scholarly journals Power Series Representation Op logical Functions and its Applications to Error Detection and Error Correction Codes.(Dept.E)

2021 ◽  
Vol 18 (3) ◽  
pp. 1-12
Author(s):  
Yehia Enab ◽  
Fayez Zaki
Electronics ◽  
2020 ◽  
Vol 9 (12) ◽  
pp. 2074
Author(s):  
J.-Carlos Baraza-Calvo ◽  
Joaquín Gracia-Morán ◽  
Luis-J. Saiz-Adalid ◽  
Daniel Gil-Tomás ◽  
Pedro-J. Gil-Vicente

Due to transistor shrinking, intermittent faults are a major concern in current digital systems. This work presents an adaptive fault tolerance mechanism based on error correction codes (ECC), able to modify its behavior when the error conditions change without increasing the redundancy. As a case example, we have designed a mechanism that can detect intermittent faults and swap from an initial generic ECC to a specific ECC capable of tolerating one intermittent fault. We have inserted the mechanism in the memory system of a 32-bit RISC processor and validated it by using VHDL simulation-based fault injection. We have used two (39, 32) codes: a single error correction–double error detection (SEC–DED) and a code developed by our research group, called EPB3932, capable of correcting single errors and double and triple adjacent errors that include a bit previously tagged as error-prone. The results of injecting transient, intermittent, and combinations of intermittent and transient faults show that the proposed mechanism works properly. As an example, the percentage of failures and latent errors is 0% when injecting a triple adjacent fault after an intermittent stuck-at fault. We have synthesized the adaptive fault tolerance mechanism proposed in two types of FPGAs: non-reconfigurable and partially reconfigurable. In both cases, the overhead introduced is affordable in terms of hardware, time and power consumption.


Author(s):  
Luis-J. Saiz-Adalid ◽  
Pedro Gil ◽  
Juan-Carlos Ruiz ◽  
Joaquin Gracia-Moran ◽  
Daniel Gil-Tomas ◽  
...  

2019 ◽  
Vol 8 (2S8) ◽  
pp. 1948-1952

The developments in IC technology and rapid increase of transistor densities and scaling factor, the use of ECC’s acquired prominence. Multiple bit errors in memories due to technology scaling demands advanced error correction codes. SEC-DEC, DEC, burst error detection, Golay code, Reed Solmon codes etc. have much decoding complexity and latency. The above drawbacks can be reduced with OLS codes. OLS codes with majority logic decoding technique, modular construction and simple decoding mechanisms it enables low delay improvements. MBU’S can be addressed using OLS-MLD codes. This paper presents a detail study of developments in multibit ECC’s using OLS-MLD mechanism


1981 ◽  
Vol 24 (3) ◽  
pp. 381-388 ◽  
Author(s):  
M.L. Mogra ◽  
O.P. Juneja

The authors determine the sharp radius of convexity for functions analytic and starlike in the unit disc having power series representation of the form where an+1 is fixed. The estimate obtained is an improvement over the corresponding fixed second coefficient result. It is expected that this approach will lead to sharpening and improvement of a number of earlier known results.


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