Normal momentum transfer on ideal crystalline surfaces

AIAA Journal ◽  
1971 ◽  
Vol 9 (5) ◽  
pp. 965-966 ◽  
Author(s):  
R. H. NOTTER ◽  
N. F. SATHER

AIAA Journal ◽  
1980 ◽  
Vol 18 (5) ◽  
pp. 602-605 ◽  
Author(s):  
Eldon L. Knuth


Author(s):  
C.J. Rossouw ◽  
L.J. Allen ◽  
P.R. Miller

An Einstein model for thermal diffuse scattering (TDS) has enabled quantitative calculation of the absorptive potential V'(r). This allows anomalous absorption to be accounted for in LACBED contrast. Fourier coefficients Vg-h of the absorptive component from each atom α are calculated from integrals of the formwhere fα is the scattering amplitude and M(Q) the Debye-Waller factor. Integration over the Ewald sphere (dΩ) requires the momentum transfer q to have values up to 2ko (the incident beam momentum). Dynamical ‘dechannelling’ is accounted for by the terms g ≠ h. The crystal absorptive potential is obtained by coherently summing over these atomic absorptive potentials within the unit cell. Unlike the elastic potential, the absorptive potential is a strong function of incident beam energy Eo, since the range of momentum transfer q and associated solid angles dΩ change with the Ewald sphere radius.Fig. 1 shows a LACBED pattern of the zeroth order beam from Si aligned along a <001> zone axis.



Author(s):  
William Krakow ◽  
Alec N. Broers

Low-loss scanning electron microscopy can be used to investigate the surface topography of solid specimens and provides enhanced image contrast over secondary electron images. A high resolution-condenser objective lens has allowed the low-loss technique to resolve separations of Au nucleii of 50Å and smaller dimensions of 25Å in samples coated with a fine grained carbon-Au-palladium layer. An estimate of the surface topography of fine grained vapor deposited materials (20 - 100Å) and the surface topography of underlying single crystal Si in the 1000 - 2000Å range has also been investigated. Surface imaging has also been performed on single crystals using diffracted electrons scattered through 10−2 rad in a conventional TEM. However, severe tilting of the specimen is required which degrades the resolution 15 to 100 fold due to image forshortening.







1978 ◽  
Vol 39 (C6) ◽  
pp. C6-330-C6-331 ◽  
Author(s):  
J. Gspann ◽  
H. Vollmar


1987 ◽  
Vol 48 (C9) ◽  
pp. C9-855-C9-858 ◽  
Author(s):  
V. MARCHETTI ◽  
C. FRANCK


Author(s):  
A. Jazdauskas ◽  
R. Slezas ◽  
Anupras Slanciauskas ◽  
Algis Dziugys


2002 ◽  
Author(s):  
Benoit Goyeau ◽  
Daniel Lhuillier ◽  
Dominique Gobin


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