scholarly journals Switching Magnetization Magnetic Force Microscopy — An Alternative to Conventional Lift-Mode MFM

2011 ◽  
Vol 62 (1) ◽  
pp. 37-43 ◽  
Author(s):  
Vladimír Cambel ◽  
Dagmar Gregušová ◽  
Peter Eliáš ◽  
Ján Fedor ◽  
Ivan Kostič ◽  
...  
Keyword(s):  
Magnetic Properties ◽  
Magnetic Moment ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Switching Field ◽  
Force Microscopy ◽  
Lift Height ◽  
Domain State ◽  
Tapping Mode Afm ◽  
Sample Distance

Switching Magnetization Magnetic Force Microscopy — An Alternative to Conventional Lift-Mode MFM In the paper we present an overview of the latest progress in the conventional lift-mode magnetic force microscopy (MFM) technique, achieved by advanced MFM tips and by lowering the lift height. Although smaller lift height offers improved spatial resolution, we show that lowered tip-sample distance mixes magnetic, atomic and electric forces. We describe an alternative to the lift-mode procedure - Switching Magnetization Magnetic Force Microscopy [SM-MFM], which is based on two-pass scanning in tapping mode AFM with reversed tip magnetization between the scans. We propose design and calculate the magnetic properties of such SM-MFM tips. For best performance the tips must exhibit low magnetic moment, low switching field, and single-domain state at remanence. The switching field of such tips is calculated for Permalloy hexagons.

scholarly journals Quantitative Measurement of the Magnetic Moment of Individual Magnetic Nanoparticles by Magnetic Force Microscopy

Small ◽  
2012 ◽  
Vol 8 (17) ◽  
pp. 2675-2679 ◽  
Author(s):  
Sibylle Sievers ◽  
Kai-Felix Braun ◽  
Dietmar Eberbeck ◽  
Stefan Gustafsson ◽  
Eva Olsson ◽  
...  
Keyword(s):  
Magnetic Nanoparticles ◽  
Magnetic Moment ◽  
Magnetic Force Microscopy ◽  
Quantitative Measurement ◽  
Magnetic Force ◽  
Force Microscopy

Research and development of technology for laser configuration of sensitive element of fluxgate inclinometer

2019 ◽  
pp. 85-93
Author(s):  
O. S. Yulmetova ◽  
O. N. Poslyanova ◽  
A. G. Shcherbak ◽  
M. V. Zhukov
Keyword(s):  
Magnetic Properties ◽  
Laser Treatment ◽  
Magnetic Force Microscopy ◽  
Sensitive Element ◽  
Magnetic Force ◽  
Arrhenius Equation ◽  
Air Analysis ◽  
Force Microscopy ◽  
Oxidation Processes ◽  
Kinetic Assessment

The paper presents the results of thermodynamic analysis of oxidation processes occurring during laser treatment of amorphous magnetically sensitive ribbon (71KNSR) in air and in the atmosphere of argon. Kinetic assessment of the rate of chemical reactions is based on the Arrhenius equation. The results of analytical calculations show that the decrease of magnetic properties of the alloy after laser treatment in the air is mostly determined by the formation of iron oxides Fe2O3 and Fe2O4. Chemical elemental analysis of the composition of the samples after laser configuration in argon shows a significant decrease in their composition of oxygen compared to samples configured in the air. Analysis of samples using scanning electron and magnetic force microscopy confirms the preservation of the magnetic properties after treatment in argon. The developed technology is used for the manufacture of a sensitive element of a fluxgate inclinometer.

Fabrication of Tips for Magnetic Force Microscopy Employing Magnetic Multilayer Structures

2014 ◽  
Vol 605 ◽  
pp. 465-469
Author(s):  
Ryo Suzuki ◽  
Shinji Ishihara ◽  
Mitsuru Ohtake ◽  
Masaaki Futamoto
Keyword(s):  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Multilayer Film ◽  
Permanent Magnets ◽  
Magnetic Domain ◽  
Recording Media ◽  
Magnetic Multilayer ◽  
Magnetic Recording Media ◽  
Switching Field ◽  
Force Microscopy

Magnetic force microscope (MFM) tips are prepared by coating Si tips of 4 nm radius with [Co (1 nm)/M(1 nm)]20 (M = Pt, Pd, Ni) multilayer films. An MFM tip prepared by coating 40-nm-thick Co film is employed as a reference tip. The influences of M layer material on the spatial resolution and the switching field of MFM tip are investigated. The spatial resolutions of Co/M multilayer coated tips are estimated to be within 9.4 ± 0.3 nm for all the M materials, which is about 6% inferior to that of Co coated tip (8.8 nm). Higher switching fields of 1425 and 825 Oe are respectively observed for the tips coated with Co/Pt and Co/Pd multilayers, whereas the field of tip coated with Co/Ni multilayer is 275 Oe which is similar to that of Co coated tip (325 Oe). The switching field is influenced by the magnetic anisotropy of multilayer film. An MFM tip coated with Co/Pt multilayer film is useful to observe the magnetic domain structure of permanent magnets and magnetic recording media.

Features of Surface Morphology and Magnetic Properties of Sm0.5R0.5Fe2 (R = Tb, Gd) Compounds

2020 ◽  
Vol 312 ◽  
pp. 261-269
Author(s):  
Galina Aleksandrovna Politova ◽  
Tatiana P. Kaminskaya ◽  
Alexey Karpenkov ◽  
Nikolay Yu. Pankratov ◽  
Maksim Ganin ◽  
...  
Keyword(s):  
Magnetic Properties ◽  
Magnetic Force Microscopy ◽  
Room Temperature ◽  
Magnetic Force ◽  
Magnetic Domain ◽  
Surface Topology ◽  
Partial Replacement ◽  
Force Microscopy ◽  
Atomic Force ◽  
Comprehensive Study

A comprehensive study of the structure and phase composition, magnetostrictive and magnetic properties of the (Sm0.5R0.5)Fe2 (R = Gd, Tb) compounds was performed. The effect of partial replacement of samarium by gadolinium and terbium on the microstructure of the surface, the temperature of phase transitions, the magnitude of magnetostrictive deformations and magnetization was studied. Using atomic force and magnetic force microscopy, the surface topology at the micro and nanoscale was established, and information on the magnetic domain structure at room temperature was obtained.

Magnetic properties of thin MnGe films investigated by magnetic force microscopy

2004 ◽  
Vol 272-276 ◽  
pp. E1541-E1543 ◽  
Author(s):  
P. Castrucci ◽  
N. Pinto ◽  
L. Morresi ◽  
R. Gunnella ◽  
R. Murri ◽  
...  
Keyword(s):  
Magnetic Properties ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Force Microscopy

scholarly journals Magnetic Imaging of Encapsulated Superparamagnetic Nanoparticles by Data Fusion of Magnetic Force Microscopy and Atomic Force Microscopy Signals for Correction of Topographic Crosstalk

Nanomaterials ◽  
2020 ◽  
Vol 10 (12) ◽  
pp. 2486
Author(s):  
Marc Fuhrmann ◽  
Anna Musyanovych ◽  
Ronald Thoelen ◽  
Sibylle von Bomhard ◽  
Hildegard Möbius
Keyword(s):  
Atomic Force Microscopy ◽  
Magnetic Properties ◽  
Magnetic Nanoparticles ◽  
Data Fusion ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Capacitive Coupling ◽  
Phase Image ◽  
Force Microscopy ◽  
Atomic Force

Encapsulated magnetic nanoparticles are of increasing interest for biomedical applications. However, up to now, it is still not possible to characterize their localized magnetic properties within the capsules. Magnetic Force Microscopy (MFM) has proved to be a suitable technique to image magnetic nanoparticles at ambient conditions revealing information about the spatial distribution and the magnetic properties of the nanoparticles simultaneously. However, MFM measurements on magnetic nanoparticles lead to falsifications of the magnetic MFM signal due to the topographic crosstalk. The origin of the topographic crosstalk in MFM has been proven to be capacitive coupling effects due to distance change between the substrate and tip measuring above the nanoparticle. In this paper, we present data fusion of the topography measurements of Atomic Force Microscopy (AFM) and the phase image of MFM measurements in combination with the theory of capacitive coupling in order to eliminate the topographic crosstalk in the phase image. This method offers a novel approach for the magnetic visualization of encapsulated magnetic nanoparticles.

Magnetic properties of Ni‒Co-based thick films investigated with magnetic force microscopy

1997 ◽  
Vol 76 (4) ◽  
pp. 687-694 ◽  
Author(s):  
G. Bernardi ◽  
B. Mortenf ◽  
S. Pergolini ◽  
M. Prudenziati ◽  
G. Valdre
Keyword(s):  
Magnetic Properties ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Thick Films ◽  
Force Microscopy
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