp. 54-57 ◽  
Author(s):  
Hong-Chih Chen ◽  
Hong-Yi Tu ◽  
Hui-Chun Huang ◽  
Wei-Chih Lai ◽  
Ting-Chang Chang ◽  
...  
Keyword(s):  
Low Temperature ◽  
Hot Carrier ◽  
Kink Effect ◽  
Hot Carrier Stress ◽  
Stress Degradation ◽  
Dual Gate

Grain-Boundary Related Hot Carrier Degradation Mechanism in Low-Temperature Polycrystalline Silicon Thin-Film Transistors

2003 ◽  
Vol 42 (Part 1, No. 4B) ◽  
pp. 1999-2003 ◽  
Author(s):  
Toshiyuki Yoshida ◽  
Yoshiki Ebiko ◽  
Michiko Takei ◽  
Nobuo Sasaki ◽  
Toshiaki Tsuchiya
Keyword(s):  
Thin Film ◽  
Low Temperature ◽  
Grain Boundary ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Degradation Mechanism ◽  
Silicon Thin Film ◽  
Hot Carrier ◽  
Hot Carrier Degradation
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