scholarly journals Simulating and optimizing compound refractive lens-based X-ray microscopes

2017 ◽  
Vol 24 (2) ◽  
pp. 392-401 ◽  
Author(s):  
Hugh Simons ◽  
Sonja Rosenlund Ahl ◽  
Henning Friis Poulsen ◽  
Carsten Detlefs
Keyword(s):  
Focal Length ◽  
Numerical Aperture ◽  
Chromatic Aberration ◽  
Matrix Analysis ◽  
Full Field ◽  
X Ray ◽  
Transfer Matrix Analysis ◽  
Thick Lens ◽  
Lens Material ◽  
Analytical Expressions

A comprehensive optical description of compound refractive lenses (CRLs) in condensing and full-field X-ray microscopy applications is presented. The formalism extends ray-transfer matrix analysis by accounting for X-ray attenuation by the lens material. Closed analytical expressions for critical imaging parameters such as numerical aperture, spatial acceptance (vignetting), chromatic aberration and focal length are provided for both thin- and thick-lens imaging geometries. These expressions show that the numerical aperture will be maximized and chromatic aberration will be minimized at the thick-lens limit. This limit may be satisfied by a range of CRL geometries, suggesting alternative approaches to improving the resolution and efficiency of CRLs and X-ray microscopes.

scholarly journals CALCULATION OF THE ACHROMATIC DIFFRACTION SYSTEM WITH CORRECTED SPHERICAL ABERRATION (part 2)

2020 ◽  
Vol 8 (1) ◽  
pp. 127-133
Author(s):  
Yury Ts. Batomunkuev ◽  
Alexandra A. Pechenkina
Keyword(s):  
Spherical Aberration ◽  
Focal Length ◽  
Optical Element ◽  
Diffraction Order ◽  
Image Plane ◽  
Chromatic Aberration ◽  
Real Image ◽  
Optical Elements ◽  
A Value ◽  
Analytical Expressions

Achromatization of a three-component diffraction system consisting of one thick and two thin hologram optical elements is considered in the work. Analytical expressions are obtained for correcting the chromatic aberration of the position of a thick focusing hologram optical element by two scattering thin hologram optical elements in a given spectrum range. It is shown that achromatization is achieved for such a three-component system using two thin hologram elements located symmetrically on both sides of the thick element and having a value of the working diffraction order greater than the ratio of the focal length to the distance from the thin element to the image plane (at a given wavelength). The proposed three-component holographic system can be used to convert both an imaginary image into a real image and a real into an imaginary image in predetermined spectral regions of the visible, ultraviolet or infrared ranges of the spectrum.

scholarly journals COMPUTED TOMOGRAPHY OF CRYOGENIC CELLS

2002 ◽  
Vol 09 (01) ◽  
pp. 177-183 ◽  
Author(s):  
G. SCHNEIDER ◽  
E. ANDERSON ◽  
S. VOGT ◽  
C. KNÖCHEL ◽  
D. WEISS ◽  
...  
Keyword(s):  
Computed Tomography ◽  
Radiation Damage ◽  
Three Dimensional ◽  
Numerical Aperture ◽  
X Rays ◽  
Full Field ◽  
X Ray ◽  
Specific Proteins ◽  
Male Specific ◽  
In Cells

Soft X-ray microscopy has resolved 30 nm structures in biological cells. To protect the cells from radiation damage caused by X-rays, imaging of the samples has to be performed at cryogenic temperatures, which makes it possible to take multiple images of a single cell. Due to the small numerical aperture of zone plates, X-ray objectives have a depth of focus on the order of several microns. By treating the X-ray microscopic images as projections of the sample absorption, computed tomography (CT) can be performed. Since cryogenic biological samples are resistant to radiation damage, it is possible to reconstruct frozen-hydrated cells imaged with a full-field X-ray microscope. This approach is used to obtain three-dimensional information about the location of specific proteins in cells. To localize proteins in cells, immunolabeling with strongly X-ray absorbing nanoparticles was performed. With the new tomography setup developed for the X-ray microscope XM-1 installed at the ALS, we have performed tomography of immunolabeled frozen-hydrated cells to detect protein distributions inside of cells. As a first example, the distribution of the nuclear protein male-specific lethal 1 (MSL-1) in the Drosophila melanogaster cell was studied.

scholarly journals 50-nm-resolution full-field X-ray microscope without chromatic aberration using total-reflection imaging mirrors

2017 ◽  
Vol 7 (1) ◽  
Author(s):  
Satoshi Matsuyama ◽  
Shuhei Yasuda ◽  
Jumpei Yamada ◽  
Hiromi Okada ◽  
Yoshiki Kohmura ◽  
...  
Keyword(s):  
Chromatic Aberration ◽  
Total Reflection ◽  
Full Field ◽  
X Ray ◽  
Reflection Imaging

scholarly journals Multi-Lens Array Full-Field X-ray Microscopy

2021 ◽  
Vol 11 (16) ◽  
pp. 7234
Author(s):  
Alexander Opolka ◽  
Dominik Müller ◽  
Christian Fella ◽  
Andreas Balles ◽  
Jürgen Mohr ◽  
...  
Keyword(s):  
Ray Tracing ◽  
Numerical Aperture ◽  
Field Of View ◽  
Cone Beam ◽  
Photon Flux ◽  
Full Field ◽  
X Ray ◽  
Ray Tracing Simulation ◽  
Metal Jet ◽  
Proof Of Principle

X-ray full-field microscopy at laboratory sources for photon energies above 10 keV suffers from either long exposure times or low resolution. The photon flux is mainly limited by the objectives used, having a limited numerical aperture NA. We show that this can be overcome by making use of the cone-beam illumination of laboratory sources by imaging the same field of view (FoV) several times under slightly different angles using an array of X-ray lenses. Using this technique, the exposure time can be reduced drastically without any loss in terms of resolution. A proof-of-principle is given using an existing laboratory metal-jet source at the 9.25 keV Ga Kα-line and compared to a ray-tracing simulation of the setup.

scholarly journals Translative lens-based full-field coherent X-ray imaging

2020 ◽  
Vol 27 (1) ◽  
pp. 119-126
Author(s):  
Carsten Detlefs ◽  
Mario Alejandro Beltran ◽  
Jean-Pierre Guigay ◽  
Hugh Simons
Keyword(s):  
Numerical Aperture ◽  
Objective Lens ◽  
X Rays ◽  
Resolution Limit ◽  
Radiation Dose Rate ◽  
Full Field ◽  
X Ray ◽  
X Ray Imaging ◽  
Imaging Approach ◽  
Potential Benefits

A full-field coherent imaging approach suitable for hard X-rays based on a classical (i.e. Galilean) X-ray microscope is described. The method combines a series of low-resolution images acquired at different transverse lens positions into a single high-resolution image, overcoming the spatial resolution limit set by the numerical aperture of the objective lens. The optical principles of the approach are described, the successful reconstruction of simulated phantom data is demonstrated, and aspects of the reconstruction are discussed. The authors believe that this approach offers some potential benefits over conventional scanning X-ray ptychography in terms of spatial bandwidth and radiation dose rate.

CRL-based ultra-compact transfocator for X-ray focusing and microscopy

2019 ◽  
Vol 26 (4) ◽  
pp. 1208-1212 ◽  
Author(s):  
Anton Narikovich ◽  
Maxim Polikarpov ◽  
Alexander Barannikov ◽  
Nataliya Klimova ◽  
Anatoly Lushnikov ◽  
...  
Keyword(s):  
Mechanical Stability ◽  
Focal Length ◽  
Light Weight ◽  
Two Dimensional ◽  
Full Field ◽  
X Ray ◽  
The Individual ◽  
High Mechanical Stability

A new ultra-compact transfocator (UCTF) based on X-ray compound refractive lenses (CRLs) is presented. The device can be used to change the number of one- and two-dimensional focusing CRLs by moving the individual parabolic lenses one-by-one independently, thus providing permanent energy and focal-length tunability for scanning and full-field X-ray microscopy applications. The small overall size and light weight of the device allow it to be integrated in any synchrotron beamline, while even simplifying the experimental layout. The UCTF was tested at the Excillium MetalJet microfocus X-ray source and at the P14 EMBL (PETRA-III) beamline, demonstrating high mechanical stability and lens positioning repeatability.

The Reduction of Chromatic Aberrations Due to Instrumental Instabilities

1971 ◽  
Vol 29 ◽  
pp. 14-15
Author(s):  
J. S. Lally ◽  
R. Evans
Keyword(s):  
Electron Microscope ◽  
High Voltage ◽  
Focal Length ◽  
Chromatic Aberration ◽  
Objective Lens ◽  
Usual Practice ◽  
Voltage Electron ◽  
Short Focal Length ◽  
Chromatic Aberrations ◽  
Electron Microscopes

One of the instrumental factors often limiting the resolution of the electron microscope is image defocussing due to changes in accelerating voltage or objective lens current. This factor is particularly important in high voltage electron microscopes both because of the higher voltages and lens currents required but also because of the inherently longer focal lengths, i.e. 6 mm in contrast to 1.5-2.2 mm for modern short focal length objectives.The usual practice in commercial electron microscopes is to design separately stabilized accelerating voltage and lens supplies. In this case chromatic aberration in the image is caused by the random and independent fluctuations of both the high voltage and objective lens current.

Improvements in the electron probe forming capabilities and x-ray hole counts in the Philips TEM

1983 ◽  
Vol 41 ◽  
pp. 376-377
Author(s):  
Richard L. McConville
Keyword(s):  
Field Strength ◽  
Electron Probe ◽  
Spherical Aberration ◽  
Focal Length ◽  
Objective Lens ◽  
Parallel Beam ◽  
Tilt Axis ◽  
X Ray ◽  
Small Probe ◽  
Specimen Height

A second generation twin lens has been developed. This symmetrical lens with a wider bore, yet superior values of chromatic and spherical aberration for a given focal length, retains both eucentric ± 60° tilt movement and 20°x ray detector take-off angle at 90° to the tilt axis. Adjust able tilt axis height, as well as specimen height, now ensures almost invariant objective lens strengths for both TEM (parallel beam conditions) and STEM or nano probe (focused small probe) modes.These modes are selected through use of an auxiliary lens situ ated above the objective. When this lens is on the specimen is illuminated with a parallel beam of electrons, and when it is off the specimen is illuminated with a focused probe of dimensions governed by the excitation of the condenser 1 lens. Thus TEM/STEM operation is controlled by a lens which is independent of the objective lens field strength.

Comparison of Deterministic and Linear Cosine Spatial Filtering of Transmission Electron Micrographs

1972 ◽  
Vol 30 ◽  
pp. 596-597
Author(s):  
David A. Ansley
Keyword(s):  
Spherical Aberration ◽  
Focal Length ◽  
Chromatic Aberration ◽  
Spatial Filter ◽  
Operating Conditions ◽  
Objective Lens ◽  
List Type ◽  
Spatial Filters ◽  
Transmission Electron ◽  
Wide Range

The coherence of the electron flux of a transmission electron microscope (TEM) limits the direct application of deconvolution techniques which have been used successfully on unmanned spacecraft programs. The theory assumes noncoherent illumination. Deconvolution of a TEM micrograph will, therefore, in general produce spurious detail rather than improved resolution.A primary goal of our research is to study the performance of several types of linear spatial filters as a function of specimen contrast, phase, and coherence. We have, therefore, developed a one-dimensional analysis and plotting program to simulate a wide 'range of operating conditions of the TEM, including adjustment of the:(1) Specimen amplitude, phase, and separation(2) Illumination wavelength, half-angle, and tilt(3) Objective lens focal length and aperture width(4) Spherical aberration, defocus, and chromatic aberration focus shift(5) Detector gamma, additive, and multiplicative noise constants(6) Type of spatial filter: linear cosine, linear sine, or deterministic

The CM120 Biotwin: a high-contrast objective lens, optimum cryo-vacuum and improved EDX performance

1995 ◽  
Vol 53 ◽  
pp. 584-585
Author(s):  
Uwe Lücken ◽  
Michael Felsmann ◽  
Wim M. Busing ◽  
Frank de Jong
Keyword(s):  
Life Science ◽  
Focal Length ◽  
Objective Lens ◽  
High Contrast ◽  
Contrast Imaging ◽  
X Ray ◽  
Forming Mechanism ◽  
Similar Image ◽  
High Contrast Imaging ◽  
Low Concentrations

A new microscope for the study of life science specimen has been developed. Special attention has been given to the problems of unstained samples, cryo-specimens and x-ray analysis at low concentrations.A new objective lens with a Cs of 6.2 mm and a focal length of 5.9 mm for high-contrast imaging has been developed. The contrast of a TWIN lens (f = 2.8 mm, Cs = 2 mm) and the BioTWTN are compared at the level of mean and SD of slow scan CCD images. Figure 1a shows 500 +/- 150 and Fig. 1b only 500 +/- 40 counts/pixel. The contrast-forming mechanism for amplitude contrast is dependent on the wavelength, the objective aperture and the focal length. For similar image conditions (same voltage, same objective aperture) the BioTWIN shows more than double the contrast of the TWIN lens. For phasecontrast specimens (like thin frozen-hydrated films) the contrast at Scherzer focus is approximately proportional to the √ Cs.

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