Transport in Thermal Dip Pen Nanolithography

Author(s):  
Brent A. Nelson ◽  
Tanya L. Wright ◽  
William P. King ◽  
Paul E. Sheehan ◽  
Lloyd J. Whitman

The manufacture of nanoscale devices is at present constrained by the resolution limits of optical lithography and the high cost of electron beam lithography. Furthermore, traditional silicon fabrication techniques are quite limited in materials compatibility and are not well-suited for the manufacture of organic and biological devices. One nanomanufacturing technique that could overcome these drawbacks is dip pen nanolithography (DPN), in which a chemical-coated atomic force microscope (AFM) tip deposits molecular ‘inks’ onto a substrate [1]. DPN has shown resolution as good as 5 nm [2] and has been performed with a large number of molecules, but has limitations. For molecules to ink the surface they must be mobile at room temperature, limiting the inks that can be used, and since the inks must be mobile in ambient conditions, there is no way to stop the deposition while the tip is in contact with the substrate. In-situ imaging of deposited molecules therefore causes contamination of the deposited features.

Sensors ◽  
2019 ◽  
Vol 19 (8) ◽  
pp. 1794 ◽  
Author(s):  
Sangmin An ◽  
Wonho Jhe

We introduce a nanopipette/quartz tuning fork (QTF)–atomic force microscope (AFM) for nanolithography and a nanorod/QTF–AFM for nanoscratching with in situ detection of shear dynamics during performance. Capillary-condensed nanoscale water meniscus-mediated and electric field-assisted small-volume liquid ejection and nanolithography in ambient conditions are performed at a low bias voltage (~10 V) via a nanopipette/QTF–AFM. We produce and analyze Au nanoparticle-aggregated nanowire by using nanomeniscus-based particle stacking via a nanopipette/QTF–AFM. In addition, we perform a nanoscratching technique using in situ detection of the mechanical interactions of shear dynamics via a nanorod/QTF–AFM with force sensor capability and high sensitivity.


2020 ◽  
Vol 10 (8) ◽  
pp. 2807
Author(s):  
Dmitriy Yavorskiy ◽  
Maria Szoła ◽  
Krzysztof Karpierz ◽  
Rafał Bożek ◽  
Rafał Rudniewski ◽  
...  

The cyclotron and magnetoplasmon resonances were studied at 2 K in grating metamaterials fabricated on wafers with one or two modulation doped CdTe/CdMgTe quantum wells. The gratings (with the period varied between 2 μ m and 8 μ m) were prepared with an electron beam lithography either by etching or by evaporation of Au. The gratings were studied with an atomic force microscope which revealed a correlation between the depth and width of etched grooves at a constant time of etching. The sharpest resonances observed are due to excitation of magnetoplasmon in the case of Au gratings on a wafer with one quantum well. Etched samples with two quantum wells showed the strongest tuneability of magnetoplasmon resonances with the period of the grating and illumination with white light. We showed that the samples studied can be used as resonant or quasi-resonant terahertz detectors tuneable with magnetic field and white light.


2016 ◽  
Vol 87 (11) ◽  
pp. 113703 ◽  
Author(s):  
Alexei Temiryazev ◽  
Sergey I. Bozhko ◽  
A. Edward Robinson ◽  
Marina Temiryazeva

2003 ◽  
Vol 83 (6) ◽  
pp. 1163-1165 ◽  
Author(s):  
M. C. Rogge ◽  
C. Fühner ◽  
U. F. Keyser ◽  
R. J. Haug ◽  
M. Bichler ◽  
...  

Author(s):  
William P. King ◽  
Brent A. Nelson ◽  
Tanya L. Wright ◽  
Paul A. Sheehan ◽  
Lloyd J. Whitman

Thermal dip pen nanolithography (tDPN) is a nanolithography technique that leverages previous advances in dip pen nanolithography and the design and fabrication of heated atomic force microscope cantilevers. In tDPN a heated atomic force microscope cantilever tip deposits high-melting temperature materials from the tip onto a surface. This technique is distinct from conventional DPN in that the ink molecules are not mobile at room temperature, allowing local control of deposition allowing the tip to be used for metrology of written features without contamination. tDPN represents an advancement in nanometer-scale lithography and manufacturing, which could enable the rapid prototyping and economical manufacture of nanodevices.


2016 ◽  
Vol 23 (5) ◽  
pp. 1110-1117 ◽  
Author(s):  
M. V. Vitorino ◽  
Y. Fuchs ◽  
T. Dane ◽  
M. S. Rodrigues ◽  
M. Rosenthal ◽  
...  

A compact high-speed X-ray atomic force microscope has been developed forin situuse in normal-incidence X-ray experiments on synchrotron beamlines, allowing for simultaneous characterization of samples in direct space with nanometric lateral resolution while employing nanofocused X-ray beams. In the present work the instrument is used to observe radiation damage effects produced by an intense X-ray nanobeam on a semiconducting organic thin film. The formation of micrometric holes induced by the beam occurring on a timescale of seconds is characterized.


FEBS Letters ◽  
1996 ◽  
Vol 390 (2) ◽  
pp. 161-164 ◽  
Author(s):  
S. Allen ◽  
J. Davies ◽  
A.C. Dawkes ◽  
M.C. Davies ◽  
J.C. Edwards ◽  
...  

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