scholarly journals Evaluation of Laser Doping of Si from MCLT Measurement

2004 ◽  
Vol 1 (2) ◽  
pp. 321-325
Author(s):  
Baghdad Science Journal

The measurement of minority carrier lifetime (MCLT) ofp-n Si fabricated with aid of laser doping technique was reported. The measurement is achieved by using open circuit voltage decay (OCVD) technique. The experiment data confirms that the value of MCLT and proftle of Voc decay were very sensitive to the doping laser energy.

MRS Bulletin ◽  
2007 ◽  
Vol 32 (3) ◽  
pp. 225-229 ◽  
Author(s):  
Joseph D. Beach ◽  
Brian E. McCandless

AbstractThe record laboratory cell (∼1 cm2 area) efficiency for thin-film cadmium telluride (CdTe) is 16.5%, and that for a copper indium diselenide (CuInSe2) thin-film alloy is 19.5%. Commercially produced CdTe and CuInSe2 modules (0.5–1 m2 area) have efficiencies in the 7–11% range. Research is needed both to increase laboratory cell efficiencies and to bring those small - area efficiencies to large-area production. Increases in laboratory CdTe cell efficiency will require increasing open-circuit voltage, which will allow cells to harvest more energy from each absorbed photon. This will require extending the minority carrier lifetime from its present τ ≤ 2 ns to τ ≥ 10 ns and increasing hole concentration in the CdTe beyond 1015 cm2, which appears to be limited by compensating defects. Increasing laboratory CuInSe2-based cell efficiency significantly beyond 19.5% will also require increasing the open-circuit voltage, either by increasing the bandgap, the doping level, or the minority carrier lifetime. The photovoltaic cells in commercial modules occupy tens of square centimeters, and both models and experiments have shown that low-performing regions in small fractions of a cell can significantly reduce the overall cell per formance. Increases in commercial module efficiency will require control of materials properties across large deposition areas in a high-throughput environment to minimize such non-uniformities. This article discusses approaches used and research needed to increase the ultimate efficiencies of CdTe- and CuInSe2-based devices and translate these gains to commercial photovoltaic modules.


1997 ◽  
Vol 19 (4) ◽  
pp. 225-238
Author(s):  
B. Affour ◽  
P. Mialhe

The Open Circuit Voltage Decay (OCVD) method for the determination of the base minority carrier lifetime (τ) and the back surface recombination velocity (S) of silicon solar cells has been investigated at constant illumination level. The validity of the method has been discussed through a simulation study by considering the mathematical solution of the continuity equation. Extracted values ofτand S are compared to their input values in order to evaluate the performances of our method and the precision with regard to cell structural parameters, namely the base width and the base doping level. Deviations in lifetime values remain lower than 7% for almost all the cell configurations while recombination velocity deviations are shown to be dependent on cell structure parameters and experimental procedure.


2009 ◽  
Vol 615-617 ◽  
pp. 703-706 ◽  
Author(s):  
Nicolas Dheilly ◽  
Dominique Planson ◽  
Pierre Brosselard ◽  
Jawad ul Hassan ◽  
Pascal Bevilacqua ◽  
...  

This paper reports on the influence of temperature on the electrical carrier lifetime of a 3.3 kV 4H-SiC PiN diode processed with a new generation of SiC material. The Open Circuit Voltage Decay (OCVD) is used to evaluate ambipolar lifetime evolution versus temperature. The paper presents a description of the setup, electrical measurements and extraction fittings. The ambipolar lifetime is found to rise from 600 ns at 30 °C to 3.5 μs at 150 °C.


2015 ◽  
Vol 2015 ◽  
pp. 1-5
Author(s):  
Haoyang Cui ◽  
Jialin Wang ◽  
Chaoqun Wang ◽  
Can Liu ◽  
Kaiyun Pi ◽  
...  

This paper presents experiment measurements of minority carrier lifetime using three different methods including modified open-circuit voltage decay (PIOCVD) method, small parallel resistance (SPR) method, and pulse recovery technique (PRT) onpnjunction photodiode of the HgCdTe photodetector array. The measurements are done at the temperature of operation near 77 K. A saturation constant background light and a small resistance paralleled with the photodiode are used to minimize the influence of the effect of junction capacitance and resistance on the minority carrier lifetime extraction in the PIOCVD and SPR measurements, respectively. The minority carrier lifetime obtained using the two methods is distributed from 18 to 407 ns and from 0.7 to 110 ns for the different Cd compositions. The minority carrier lifetime extracted from the traditional PRT measurement is found in the range of 4 to 20 ns forx=0.231–0.4186. From the results, it can be concluded that the minority carrier lifetime becomes longer with the increase of Cd composition and the pixels dimensional area.


Sign in / Sign up

Export Citation Format

Share Document