Electro-Optical Frequency Mapping Phase Image Simulation Technique for Failure Analysis

2017 ◽  
Author(s):  
Junpei Nonaka ◽  
Nakaba Matsui ◽  
Seiichi Honbu ◽  
Kazuki Shigeta ◽  
Yukihisa Funatsu
Keyword(s):  
Failure Analysis ◽  
Simulation Method ◽  
Simulation Technique ◽  
Phase Image ◽  
Optical Frequency ◽  
Image Simulation ◽  
Circuit Layout ◽  
Phase Images ◽  
Logic Cells

Abstract We propose a phase image simulation method for Electro-Optical Frequency Mapping (EOFM). The proposed method eases the matching of phase images and circuit layout data, which was previously difficult because phase images are very complex. Physical failure analysis based on this matching result is enabled. Further works are required for understandings of simulated phase images in compound logic cells having many states or high-Z states.

Determination of the Burgers vector of a dislocation in a Fe-Mn alloy by weak-beam image in HVEM

1978 ◽  
Vol 36 (1) ◽  
pp. 330-331
Author(s):  
Y. Ishida ◽  
H. Ishida ◽  
K. Kohra ◽  
H. Ichinose
Keyword(s):  
High Order ◽  
Simulation Technique ◽  
The Other ◽  
Image Simulation ◽  
Diffraction Vector ◽  
Burgers Vector ◽  
Weak Beam ◽  
Beam Image ◽  
Edge Component

IntroductionA simple and accurate technique to determine the Burgers vector of a dislocation has become feasible with the advent of HVEM. The conventional image vanishing technique(1) using Bragg conditions with the diffraction vector perpendicular to the Burgers vector suffers from various drawbacks; The dislocation image appears even when the g.b = 0 criterion is satisfied, if the edge component of the dislocation is large. On the other hand, the image disappears for certain high order diffractions even when g.b ≠ 0. Furthermore, the determination of the magnitude of the Burgers vector is not easy with the criterion. Recent image simulation technique is free from the ambiguities but require too many parameters for the computation. The weak-beam “fringe counting” technique investigated in the present study is immune from the problems. Even the magnitude of the Burgers vector is determined from the number of the terminating thickness fringes at the exit of the dislocation in wedge shaped foil surfaces.

scholarly journals Interferometric SAR Phase Denoising Using Proximity-Based K-SVD Technique

Sensors ◽  
2019 ◽  
Vol 19 (12) ◽  
pp. 2684
Author(s):  
Chandrakanta Ojha ◽  
Adele Fusco ◽  
Innocenzo M. Pinto
Keyword(s):  
Noise Reduction ◽  
Synthetic Data ◽  
Sar Interferometry ◽  
Phase Image ◽  
Redundant Representations ◽  
X Band ◽  
Interferometric Phase ◽  
Phase Images ◽  
Mt Etna ◽  
Interferometric Sar

This paper addresses the problem of interferometric noise reduction in Synthetic Aperture Radar (SAR) interferometry based on sparse and redundant representations over a trained dictionary. The idea is to use a Proximity-based K-SVD (ProK-SVD) algorithm on interferometric data for obtaining a suitable dictionary, in order to extract the phase image content effectively. We implemented this strategy on both simulated as well as real interferometric data for the validation of our approach. For synthetic data, three different training dictionaries have been compared, namely, a dictionary extracted from the data, a dictionary obtained by a uniform random distribution in [ − π , π ] , and a dictionary built from discrete cosine transform. Further, a similar strategy plan has been applied to real interferograms. We used interferometric data of various SAR sensors, including low resolution C-band ERS/ENVISAT, medium L-band ALOS, and high resolution X-band COSMO-SkyMed, all over an area of Mt. Etna, Italy. Both on simulated and real interferometric phase images, the proposed approach shows significant noise reduction within the fringe pattern, without any considerable loss of useful information.

scholarly journals Wave field reconstruction and phase imaging by electron diffractive imaging

Microscopy ◽  
2020 ◽  
Author(s):  
Jun Yamasaki
Keyword(s):  
Wave Field ◽  
Real Space ◽  
Phase Image ◽  
Phase Imaging ◽  
Diffractive Imaging ◽  
Diffraction Wave ◽  
Phase Images ◽  
Applicable Range ◽  
The Fourier Transform

Abstract In electron diffractive imaging, the phase image of a sample is reconstructed from its diffraction intensity through iterative calculations. The principle of this method is based on the Fourier transform relation between the real-space wave field transmitted by the sample and its Fraunhofer diffraction wave field. Since Gerchberg’s experimental work in 1972, various advancements have been achieved, which have substantially improved the quality of the reconstructed phase images and extended the applicable range of the method. In this review article, the principle of diffractive imaging, various experimental processes using electron beams and application to specific samples are explained in detail.

Validation of an image simulation technique for two computed radiography systems: An application to neonatal imaging

2010 ◽  
Vol 37 (5) ◽  
pp. 2092-2100 ◽  
Author(s):  
Kristien Smans ◽  
Dirk Vandenbroucke ◽  
Herman Pauwels ◽  
Lara Struelens ◽  
Filip Vanhavere ◽  
...  
Keyword(s):  
Computed Radiography ◽  
Simulation Technique ◽  
Image Simulation ◽  
Neonatal Imaging

Case Study on Abnormal Electron-Optical Frequency Mapping Phenomena in Failure Analysis

2018 ◽  
Author(s):  
Ang Li ◽  
Ryan Xiao ◽  
Max Guo ◽  
Jinglong Li ◽  
Binghai Liu
Keyword(s):  
Failure Analysis ◽  
Short Circuit ◽  
Mapping Technique ◽  
Optical Frequency ◽  
Substrate Noise ◽  
Noise Current ◽  
High Impedance ◽  
Laser Reflectance ◽  
Circuit Defects

Abstract In recent years, laser reflectance modulation measurements are widely used in failure analysis. Among them, EOFM (Electron-Optical Frequency Mapping) technique is easy to operate and very practical. In this article, some images with abnormal EOFM phenomena and their corresponding defects are showing up, the causes of those abnormal EOFM phenomena are also pointed out. They prove that EOFM function is very effective for discovering open or high-impedance defects on metal trace and pinpointing short-circuit defects. In addition to the two aspects above, there are also some abnormal EOFM phenomena we couldn’t explain perfectly. We studied one of them and proposed two possible causes of the anomaly. After simulation experiment and calculation, it could be basically determined that the abnormal EOFM phenomenon was caused by the substrate noise current.

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