Raytracing simulation and Augrids experimental test on spatial resolution of KBA Xray microscope

Residual contrast of threading edge dislocations is observed in synchrotron back-reflection X-ray topographs of 4H-SiC epitaxial wafers recorded using basal plane reflections where both g · b = 0 and g · b × l = 0. The ray-tracing simulation method based on the orientation contrast formation mechanism is applied to simulate images of such dislocations by applying surface relaxation effects. The simulated contrast features match the observed features on X-ray topographs, clearly demonstrating that the contrast is dominated by surface relaxation. Depth profiling indicates that the surface relaxation primarily takes place within a depth of 5 µm below the surface.

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Ray-tracing simulations of a bent crystal X-ray optics for imaging using laser–plasma X-ray sources

Laser and Particle Beams ◽

10.1017/s0263034604223072 ◽

2004 ◽

Vol 22 (3) ◽

pp. 253-259 ◽

Cited By ~ 8

Author(s):

L. LABATE ◽

M. GALIMBERTI ◽

A. GIULIETTI ◽

D. GIULIETTI ◽

L.A. GIZZI ◽

...

Keyword(s):

Ray Tracing ◽

Spatial Resolution ◽

Laser Plasma ◽

Imaging System ◽

Complex Pattern ◽

Careful Study ◽

Ray Optics ◽

X Ray ◽

Bent Crystal ◽

Laser Produced Plasma

Ray-tracing simulations of an optical X-ray system based on a spherically bent crystal operating in Bragg configuration for monochromatic projection imaging of thin samples are presented, obtained using a code developed for that purpose. The code is particularly suited for characterizing experimental arrangements routinely used with laser-produced plasma X-ray sources. In particular, the spatial resolution of the imaging system was investigated and a careful study of the complex pattern of the X-ray backlighting beam was performed.

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Studies of c-Axis Threading Screw Dislocations in Hexagonal SiC

MRS Proceedings ◽

10.1557/proc-1069-d02-03 ◽

2008 ◽

Vol 1069 ◽

Author(s):

Yi Chen ◽

Xianrong Huang ◽

Ning Zhang ◽

Govindhan Dhanaraj ◽

Edward Sanchez ◽

...

Keyword(s):

Ray Tracing ◽

Grazing Incidence ◽

Screw Dislocations ◽

Burgers Vector ◽

X Ray ◽

Back Reflection ◽

Partial Dislocations ◽

Ray Tracing Simulation ◽

Vector Magnitude

ABSTRACTIn our study, closed-core threading screw dislocations and micropipes were studied using synchrotron x-ray topography of various geometries. The Burgers vector magnitude of TSDs can be quantitatively determined from their dimensions in back-reflection x-ray topography, based on ray-tracing simulation and this has been verified by the images of elementary TSDs. Dislocation senses of closed-core threading screw dislocations and micropipes can be revealed by grazing-incidence x-ray topography. The threading screw dislocations can be converted into Frank partial dislocations on the basal planes and this has been confirmed by transmission synchrotron x-ray topography.

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Characterization of Threading Dislocations in PVT-Grown AlN Substrates via x-Ray Topography and Ray Tracing Simulation

Journal of Electronic Materials ◽

10.1007/s11664-013-2968-2 ◽

2014 ◽

Vol 43 (4) ◽

pp. 838-842 ◽

Cited By ~ 15

Author(s):

Tianyi Zhou ◽

Balaji Raghothamachar ◽

Fangzhen Wu ◽

Rafael Dalmau ◽

Baxter Moody ◽

...

Keyword(s):

Ray Tracing ◽

Threading Dislocations ◽

X Ray ◽

Ray Tracing Simulation

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Investigation of Dislocations in 6H-SiC Axial Samples Using Synchrotron X-Ray Topography and Ray Tracing Simulation

ECS Meeting Abstracts ◽

10.1149/ma2021-02341006mtgabs ◽

2021 ◽

Vol MA2021-02 (34) ◽

pp. 1006-1006

Author(s):

Hongyu Peng ◽

Yafei Liu ◽

Tuerxun Ailihumaer ◽

Balaji Raghothamachar ◽

Michael Dudley ◽

...

Keyword(s):

Ray Tracing ◽

X Ray ◽

Ray Tracing Simulation

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3D ray-tracing simulation of X-ray laser amplification

Journal de Physique IV (Proceedings) ◽

10.1051/jp4:2001258 ◽

2001 ◽

Vol 11 (PR2) ◽

pp. Pr2-305-Pr2-308

Author(s):

M. Temporal ◽

S. Jacquemot ◽

L. Bonnet ◽

A. Decoster

Keyword(s):

Ray Tracing ◽

X Ray ◽

Laser Amplification ◽

3D Ray Tracing ◽

Ray Tracing Simulation

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Multi-Lens Array Full-Field X-ray Microscopy

Applied Sciences ◽

10.3390/app11167234 ◽

2021 ◽

Vol 11 (16) ◽

pp. 7234

Author(s):

Alexander Opolka ◽

Dominik Müller ◽

Christian Fella ◽

Andreas Balles ◽

Jürgen Mohr ◽

...

Keyword(s):

Ray Tracing ◽

Numerical Aperture ◽

Field Of View ◽

Cone Beam ◽

Photon Flux ◽

Full Field ◽

X Ray ◽

Ray Tracing Simulation ◽

Metal Jet ◽

Proof Of Principle

X-ray full-field microscopy at laboratory sources for photon energies above 10 keV suffers from either long exposure times or low resolution. The photon flux is mainly limited by the objectives used, having a limited numerical aperture NA. We show that this can be overcome by making use of the cone-beam illumination of laboratory sources by imaging the same field of view (FoV) several times under slightly different angles using an array of X-ray lenses. Using this technique, the exposure time can be reduced drastically without any loss in terms of resolution. A proof-of-principle is given using an existing laboratory metal-jet source at the 9.25 keV Ga Kα-line and compared to a ray-tracing simulation of the setup.

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Highly efficient, easily spectrally tunable X-ray backlighting for the study of extreme matter states

Laser and Particle Beams ◽

10.1017/s0263034609990322 ◽

2009 ◽

Vol 27 (4) ◽

pp. 601-609 ◽

Cited By ~ 10

Author(s):

B. Loupias ◽

F. Perez ◽

A. Benuzzi-Mounaix ◽

N. Ozaki ◽

M. Rabec ◽

...

Keyword(s):

Energy Density ◽

Ray Tracing ◽

Spatial Resolution ◽

Normal Incidence ◽

High Energy ◽

High Energy Density ◽

High Luminosity ◽

X Ray ◽

High Energy Density Physics ◽

Bent Crystal

AbstractAn improved high luminosity, easily spectrally tunable backlighting scheme based on a spherically bent crystal is considered in this paper. Contrary to the traditional backlighting scheme, we used crystal far from normal incidence, and the backlighter source was inside the Rowland circle. With the presented configuration, we obtained a spatial resolution up to 8 µm in the desired direction with an X-ray backlighting energy close to 5 keV. Detailed discussions and ray-tracing calculations show that with this convenient scheme resolution down to 5 µm can be achieved. A dedicated application to high energy density physics is presented: the radiography of shock compressed matter.

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