Inhibiting the Kink Effect and Hot-Carrier Stress Degradation Using Dual-Gate Low-Temperature Poly-Si TFTs

2020 ◽  
Vol 41 (1) ◽  
pp. 54-57 ◽  
Author(s):  
Hong-Chih Chen ◽  
Hong-Yi Tu ◽  
Hui-Chun Huang ◽  
Wei-Chih Lai ◽  
Ting-Chang Chang ◽  
...  
Keyword(s):  
Low Temperature ◽  
Hot Carrier ◽  
Kink Effect ◽  
Hot Carrier Stress ◽  
Stress Degradation ◽  
Dual Gate

An Asymmetric Dual Gate Poly-Si TFTs for Improving Hot Carrier Stress Stability and Kink Effect Suppression

2006 ◽  
Vol 910 ◽  
Author(s):  
Joong Hyun Park ◽  
Woo Jin Nam ◽  
Jae Hoon Lee ◽  
Min Koo Han
Keyword(s):  
Current Flow ◽  
Total Current ◽  
Hot Carrier ◽  
Kink Effect ◽  
Gate Structure ◽  
Hot Carrier Stress ◽  
Dual Gate ◽  
Drain Bias ◽  
Current Operation ◽  
Si Thin Film

AbstractAn asymmetric dual gate poly-Si thin film transistors (TFTs), which is consist a long-gate TFT and a short-gate TFT, were fabricated in order to suppress the kink current and increase the reliability. The long-gate TFT operates in a linear regime and limits the total current flow by its current operation region. The asymmetric dual-gate does not exhibit from the kink current in a high drain bias due to the distribution of lateral electric field. The asymmetric dual-gate structure improves kink-free characteristics compared with conventional single and dual-gate TFTs. The hot-carrier stress reliability is successfully improved due to kink current suppression.

TCAD simulation of hot-carrier stress degradation in split-gate n-channel STI-LDMOS transistors

2020 ◽  
Vol 109 ◽  
pp. 113643
Author(s):  
Federico Giuliano ◽  
Paolo Magnone ◽  
Simone Pistollato ◽  
Andrea Natale Tallarico ◽  
Susanna Reggiani ◽  
...  
Keyword(s):  
Hot Carrier ◽  
Hot Carrier Stress ◽  
Stress Degradation ◽  
Tcad Simulation

Abnormal Relationship Between Hot Carrier Stress Degradation and Body Current in High-k Metal Gate in the 14-nm Node

2019 ◽  
Vol 40 (4) ◽  
pp. 498-501
Author(s):  
Kai-Chun Chang ◽  
Jih-Chien Liao ◽  
Ting-Chang Chang ◽  
Chien-Hung Yeh ◽  
Chien-Yu Lin ◽  
...  
Keyword(s):  
Metal Gate ◽  
Hot Carrier ◽  
High K ◽  
Hot Carrier Stress ◽  
Stress Degradation

Hot carrier stress degradation modes in p-type high voltage LDMOS transistors

2009 ◽  
Author(s):  
H. Enichlmair ◽  
J. M. Park ◽  
S. Carniello ◽  
B. Loeffler ◽  
R. Minixhofer ◽  
...  
Keyword(s):  
High Voltage ◽  
Hot Carrier ◽  
Hot Carrier Stress ◽  
Stress Degradation ◽  
P Type ◽  
Degradation Modes

Highly-Doped Region Optimization for Reduced Hot-Carrier Effects in Dual-Gate Low Temperature Polysilicon TFTs

2021 ◽  
pp. 1-1
Author(s):  
Jian-Jie Chen ◽  
Po-Hsun Chen ◽  
Ting-Chang Chang ◽  
Yu-Fa Tu ◽  
Kuan-Ju Zhou ◽  
...  
Keyword(s):  
Low Temperature ◽  
Hot Carrier ◽  
Dual Gate ◽  
Hot Carrier Effects
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