Quantification of the Influence of Thin Film Microstructure on Adhesion for a Model Brittle-Ductile Interface

SSRN Electronic Journal ◽

10.2139/ssrn.3542921 ◽

2020 ◽

Author(s):

A. Lassnig ◽

V. L. Terziyska ◽

J. Zálešák ◽

T. Jörg ◽

D.M. Többens ◽

...

Keyword(s):

Thin Film ◽

Film Microstructure

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Effect of Film Microstructure on Domain Nucleation and Intrinsic Switching in Ferroelectric Y:HfO 2 Thin Film Capacitors

Advanced Functional Materials ◽

10.1002/adfm.202108876 ◽

2021 ◽

pp. 2108876

Author(s):

Pratyush Buragohain ◽

Adam Erickson ◽

Takanori Mimura ◽

Takao Shimizu ◽

Hiroshi Funakubo ◽

...

Keyword(s):

Thin Film ◽

Thin Film Capacitors ◽

Film Microstructure

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The dependence of aluminum nitride thin-film microstructure on the number of low-temperature plasma-enhanced atomic layer deposition process cycles

Surface and Coatings Technology ◽

10.1016/j.surfcoat.2019.06.064 ◽

2019 ◽

Vol 378 ◽

pp. 124744

Author(s):

M.G. Ambartsumov ◽

V.A. Tarala ◽

S.O. Krandievsky ◽

A.A. Kravtsov ◽

A.B. Sautiev ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Atomic Layer Deposition ◽

Aluminum Nitride ◽

Atomic Layer ◽

Deposition Process ◽

Low Temperature Plasma ◽

Temperature Plasma ◽

Layer Deposition ◽

Film Microstructure

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P–P heterojunction sensor of self-assembled polyaniline nano-thin film/microstructure silicon array for NH3 detection

Chemical Physics Letters ◽

10.1016/j.cplett.2014.12.052 ◽

2015 ◽

Vol 621 ◽

pp. 58-64 ◽

Author(s):

Huiling Tai ◽

Xiaoying Xu ◽

Zongbiao Ye ◽

Chunhua Liu ◽

Guangzhong Xie ◽

...

Keyword(s):

Thin Film ◽

Film Microstructure ◽

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Thin film microstructure and process simulation using SIMBAD

Thin Films - Modeling of Film Deposition for Microelectronic Applications ◽

10.1016/s1079-4050(96)80003-2 ◽

1996 ◽

pp. 1-79 ◽

Author(s):

Michael J. Brett ◽

Steven K. Dew ◽

Tom J. Smy

Keyword(s):

Thin Film ◽

Process Simulation ◽

Film Microstructure

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Building Blocks for n-Type Molecular and Polymeric Electronics. Perfluoroalkyl- versus Alkyl-Functionalized Oligothiophenes (nT;n= 2−6). Systematics of Thin Film Microstructure, Semiconductor Performance, and Modeling of Majority Charge Injection in Field-Effect Transistors

Journal of the American Chemical Society ◽

10.1021/ja0489846 ◽

2004 ◽

Vol 126 (42) ◽

pp. 13859-13874 ◽

Author(s):

Antonio Facchetti ◽

Melissa Mushrush ◽

Myung-Han Yoon ◽

Geoffrey R. Hutchison ◽

Mark A. Ratner ◽

...

Keyword(s):

Thin Film ◽

Field Effect ◽

Field Effect Transistors ◽

Charge Injection ◽

Building Blocks ◽

Film Microstructure

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In situ GIWAXS analysis during spin-coating of solvent and additive effects on organic electronic thin-film microstructure evolution

Acta Crystallographica Section A Foundations and Advances ◽

10.1107/s0108767317098725 ◽

2017 ◽

Vol 73 (a1) ◽

pp. a129-a129

Author(s):

Eric Manley ◽

Joseph Strzalka ◽

Tobin Marks ◽

Lin Chen

Keyword(s):

Thin Film ◽

Microstructure Evolution ◽

Spin Coating ◽

Additive Effects ◽

Organic Electronic ◽

Film Microstructure

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Thin film microstructure simulation of RF bias planarized metal interconnects using a ballistic deposition model

1991 Proceedings Eighth International IEEE VLSI Multilevel Interconnection Conference ◽

10.1109/vmic.1991.153023 ◽

2002 ◽

Author(s):

S.K. Dew ◽

T. Smy ◽

M.J. Brett

Keyword(s):

Thin Film ◽

Deposition Model ◽

Microstructure Simulation ◽

Film Microstructure ◽

Metal Interconnects

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Simulation of the effect of thin film microstructure on current and temperature distributions in very large scale integrated metallization structures

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.586199 ◽

1992 ◽

Vol 10 (5) ◽

pp. 2267 ◽

Author(s):

T. Smy

Keyword(s):

Thin Film ◽

Large Scale ◽

Temperature Distributions ◽

Film Microstructure

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A Comprehensive Study on the Effect of Thin Film Microstructure on Vapor Sensing Behavior of Carbon-Based Polymeric Conductive Nanocomposites

ECS Meeting Abstracts ◽

10.1149/ma2010-01/41/1823 ◽

2010 ◽

Keyword(s):

Thin Film ◽

Vapor Sensing ◽

Conductive Nanocomposites ◽

Film Microstructure ◽

Comprehensive Study ◽

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New probe of thin‐film microstructure

Applied Physics Letters ◽

10.1063/1.98411 ◽

1987 ◽

Vol 51 (6) ◽

pp. 427-429 ◽

Author(s):

Victor Mizrahi ◽

F. Suits ◽

J. E. Sipe ◽

U. J. Gibson ◽

G. I. Stegeman

Keyword(s):

Thin Film ◽

Film Microstructure

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