scholarly journals FPGA-based switch-level fault emulation using modular-based dynamic partial reconfiguration

2021 ◽  
Author(s):  
Ming-Han Peter Lee

Fault simulation is a process of purposely injecting faults into a target circuit and observing a circuit's behavior in the presence of faulty logic. This observation helps designers to implement certain fault tolerance schemes thereby combating hardware failures. Fault simulation in most implementations has until now been software-based. Several fault emulation approaches have been proposed to accelerate fault simulation process using FPGA. There are generally two types of hardware fault injection: injector-based and reconfiguration-based. Injector-based methods require inserting fault injector circuitry into the circuit under test thus adding hardware overhead. On the other hand, reconfigurable-based methods require much less hardware overhead. However, these methods may be very slow because reconfiguring an entire FPGA device can take several seconds. This long confirmation time is usually the bottleneck of the emulation system. This project proposes a novel switch-level fault emulation system utilizing FPGA modular-based dynamic partial reconfiguration (DPR). In the proposed approach, faults are modeled at switch-level for an accurate fault list and mapped to gate-level for efficient synthesis. In addition, circuit-under-test is partitioned using an unbalanced tree structure to facilitate modular-based DPR. Modular-based DPR partitions a design into modules, and each module can be reconfigured independently without shutting down the FPGA. This capability is applied to fault injection where each circuit partition can be reconfigured individually without erasing the rest of FPGA. First a partial configuration bitstream representing the faulty partition is created. Fault injection can then be performed by downloading only this partial bitstream to FPGA, thereby eliminating the need for full-device reconfiguration and therefore reducing fault emulation runtime. This report presents both a theoretical explanation and the implementation details regarding this approach. Experimental results are also be provided. [sic]

2021 ◽  
Author(s):  
Ming-Han Peter Lee

Fault simulation is a process of purposely injecting faults into a target circuit and observing a circuit's behavior in the presence of faulty logic. This observation helps designers to implement certain fault tolerance schemes thereby combating hardware failures. Fault simulation in most implementations has until now been software-based. Several fault emulation approaches have been proposed to accelerate fault simulation process using FPGA. There are generally two types of hardware fault injection: injector-based and reconfiguration-based. Injector-based methods require inserting fault injector circuitry into the circuit under test thus adding hardware overhead. On the other hand, reconfigurable-based methods require much less hardware overhead. However, these methods may be very slow because reconfiguring an entire FPGA device can take several seconds. This long confirmation time is usually the bottleneck of the emulation system. This project proposes a novel switch-level fault emulation system utilizing FPGA modular-based dynamic partial reconfiguration (DPR). In the proposed approach, faults are modeled at switch-level for an accurate fault list and mapped to gate-level for efficient synthesis. In addition, circuit-under-test is partitioned using an unbalanced tree structure to facilitate modular-based DPR. Modular-based DPR partitions a design into modules, and each module can be reconfigured independently without shutting down the FPGA. This capability is applied to fault injection where each circuit partition can be reconfigured individually without erasing the rest of FPGA. First a partial configuration bitstream representing the faulty partition is created. Fault injection can then be performed by downloading only this partial bitstream to FPGA, thereby eliminating the need for full-device reconfiguration and therefore reducing fault emulation runtime. This report presents both a theoretical explanation and the implementation details regarding this approach. Experimental results are also be provided. [sic]


Author(s):  
G. Prasad Acharya ◽  
M. Asha Rani

<span>This paper presents a novel and efficient method of designing an online self-testable multi-core system. Testing of a Core Under Test (CoUT) in a massively multi-core system can be carried out while the system is operational, by assigning the functionality of the CoUT to one of the non-functioning/idle and pre-tested core. The methodology presented in this paper has been implemented taking a test setup by demonstrating the Dynamic Partial Reconfiguration (DPR) feature of latest FPGAs on Zynq-7 XC702 evaluation board. The simulation results obtained from the experimental setup show that the utilization of a multi-core system can be significantly improved by effectively utilizing the idle core(s) to back up CoUT(s) for on-line test without a significant hardware overhead and test latency.</span>


Author(s):  
Fakhreddine Ghaffari ◽  
Fouad Sahraoui ◽  
Mohamed El Amine Benkhelifa ◽  
Bertrand Granado ◽  
Marc Alexandre Kacou ◽  
...  

Author(s):  
Rommel Estores ◽  
Karo Vander Gucht

Abstract This paper discusses a creative manual diagnosis approach, a complementary technique that provides the possibility to extend Automatic Test Pattern Generation (ATPG) beyond its own limits. The authors will discuss this approach in detail using an actual case – a test coverage issue where user-generated ATPG patterns and the resulting ATPG diagnosis isolated the fault to a small part of the digital core. However, traditional fault localization techniques was unable to isolate the fault further. Using the defect candidates from ATPG diagnosis as a starting point, manual diagnosis through fault Injection and fault simulation was performed. Further fault localization was performed using the ‘not detected’ (ND) and/or ‘detected’ (DT) fault classes for each of the available patterns. The result has successfully deduced the defect candidates until the exact faulty net causing the electrical failure was identified. The ability of the FA lab to maximize the use of ATPG in combination with other tools/techniques to investigate failures in detail; is crucial in the fast root cause determination and, in case of a test coverage, aid in having effective test screen method implemented.


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