scholarly journals Multi-Lens Array Full-Field X-ray Microscopy

2021 ◽  
Vol 11 (16) ◽  
pp. 7234
Author(s):  
Alexander Opolka ◽  
Dominik Müller ◽  
Christian Fella ◽  
Andreas Balles ◽  
Jürgen Mohr ◽  
...  
Keyword(s):  
Ray Tracing ◽  
Numerical Aperture ◽  
Field Of View ◽  
Cone Beam ◽  
Photon Flux ◽  
Full Field ◽  
X Ray ◽  
Ray Tracing Simulation ◽  
Metal Jet ◽  
Proof Of Principle

X-ray full-field microscopy at laboratory sources for photon energies above 10 keV suffers from either long exposure times or low resolution. The photon flux is mainly limited by the objectives used, having a limited numerical aperture NA. We show that this can be overcome by making use of the cone-beam illumination of laboratory sources by imaging the same field of view (FoV) several times under slightly different angles using an array of X-ray lenses. Using this technique, the exposure time can be reduced drastically without any loss in terms of resolution. A proof-of-principle is given using an existing laboratory metal-jet source at the 9.25 keV Ga Kα-line and compared to a ray-tracing simulation of the setup.

Influence of surface relaxation on the contrast of threading edge dislocations in synchrotron X-ray topographs under the condition of g · b = 0 and g · b × l = 0

2021 ◽  
Vol 54 (2) ◽  
Author(s):  
Hongyu Peng ◽  
Tuerxun Ailihumaer ◽  
Fumihiro Fujie ◽  
Zeyu Chen ◽  
Balaji Raghothamachar ◽  
...  
Keyword(s):  
Ray Tracing ◽  
Depth Profiling ◽  
Simulation Method ◽  
Surface Relaxation ◽  
X Ray ◽  
Relaxation Effects ◽  
Orientation Contrast ◽  
Relaxation Depth ◽  
Edge Dislocations ◽  
Ray Tracing Simulation

Residual contrast of threading edge dislocations is observed in synchrotron back-reflection X-ray topographs of 4H-SiC epitaxial wafers recorded using basal plane reflections where both g · b = 0 and g · b × l = 0. The ray-tracing simulation method based on the orientation contrast formation mechanism is applied to simulate images of such dislocations by applying surface relaxation effects. The simulated contrast features match the observed features on X-ray topographs, clearly demonstrating that the contrast is dominated by surface relaxation. Depth profiling indicates that the surface relaxation primarily takes place within a depth of 5 µm below the surface.

scholarly journals Photon flux determination of a liquid-metal jet X-ray source by means of photon scattering

2019 ◽  
Vol 34 (7) ◽  
pp. 1497-1502 ◽  
Author(s):  
Malte Wansleben ◽  
Claudia Zech ◽  
Cornelia Streeck ◽  
Jan Weser ◽  
Christoph Genzel ◽  
...  
Keyword(s):  
Electron Beam ◽  
Liquid Metal ◽  
Power Density ◽  
Photon Flux ◽  
Beam Power ◽  
Photon Scattering ◽  
X Ray ◽  
Metal Anode ◽  
Metal Jet

Liquid-metal jet X-ray sources promise to deliver high photon fluxes, which are unprecedented for laboratory based X-ray sources, because the regenerating liquid-metal anode is less sensitive to damage caused by an increased electron beam power density.

Studies of c-Axis Threading Screw Dislocations in Hexagonal SiC

2008 ◽  
Vol 1069 ◽  
Author(s):  
Yi Chen ◽  
Xianrong Huang ◽  
Ning Zhang ◽  
Govindhan Dhanaraj ◽  
Edward Sanchez ◽  
...  
Keyword(s):  
Ray Tracing ◽  
Grazing Incidence ◽  
Screw Dislocations ◽  
Burgers Vector ◽  
X Ray ◽  
Back Reflection ◽  
Partial Dislocations ◽  
Ray Tracing Simulation ◽  
Vector Magnitude

ABSTRACTIn our study, closed-core threading screw dislocations and micropipes were studied using synchrotron x-ray topography of various geometries. The Burgers vector magnitude of TSDs can be quantitatively determined from their dimensions in back-reflection x-ray topography, based on ray-tracing simulation and this has been verified by the images of elementary TSDs. Dislocation senses of closed-core threading screw dislocations and micropipes can be revealed by grazing-incidence x-ray topography. The threading screw dislocations can be converted into Frank partial dislocations on the basal planes and this has been confirmed by transmission synchrotron x-ray topography.

Raytracing simulation and Augrids experimental test on spatial resolution of KBA Xray microscope

2011 ◽  
Vol 23 (9) ◽  
pp. 2415-2417
Author(s):  
董建军 Dong Jianjun ◽  
杨正华 Yang Zhenghua ◽  
曹柱荣 Cao Zhurong ◽  
韦敏习 Wei Minxi ◽  
詹夏宇 Zhan Xiayu ◽  
...  
Keyword(s):  
Ray Tracing ◽  
Spatial Resolution ◽  
Experimental Test ◽  
X Ray ◽  
Ray Tracing Simulation

Characterization of Threading Dislocations in PVT-Grown AlN Substrates via x-Ray Topography and Ray Tracing Simulation

2014 ◽  
Vol 43 (4) ◽  
pp. 838-842 ◽  
Author(s):  
Tianyi Zhou ◽  
Balaji Raghothamachar ◽  
Fangzhen Wu ◽  
Rafael Dalmau ◽  
Baxter Moody ◽  
...  
Keyword(s):  
Ray Tracing ◽  
Threading Dislocations ◽  
X Ray ◽  
Ray Tracing Simulation

Investigation of Dislocations in 6H-SiC Axial Samples Using Synchrotron X-Ray Topography and Ray Tracing Simulation

2021 ◽  
Vol MA2021-02 (34) ◽  
pp. 1006-1006
Author(s):  
Hongyu Peng ◽  
Yafei Liu ◽  
Tuerxun Ailihumaer ◽  
Balaji Raghothamachar ◽  
Michael Dudley ◽  
...  
Keyword(s):  
Ray Tracing ◽  
X Ray ◽  
Ray Tracing Simulation

scholarly journals Simulating and optimizing compound refractive lens-based X-ray microscopes

2017 ◽  
Vol 24 (2) ◽  
pp. 392-401 ◽  
Author(s):  
Hugh Simons ◽  
Sonja Rosenlund Ahl ◽  
Henning Friis Poulsen ◽  
Carsten Detlefs
Keyword(s):  
Focal Length ◽  
Numerical Aperture ◽  
Chromatic Aberration ◽  
Matrix Analysis ◽  
Full Field ◽  
X Ray ◽  
Transfer Matrix Analysis ◽  
Thick Lens ◽  
Lens Material ◽  
Analytical Expressions

A comprehensive optical description of compound refractive lenses (CRLs) in condensing and full-field X-ray microscopy applications is presented. The formalism extends ray-transfer matrix analysis by accounting for X-ray attenuation by the lens material. Closed analytical expressions for critical imaging parameters such as numerical aperture, spatial acceptance (vignetting), chromatic aberration and focal length are provided for both thin- and thick-lens imaging geometries. These expressions show that the numerical aperture will be maximized and chromatic aberration will be minimized at the thick-lens limit. This limit may be satisfied by a range of CRL geometries, suggesting alternative approaches to improving the resolution and efficiency of CRLs and X-ray microscopes.

Spherical Crystal Based on X-Ray Fluorescence Imaging with High Spectral Resolution and Full Field of View

2019 ◽  
Vol 39 (11) ◽  
pp. 1134001
Author(s):  
谭伯仲 Tan Bozhong ◽  
阳庆国 Yang Qingguo ◽  
杜亮亮 Du Liangliang ◽  
安然 An Ran ◽  
刘冬兵 Liu Dongbing ◽  
...  
Keyword(s):  
Fluorescence Imaging ◽  
Spectral Resolution ◽  
Field Of View ◽  
High Spectral Resolution ◽  
Full Field ◽  
X Ray ◽  
Spherical Crystal
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