Contactless Mobility, Carrier Density, and Sheet Resistance Measurements on Si, GaN, and AlGaN/GaN High Electron Mobility Transistor (HEMT) Wafers
1998 ◽
Vol 31
(2)
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pp. 159-164
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2013 ◽
Vol 805-806
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pp. 1027-1030
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2006 ◽
Vol 45
(No. 35)
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pp. L932-L934
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2004 ◽
Vol 43
(12)
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pp. 8019-8023
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