scholarly journals Atomic Force Microscopy Applied to Atopic Dermatitis Study

2021 ◽  
Vol 18 (4) ◽  
pp. 21-28
Author(s):  
Simona Maria Ţîrcă ◽  
Ion Ţîrcă ◽  
Marius Sorin Ciontea ◽  
Florin Dumitru Mihălţan
Keyword(s):  
Atomic Force Microscopy ◽  
Atopic Dermatitis ◽  
Structural Integrity ◽  
Clinical Investigation ◽  
Normal Skin ◽  
Skin Lesions ◽  
Force Microscopy ◽  
Atomic Force ◽  
Child Patient ◽  
Surface Morphologies

Abstract Atopic dermatitis (AD)-the commonest inflammatory skin disease affects up to 25% of children and 2% to 5% of adults. Methods of the diagnostic provide expanded recommendations founded on available evidence. Morphological evaluation remains a principal feature of clinical investigation and the main criteria of diagnosis. Methods. We collected normal and affected skin from a 6-month child patient who was diagnosed through dermatologic examination. Clinical characteristics and the diagnosis of atopic dermatitis were in accordance with Hanifin and Rajka criteria. Morphology and structural integrity were investigated by Atomic Force Microscopy. Results. Optical and topography images indicate that in the case of AD skin lesions the cuticle structure was severely damaged and distorted with the flattening and grading of the plates, which have an irregular appearance. From the surface morphologies of the samples, we demonstrate that the shape of the corneocytes, with granular and elongated appearance, specific to normal skin is transformed by AD into broken and collapsed plates with discontinuous appearance. Conclusions. In the initial diagnosis of AD changes of the skin properties can be an indicator. Hanifin and Rajka criteria together with Atomic Force Microscopy can be a useful and necessary technique diagnosing cases of atopic dermatitis.

Surface Morphologies ofBaTiO3Thin Films by Atomic Force Microscopy

1994 ◽  
Vol 33 (Part 1, No. 7A) ◽  
pp. 4075-4079 ◽  
Author(s):  
Young Soo Yoon ◽  
Young-Ku Yoon ◽  
Jeong Yong Lee ◽  
Sang Seop Yom
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Surface Morphologies

Atomic force microscopy study on surface morphologies of {110} faces of MnHg(SCN)4 crystals

2005 ◽  
Vol 277 (1-4) ◽  
pp. 555-559 ◽  
Author(s):  
Y.L. Geng ◽  
D. Xu ◽  
Y.L. Wang ◽  
W. Du ◽  
H.Y. Liu ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Force Microscopy ◽  
Atomic Force ◽  
Surface Morphologies

scholarly journals Atomic force microscopy reveals different surface morphologies of functionally-different glial cells

2000 ◽  
Vol 72 (3) ◽  
pp. 433-433
Author(s):  
GILBERTO WEISSMÜLLER ◽  
JOSÉ GARCIA-ABREU ◽  
PAULO MASCARELLO BISCH ◽  
VIVALDO MOURA NETO ◽  
LENY A. CAVALCANTE
Keyword(s):  
Atomic Force Microscopy ◽  
Glial Cells ◽  
Force Microscopy ◽  
Atomic Force ◽  
Surface Morphologies

scholarly journals Understanding the Effects of Sample Preparation on the Chemical Structures of Petroleum Imaged with Non-contact Atomic Force Microscopy

2018 ◽  
Author(s):  
Yunlong Zhang ◽  
Bruno Schuler ◽  
Shadi Fatayer ◽  
Leo Gross ◽  
Michael R. Harper ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Sample Preparation ◽  
Structural Integrity ◽  
Bulk Sample ◽  
Molecular Architecture ◽  
Force Microscopy ◽  
Chemical Structures ◽  
Preparation Conditions ◽  
Atomic Force ◽  
Key Characteristics

This study addresses the effect of sample preparation conditions on the structural integrity and composition of heavy hydrocarbon mixtures imaged by non-contact atomic force microscopy (nc-AFM). We designed and prepared a set of organic molecules mimicking well-accepted key characteristics of heavy oil asphaltenes including molecular architecture, molecular weight, boiling point, atomic H/C ratio and bond strength. We deliberately focused on multi-core molecule structures with long aliphatic linkers as this architecture was largely absent in previous nc-AFM studies of petroleum samples. The results confirm that all these molecules can be successfully imaged and remain intact under the same preparation conditions. Moreover, comparison with ultra-high resolution FT ICR-MS of a steam-cracked tar asphaltene sample suggests that the single molecules identified by nc-AFM span the entire molecule spectrum of the bulk sample. Overall, these results suggest that petroleum molecules within the scope of chosen molecules studied herein can be prepared intact and without bias and the imaged data can be representative.

scholarly journals Understanding the Effects of Sample Preparation on the Chemical Structures of Petroleum Imaged with Non-contact Atomic Force Microscopy

2018 ◽  
Author(s):  
Yunlong Zhang ◽  
Bruno Schuler ◽  
Shadi Fatayer ◽  
Leo Gross ◽  
Michael R. Harper ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Sample Preparation ◽  
Structural Integrity ◽  
Bulk Sample ◽  
Molecular Architecture ◽  
Force Microscopy ◽  
Chemical Structures ◽  
Preparation Conditions ◽  
Atomic Force ◽  
Key Characteristics

This study addresses the effect of sample preparation conditions on the structural integrity and composition of heavy hydrocarbon mixtures imaged by non-contact atomic force microscopy (nc-AFM). We designed and prepared a set of organic molecules mimicking well-accepted key characteristics of heavy oil asphaltenes including molecular architecture, molecular weight, boiling point, atomic H/C ratio and bond strength. We deliberately focused on multi-core molecule structures with long aliphatic linkers as this architecture was largely absent in previous nc-AFM studies of petroleum samples. The results confirm that all these molecules can be successfully imaged and remain intact under the same preparation conditions. Moreover, comparison with ultra-high resolution FT ICR-MS of a steam-cracked tar asphaltene sample suggests that the single molecules identified by nc-AFM span the entire molecule spectrum of the bulk sample. Overall, these results suggest that petroleum molecules within the scope of chosen molecules studied herein can be prepared intact and without bias and the imaged data can be representative.

Investigation of gel-spun PAN fiber morphology by membrane technology techniques

e-Polymers ◽  
2010 ◽  
Vol 10 (1) ◽  
Author(s):  
Caixia Ma ◽  
Zongyi Qin ◽  
Ding Pan
Keyword(s):  
Atomic Force Microscopy ◽  
Solvent Mixture ◽  
Fiber Morphology ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Pan Fiber ◽  
Atomic Force ◽  
Surface Morphologies ◽  
Mixture System ◽  
Mode Atomic Force Microscopy

AbstractThe as-formed structure of gel-spun polyacrylonitrile (PAN) fiber from the solvent mixture system has been probed exploiting AFM techniques developed in the membrane industry. The surface structure of PAN membranes, prepared by phase transition under different casting conditions, was investigated by tapping mode atomic force microscopy. The results obtained show that the size and the density of these aggregates are dependent on the casting solution, namely on the type and concentration of the non-solvent. In the present work, tapping mode atomic force microscopy is used to comply with the main objective of differentiating surface morphologies of membranes.

scholarly journals Investigation of the Blistering and Exfoliation Mechanism of GaAs Wafers and SiO2/Si3N4/GaAs Wafers by He+ and H+ Implantation

Crystals ◽  
2020 ◽  
Vol 10 (6) ◽  
pp. 520
Author(s):  
Rui Huang ◽  
Tian Lan ◽  
Chong Li ◽  
Jing Li ◽  
Zhiyong Wang
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Optical Microscopy ◽  
Gaas Layer ◽  
Force Microscopy ◽  
Thermally Activated ◽  
Atomic Force ◽  
Transmission Electron ◽  
Surface Morphologies

The thermally activated blistering and exfoliation of GaAs wafers and SiO2/Si3N4/GaAs wafers after H+ and He+ implantation is systematically investigated. Surface morphologies and microscopic defects are detected and analyzed by various measurements, such as optical microscopy (OM), atomic force microscopy (AFM), and transmission electron microscopy (TEM). Blistering and exfoliation are obtained on the surfaces of the GaAs and SiO2/Si3N4/GaAs wafers by either the exclusive implantation of 5 × 1016 He+/cm2 alone or by co-implantation of 0.5 × 1016 He+/cm2 and 4 × 1016 H+/cm2. Our experimental results show that the blistering and exfoliation of the SiO2/Si3N4/GaAs layer occurred when the concentration of He+ was relatively low, where fewer dislocations and nanocavities were created near the interface between the Si3N4 and GaAs layers.

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