AbstractSingle crystals of lead-free halide double perovskite Cs2AgBiBr6 sensor material manifest a remarkable potential for application in radiation detection and imaging. In this study, the purity and crystallinity of solution-grown Cs2AgBiBr6 single crystals with cubic Fm$$\overline{3}$$
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m symmetry have been corroborated by powder XRD measurements, while the single crystal XRD patterns reveal the dominant {111} lattice planes parallel to the sample surfaces. A wider range of lower resistivity values (106–109 Ωcm) was obtained from the I-V measurements compared to the 1.55 × 109–6.65 × 1010 Ωcm values from the van der Pauw method, which is typically higher for the Ag than for the carbon paint electrodes. Charge-carrier mobility values estimated from the SCLC method for the carbon paint-Cs2AgBiBr6 (1.90–4.82 cm2V−1 s−1) and the Ag-Cs2AgBiBr6 (0.58–4.54 cm2V−1 s−1) including the density of trap states (109–1010 cm−3) are comparable. Similar values of 1.89 cm2V−1 s−1 and 2.36 cm2V−1 s−1 are derived from the Hall effect measurements for a sample with carbon and Ag electrodes, respectively. The key electrical parameters including the X-ray photoresponse measurements indicate that the Cs2AgBiBr6 samples synthesized in this study satisfy requirements for radiation sensors.
Graphical abstract
GROWTH AND CHARACTERIZATION OF CS2AGBIBR6 DOUBLE PEROVSKITE SINGLE CRYSTALS FOR IONIZING RADIATION DETECTION
