scholarly journals Calculation of displacement field in three-layered hollow structures for non-destructive testing by digital holographic interferometry

2012 ◽  
Vol 2 (2) ◽  
pp. 90-94
Author(s):  
A. Kh. Akhunova ◽  
S. V. Dmitriev ◽  
R. V. Safiullin ◽  
A. R. Safiullin ◽  
F. F. Safin
Keyword(s):  
Displacement Field ◽  
Holographic Interferometry ◽  
Non Destructive Testing ◽  
Destructive Testing ◽  
Hollow Structures ◽  
Non Destructive

scholarly journals Terahertz based non-destructive testing (NDT)

2020 ◽  
Vol 0 (0) ◽  
Author(s):  
Dirk Nüßler ◽  
Joachim Jonuscheit
Keyword(s):  
New Technology ◽  
Industrial Applications ◽  
X Rays ◽  
Non Destructive Testing ◽  
Destructive Testing ◽  
Reinforced Plastics ◽  
Hollow Structures ◽  
Terahertz Technology ◽  
Non Destructive ◽  
Made In

AbstractEstablished methods based on X-rays, ultrasound, thermography, eddy current, and optics are very effective in fault detection and structural analysis. However, these methods are limited for some applications, for example, the non-destructive testing of fiber-reinforced plastics, foams, and sandwich or hollow structures. In these cases, terahertz technology offers an innovative method to overcome these limitations. Tremendous advances have been made in this new technology in terms of their industrialization in recent years. This paper presents techniques for use in industrial applications.

scholarly journals HOLOGRAPHIC INTERFEROMETRY AS A NON-DESTRUCTIVE TESTING METHOD

2020 ◽  
Vol 7 (1) ◽  
pp. 14-17
Author(s):  
Аndrei V. Gurevich ◽  
Tatyana S. Bernik
Keyword(s):  
Holographic Interferometry ◽  
Non Destructive Testing ◽  
Optical Processing ◽  
Destructive Testing ◽  
Laser Technology ◽  
Testing Method ◽  
Electronic Instrumentation ◽  
And Control ◽  
Non Destructive ◽  
Test Objects

This article discusses the possibilities of holographic interferometry when used in various fields of activity, such as optical processing of received information, optical-electronic instrumentation, interferometry, laser technology, registration and control of fast processes, non-destructive testing of test objects.

Innovative methods of digital holographic interferometry for non-destructive testing of microelectronics products

2020 ◽  
Vol 10 (9) ◽  
pp. 151
Author(s):  
Zakirjan Taxirovich Azamatov ◽  
Nigora Alimdjanovna Akbarova ◽  
Mira Ruzimovna Bekchanova ◽  
M. A. Yoldoshev ◽  
Sanabar Rejepbaevna Reymbaeva
Keyword(s):  
Holographic Interferometry ◽  
Non Destructive Testing ◽  
Destructive Testing ◽  
Innovative Methods ◽  
Non Destructive
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