Electron-Impact Ionization Time-of-Flight Mass Spectrometer for Molecular Beams,

1989 ◽  
Author(s):  
James E. Pollard ◽  
Ronald B. Cohen
1993 ◽  
Vol 28 (12) ◽  
pp. 1467-1475 ◽  
Author(s):  
F. Moritz ◽  
M. Dey ◽  
K. Zipperer ◽  
S. Prinke ◽  
J. Grotemeyer

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