scholarly journals Quantitative Phase Analysis of Skarn Rocks by the Rietveld Method Using X-ray Powder Diffraction Data

Minerals ◽  
2020 ◽  
Vol 10 (10) ◽  
pp. 894
Author(s):  
Yana Tzvetanova ◽  
Ognyan Petrov ◽  
Thomas Kerestedjian ◽  
Mihail Tarassov
Keyword(s):  
Powder Diffraction ◽  
Diffraction Data ◽  
Rietveld Method ◽  
Rietveld Analysis ◽  
Quantitative Phase Analysis ◽  
Chemical Compositions ◽  
Powder Diffraction Data ◽  
X Ray ◽  
Fine Grained ◽  
Variable Chemical

The Rietveld method using X-ray powder diffraction data was applied to selected skarn samples for quantitative determination of the present minerals. The specimens include garnet, clinopyroxene–garnet, plagioclase–clinopyroxene–wollastonite–garnet, plagioclase–clinopyroxene–wollastonite, plagioclase–clinopyroxene–wollastonite–epidote, and plagioclase–clinopyroxene skarns. The rocks are coarse- to fine-grained and characterized by an uneven distribution of the constituent minerals. The traditional methods for quantitative analysis (point-counting and norm calculations) are not applicable for such inhomogeneous samples containing minerals with highly variable chemical compositions. Up to eight individual mineral phases have been measured in each sample. To obtain the mineral quantities in the skarn rocks preliminary optical microscopy and chemical investigation by electron probe microanalysis (EPMA) were performed for the identification of some starting components for the Rietveld analysis and to make comparison with the Rietveld X-ray powder diffraction results. All of the refinements are acceptable, as can be judged by the standard indices of agreement and by the visual fits of the observed and calculated diffraction profiles. A good correlation between the refined mineral compositions and the data of the EPMA measurements was achieved.

Crystallographic study of ternary ordered skutterudite IrGe1.5Se1.5

2010 ◽  
Vol 25 (3) ◽  
pp. 247-252 ◽  
Author(s):  
F. Laufek ◽  
J. Návrátil
Keyword(s):  
Crystal Structure ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Rietveld Method ◽  
Crystallographic Data ◽  
Powder Diffraction Data ◽  
X Ray ◽  
Crystallographic Study ◽  
Related Phase ◽  
The Ideal

The crystal structure of skutterudite-related phase IrGe1.5Se1.5 has been refined by the Rietveld method from laboratory X-ray powder diffraction data. Refined crystallographic data for IrGe1.5Se1.5 are a=12.0890(2) Å, c=14.8796(3) Å, V=1883.23(6) Å3, space group R3 (No. 148), Z=24, and Dc=8.87 g/cm3. Its crystal structure can be derived from the ideal skutterudite structure (CoAs3), where Se and Ge atoms are ordered in layers perpendicular to the [111] direction of the original skutterudite cell. Weak distortions of the anion and cation sublattices were also observed.

Rietveld Refinement of the BaTiO3 from X-Ray Powder Diffraction

2009 ◽  
Vol 79-82 ◽  
pp. 593-596
Author(s):  
Feng Sun ◽  
Yan Sheng Yin
Keyword(s):  
Rietveld Refinement ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Rietveld Method ◽  
Structural Parameters ◽  
Ferroelectric Ceramic ◽  
Powder Diffraction Data ◽  
Ceramic Powders ◽  
Space Group ◽  
X Ray

The ferroelectric ceramic BaTiO3 was synthesized at 1000 °C for 5 h. The structure of the system under study was refined on the basis of X-ray powder diffraction data using the Rietveld method. The system crystallizes in the space group P4mm（99）. The refinement of instrumental and structural parameters led to reliable values for the Rp, Rwp and Rexp.We use the TOPAS software of Bruker AXS to refine this ceramic powders and show its conformation

Structure Refinements of the Layered Intergrowth Phases SbIIISbV x A 1−x TiO6 (x≃0, A = Ta, Nb) Using Synchrotron X-ray Powder Diffraction Data

1997 ◽  
Vol 53 (6) ◽  
pp. 861-869 ◽  
Author(s):  
C. D. Ling ◽  
J. G. Thompson ◽  
S. Schmid ◽  
D. J. Cookson ◽  
R. L. Withers
Keyword(s):  
Single Crystal ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Homologous Series ◽  
Rietveld Method ◽  
Powder Diffraction Data ◽  
X Ray Diffraction ◽  
Synchrotron Source ◽  
X Ray ◽  
The Family

The structures of the layered intergrowth phases SbIIISb^{\rm V}_xAl-xTiO6 (x \simeq 0, A = Ta, Nb) have been refined by the Rietveld method, using X-ray diffraction data obtained using a synchrotron source. The starting models for these structures were derived from those of Sb^{\rm III}_3Sb^{\rm V}_xA 3−xTiO14 (x = 1.26, A = Ta and x = 0.89, A = Nb), previously solved by single-crystal X-ray diffraction. There were no significant differences between the derived models and the final structures, validating the approach used to obtain the models and confirming that the n = 1 and n = 3 members of the family, Sb^{\rm III}_nSb^{\rm V}_xA n−xTiO4n+2 are part of a structurally homologous series.

Structure Refinement of High-Density Polyethylene Using X-Ray Powder Diffraction Data and the Rietveld Method

1995 ◽  
Vol 39 ◽  
pp. 515-521
Author(s):  
Kenneth B. Schwartz ◽  
Robert B. Von Dreele
Keyword(s):  
Powder Diffraction ◽  
Diffraction Data ◽  
High Density Polyethylene ◽  
Rietveld Method ◽  
Structure Refinement ◽  
High Density ◽  
Powder Diffraction Data ◽  
X Ray ◽  
Voigt Profile ◽  
Full Structure

A full structure analysis of a completely crystallized sample of high-density polyethylene (HDPE) has been achieved using x-ray powder diffraction data collected on a laboratory-based powder diffractometer. The structure refinement is performed using the Rietveld method and includes refinement of the carbon and hydrogen atomic positions and temperature factors. The C-C and C-H bond distances and the C-C-C bond angle along the polyethylene chain have been calculated from the refined atomic positions and are in very good agreement with previous experimental and modelling determinations. Evaluations of the pseudo-Voigt profile parameters for Lorentzian strain broadening and me Scherrer coefficient for Gaussian broadening yield reasonable values for microstrain and particle size for this sample. Refinement of the preferred orientation parameter indicates that the HDPE flakes consist of platy crystals or lamellae that are packed normal to the diffraction vector.

X-Ray Powder Diffraction Data and Crystal Refinement of Ternary Compound Ti4ZrSi3

2020 ◽  
Vol 841 ◽  
pp. 99-102
Author(s):  
Liu Qing Liang ◽  
Yan Ying Wei ◽  
De Gui Li
Keyword(s):  
Ternary Compound ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Rietveld Method ◽  
Structure Refinement ◽  
Structure Type ◽  
Hexagonal Structure ◽  
Powder Diffraction Data ◽  
Tungsten Electrode ◽  
X Ray

Ternary compound Ti4ZrSi3 was prepared by arc melting using a non-consumable tungsten electrode under argon atmosphere, then annealed at 1023K for 30 days, the X-ray powder diffraction data of Ti4ZrSi3 was collected on a Rigaku SmartLab X-ray powder diffractometer. The powder patterns of the compound were indexed and structure refinement by using Rietveld method indicate that the Ti4ZrSi3 compound crystallizes in the hexagonal structure, space group P6/mcm (No.193) with Mn5Si3 structure type, a=b=7.5759(3) Ǻ, c=5.2162(2) Ǻ, V=259.28Ǻ3, Z=2, ρx=4.779g cm-3, the Smith–Snyder FOM F30=148.7(0.0064, 46) and the intensity ratio RIR=1.37. The Rietveld refinement results were Rp = 0.0836, Rwp= 0.1092.

Powder diffraction data of two tricydic diazonia diiodide salts used in silver iodide solid electrolytes

1993 ◽  
Vol 8 (3) ◽  
pp. 175-179
Author(s):  
J. Estienne ◽  
O. Cerclier ◽  
J. J. Rosenberg
Keyword(s):  
Crystal Structure ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Silver Iodide ◽  
Solid Electrolytes ◽  
Rietveld Method ◽  
Powder Diffraction Data ◽  
Organic Salts ◽  
X Ray ◽  
Structure Determinations

Indexed X-ray powder diffraction data are reported for two organic salts with carbon rings having two quaternary nitrogens: diazonia-6,9 dispiro [5.2.5.2] hexadecane and diazonia-6,9 dispiro [5.2.5.3] heptadecane diiodides. For these compounds, which give solid electrolytes when associated with AgI, powder diffraction diagrams calculated by the Rietveld method from single crystal structure determinations are presented and are compared to the experimental diffraction data.

Update in a Rietveld analysis program for x-ray powder spectro-diffractometry

2003 ◽  
Vol 18 (1) ◽  
pp. 32-35 ◽  
Author(s):  
Yanan Xiao ◽  
Fujio Izumi ◽  
Timothy Graber ◽  
P. James Viccaro ◽  
Dale E. Wittmer
Keyword(s):  
Computer Program ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Rietveld Analysis ◽  
Anomalous Scattering ◽  
Analysis Program ◽  
Powder Diffraction Data ◽  
X Ray ◽  
Synchrotron Light ◽  
Diffraction Patterns

A computer program for refining anomalous scattering factors using x-ray powder diffraction data was revised on the basis of the latest version of a versatile pattern-fitting system, RIETAN-2000. The effectiveness of the resulting program was confirmed by applying it to simulated and measured powder-diffraction patterns of Mn3O4 taken at a synchrotron light source.

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