AbstractWith promising properties of fast imaging speed, large field-of-view, relative low cost and many others, back-illuminated sCMOS cameras have been receiving intensive attentions for low-light imaging in the past several years. However, due to the pixel-to-pixel difference of camera noises (called noise non-uniformity) in sCMOS cameras, researchers may hesitate to use them in some application fields, and sometimes wonder whether they should optimize the noise non-uniformity of their sCMOS cameras before using them in a specific application scenario. In this paper, we systematically characterize the impact of different types of sCMOS noises on image quality and perform corrections to these sCMOS noises. We verify that it is possible to use appropriate correction methods to push the non-uniformity of major camera noises, including readout noise, offset, and photon response, to a satisfactory level for conventional microscopy and single molecule localization microscopy. We further find out that, after these corrections, global read noise becomes a major concern that limits the imaging performance of back-illuminated sCMOS cameras. We believe this study provides new insights into the understanding of camera noises in back-illuminated sCMOS cameras, and also provides useful information for future development of this promising camera technology.
Characterizing and correcting camera noises in back-illuminated sCMOS cameras