Test for Reliability for Mission Critical Applications
Keyword(s):
The Real
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Test for Reliability is a test flow where an Integrated Circuit (IC) device is continuously stressed under several corner conditions that can be dynamically adapted based on the real-time observation of the critical signals of the device during the evolution of the test. We present our approach for a successful Test-for-Reliability flow, going beyond the objectives of the traditional reliability approach, and covering the entire process from design to failure analysis.