scholarly journals Development and Washing Reliability Testing of a Stretchable Circuit on Knit Fabric

2020 ◽  
Vol 10 (24) ◽  
pp. 9057
Author(s):  
Paula Veske ◽  
Pieter Bauwens ◽  
Frederick Bossuyt ◽  
Tom Sterken ◽  
Jan Vanfleteren

The smart textiles and wearable technology markets are expanding tirelessly, looking for efficient solutions to create long-lasting products. The research towards novel integration methods and increasing reliability of wearables and electronic textiles (e-textiles) is expanding. One obstacle to be tackled is the washability and the endurance to mechanical stresses in the washing machine. In this article, different layering of thermoplastic polyurethane (TPU) films and knit fabrics are used to integrate three different designs of stretchable copper-based meander tracks with printed circuit boards. The various combinations are washed according to the ISO 6330-2012 standard to analyze their endurance. Results suggest that one meander design withstands more washing cycles and indicate that the well-selected layer compositions increase the reliability. Higher stretchability together with greater durability is accomplished by adding an extra meander-shaped TPU film layer.

2008 ◽  
Vol 128 (11) ◽  
pp. 657-662 ◽  
Author(s):  
Tsuyoshi Maeno ◽  
Yukihiko Sakurai ◽  
Takanori Unou ◽  
Kouji Ichikawa ◽  
Osamu Fujiwara

2018 ◽  
Vol 23 (2) ◽  
pp. 141-148
Author(s):  
S.Sh. Rekhviashvili ◽  
◽  
M.O. Mamchuev ◽  
V.V. Narozhnov ◽  
M.M. Oshkhunov ◽  
...  

2013 ◽  
Vol 61 (3) ◽  
pp. 731-735
Author(s):  
A.W. Stadler ◽  
Z. Zawiślak ◽  
W. Stęplewski ◽  
A. Dziedzic

Abstract. Noise studies of planar thin-film Ni-P resistors made in/on Printed Circuit Boards, both covered with two different types of cladding or uncladded have been described. The resistors have been made of the resistive-conductive-material (Ohmega-Ply©) of 100 Ώ/sq. Noise of the selected pairs of samples has been measured in the DC resistance bridge with a transformer as the first stage in a signal path. 1/f noise caused by resistance fluctuations has been found to be the main noise component. Parameters describing noise properties of the resistors have been calculated and then compared with the parameters of other previously studied thin- and thick-film resistive materials.


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