AbstractWhile conventional X-ray signal readout systems can be used in connection with the electron probe analyzer, new readout techniques can be applied with advantage, particularly for scanning procedures. Several novel techniques involving photographic recordings of oscilloscope tracings will be described. These techniques are applicable to area scanning (enhanced concentration method, concentration mapping with use of X-ray signals, and target current concentration mapping procedures) as well as line scanning. Combinations of area-scanning images with line-scan registration ate used for representing line-scan results.By using operational amplifiers as signal adders, wavelength scans can be efficiently registered on a Polaroid photogram, with baseline indication and wavelength markers, in a single exposure. Another wavelength scanning technique registers the pulse height of the lines observed during the scanning operation, so that the order of reflection of the lines can be established. The use of an x-y recorder also offers advantages in the registration of line scans. Techniques for registration of multiple scans and for concentration mapping with the x-y recorder will be described.
Design of a CMOS x-ray line scan sensors