Three Dimensional Simulation of Electric Field and MHD Power Generation During Re-Entry

2005 ◽  
Author(s):  
Tian Wan ◽  
Ryuta Suzuki ◽  
Graham Candler ◽  
Sergey Macheret ◽  
Mikhail Shneider
Keyword(s):  
Power Generation ◽  
Electric Field ◽  
Three Dimensional ◽  
Dimensional Simulation

Three-Dimensional Simulation of the Electric Field and Magnetohydrodynamic Power Generation During Reentry

AIAA Journal ◽  
2009 ◽  
Vol 47 (6) ◽  
pp. 1327-1336 ◽  
Author(s):  
Tian Wan ◽  
Graham V. Candler ◽  
Sergey O. Macheret ◽  
Mikhail N. Shneider
Keyword(s):  
Power Generation ◽  
Electric Field ◽  
Three Dimensional ◽  
Dimensional Simulation

Three-Dimensional Simulation of Planar Solid Oxide Fuel Cell Stack

2008 ◽  
Vol 128 (2) ◽  
pp. 459-466 ◽  
Author(s):  
Yoshitaka Inui ◽  
Tadashi Tanaka ◽  
Tomoyoshi Kanno
Keyword(s):  
Fuel Cell ◽  
Solid Oxide Fuel Cell ◽  
Three Dimensional ◽  
Solid Oxide ◽  
Oxide Fuel ◽  
Fuel Cell Stack ◽  
Dimensional Simulation

The Effect of Roughness Features on Mos Surface Electric Field and Fowler-Nordheim Tunneling Behavior

1997 ◽  
Vol 473 ◽  
Author(s):  
Heng-Chih Lin ◽  
Edwin C. Kan ◽  
Toshiaki Yamanaka ◽  
Simon J. Fang ◽  
Kwame N. Eason ◽  
...  
Keyword(s):  
Electric Field ◽  
Three Dimensional ◽  
Tunneling Current ◽  
Gate Oxide ◽  
Oxide Thickness ◽  
Interface Roughness ◽  
Normal Electric Field ◽  
Surface Electric Field ◽  
Tunneling Behavior ◽  
Nordheim Tunneling

ABSTRACTFor future CMOS GSI technology, Si/SiO2 interface micro-roughness becomes a non-negligible problem. Interface roughness causes fluctuations of the surface normal electric field, which, in turn, change the gate oxide Fowler-Nordheim tunneling behavior. In this research, we used a simple two-spheres model and a three-dimensional Laplace solver to simulate the electric field and the tunneling current in the oxide region. Our results show that both quantities are strong functions of roughness spatial wavelength, associated amplitude, and oxide thickness. We found that RMS roughness itself cannot fully characterize surface roughness and that roughness has a larger effect for thicker oxide in terms of surface electric field and tunneling behavior.

THREE-DIMENSIONAL SIMULATION OF EFFERVESCENT ATOMIZATION SPRAY

2009 ◽  
Vol 19 (1) ◽  
pp. 75-90 ◽  
Author(s):  
Hong-Bing Xiong ◽  
Jian-Zhong Lin ◽  
Ze-Fei Zhu
Keyword(s):  
Three Dimensional ◽  
Atomization Spray ◽  
Dimensional Simulation
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