Relationship between Yield Loss and Flooding during Middle and Later Growth Periods in Hybrid Rice

2016 ◽  
Vol 42 (9) ◽  
pp. 1381
Author(s):  
Fu-Xian XU ◽  
Lin ZHANG ◽  
Hong XIONG ◽  
Xing-Bing ZHOU ◽  
Yong-Chuan ZHU ◽  
...  
Keyword(s):  
2018 ◽  
Vol 55 (04) ◽  
pp. 637-648 ◽  
Author(s):  
MIN HUANG ◽  
SHUANGLÜ SHAN ◽  
XIAOBING XIE ◽  
XUEFENG ZHOU ◽  
YINGBIN ZOU ◽  
...  

SUMMARYTransplanting single seedlings rather than seedlings in clumps has been increasingly attractive in hybrid rice production in China due to reduced seed requirements and higher grain yield. This study was conducted to determine grain yield and nitrogen (N) utilization in response to reductions in the N rate in hybrid rice under single-seedling transplanting. Field experiments were done in 2015 and 2016 on a moderate to high fertility soil at the Experimental Farm of Hunan Agricultural University, China. The hybrid rice cultivar Liangyoupeijiu (LYPJ) was used in 2015, and two hybrid cultivars LYPJ and Xiangliangyou 900 were used the next year. In each year, the rice plants transplanted with a single seedling per hill were grown with three N rates, including the usual N rate (150 kg ha–1) and two reduced N rates (120 and 90 kg ha–1). Grain yield, yield attributes, and N uptake and use efficiency were determined for each N rate. Significant reduction in grain yield was observed in only one of three cultivar-year combinations when N rate was reduced by 20% (from 150 to 120 kg ha–1), and the magnitude of yield reduction was only 4%. Although significant reduction in grain yield was observed in two of the three cultivar-year combinations when N rate reduced by 40% (to 90 kg ha–1), the highest yield reduction was only 7%. Yield attributes were generally changed slightly when N rate was reduced by 20%, while compensation among yield attributes and N utilization characteristics could explain why a 40% reduction in N rate did not result in substantial yield loss. Partial factor productivity of applied N (PFPN) was increased by 21–24% and 56–63% with 20% and 40% reductions in the N rate, respectively. The higher PFPN with a reduced N rate was attributed to higher recovery efficiency of applied N (REN) or to both higher REN and internal N use efficiency. Our study suggests that reducing N rate does not necessarily result in yield loss due to compensation among yield components and increased N use efficiency in hybrid rice transplanted as single seedlings under moderate to high soil fertility conditions.


TAPPI Journal ◽  
2013 ◽  
Vol 12 (10) ◽  
pp. 33-41 ◽  
Author(s):  
BRIAN N. BROGDON

This investigation evaluates how higher reaction temperatures or oxidant reinforcement of caustic extraction affects chlorine dioxide consumption during elemental chlorine-free bleaching of North American hardwood pulps. Bleaching data from the published literature were used to develop statistical response surface models for chlorine dioxide delignification and brightening sequences for a variety of hardwood pulps. The effects of higher (EO) temperature and of peroxide reinforcement were estimated from observations reported in the literature. The addition of peroxide to an (EO) stage roughly displaces 0.6 to 1.2 kg chlorine dioxide per kilogram peroxide used in elemental chlorine-free (ECF) bleach sequences. Increasing the (EO) temperature by Δ20°C (e.g., 70°C to 90°C) lowers the overall chlorine dioxide demand by 0.4 to 1.5 kg. Unlike what is observed for ECF softwood bleaching, the presented findings suggest that hot oxidant-reinforced extraction stages result in somewhat higher bleaching costs when compared to milder alkaline extraction stages for hardwoods. The substitution of an (EOP) in place of (EO) resulted in small changes to the overall bleaching cost. The models employed in this study did not take into account pulp bleaching shrinkage (yield loss), to simplify the calculations.


1970 ◽  
Vol 19 (2) ◽  
pp. 181-187
Author(s):  
MR Islam ◽  
PK Saha ◽  
SK Zaman ◽  
MJ Uddin

Five phosphorus rates (0, 5, 10, 20 and 30 kg P/ha) were tested with four rice genotypes in Boro (BRRI dhan36, BRRI dhan45, EH1 and EH2) and T. Aman (BRRI dhan30, BRRI dhan49, EH1 and EH2) season. Phosphorus rates did not influence grain yield irrespective of varieties in T. Aman season while in Boro season P response was observed among the P rates. Application of P @ 10 kg/ha significantly increased the grain yield. But when P was applied @ 20 and 30 kg P/ha, the grain yield difference was not significant. The optimum and economic rate of P for T. Aman was 20 kg P/ha but in Boro rice the optimum and economic doses of P were 22 and 30 kg/ha, respectively. Hybrid entries (EH1 and EH2) used P more efficiently than inbred varieties. A negative P balance was observed up to 10 kg P/ha. Key words: Response; Phosphorus fertilizer; Inbred; Hybrid rice DOI: http://dx.doi.org/10.3329/dujbs.v19i2.8962 DUJBS 2010; 19(2): 181-187


2012 ◽  
Vol 3 (7) ◽  
pp. 11-13
Author(s):  
Arpita Shrivastava ◽  
◽  
D. K. Mishra D. K. Mishra ◽  
G. K. Koutu G. K. Koutu ◽  
S. K. Singh S. K. Singh

2019 ◽  
Vol 51 (6) ◽  
Author(s):  
Zhonghua Sheng ◽  
Sajid Fiaz ◽  
Qianlong Li ◽  
Wei Chen ◽  
Xiangjin Wei ◽  
...  

Author(s):  
Satish Kodali ◽  
Chen Zhe ◽  
Chong Khiam Oh

Abstract Nanoprobing is one of the key characterization techniques for soft defect localization in SRAM. DC transistor performance metrics could be used to identify the root cause of the fail mode. One such case report where nanoprobing was applied to a wafer impacted by significant SRAM yield loss is presented in this paper where standard FIB cross-section on hard fail sites and top down delayered inspection did not reveal any obvious defects. The authors performed nanoprobing DC characterization measurements followed by capacitance-voltage (CV) measurements. Two probe CV measurement was then performed between the gate and drain of the device with source and bulk floating. The authors identified valuable process marginality at the gate to lightly doped drain overlap region. Physical characterization on an inline split wafer identified residual deposits on the BL contacts potentially blocking the implant. Enhanced cleans for resist removal was implemented as a fix for the fail mode.


Author(s):  
Wing Chiu Tam ◽  
Osei Poku ◽  
R. D. (Shawn) Blanton

Abstract Systematic defects due to design-process interactions are a dominant component of integrated circuit (IC) yield loss in nano-scaled technologies. Test structures do not adequately represent the product in terms of feature diversity and feature volume, and therefore are unable to identify all the systematic defects that affect the product. This paper describes a method that uses diagnosis to identify layout features that do not yield as expected. Specifically, clustering techniques are applied to layout snippets of diagnosis-implicated regions from (ideally) a statistically-significant number of IC failures for identifying feature commonalties. Experiments involving an industrial chip demonstrate the identification of possible systematic yield loss due to lithographic hotspots.


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