scholarly journals Wideband Transimpedance Amplifiers for Optoelectronics: Applications to Dynamic Interferometry

Elektron ◽  
2017 ◽  
Vol 1 (1) ◽  
pp. 16-22 ◽  
Author(s):  
Lucas Matías Riobó ◽  
Francisco Ezequiel Veiras ◽  
María Teresa Garea ◽  
Patricio Anibal Sorichetti
Keyword(s):  
Transimpedance Amplifiers ◽  
Dynamic Interferometry

Este artículo describe el diseño y desempeño de amplificadores de transimpedancia (TIAs) para optoelectrónica, optimizados para su uso en aplicaciones de interferometría óptica dinámica. Para desarrollar el análisis de los amplificadores, mostramos algunos esquemas experimentales donde se utilizan distintas topologías. En cada esquema desarrollado, describiremos la relevancia de cada TIA, mencionando lineamientos y consideraciones de diseño.

scholarly journals Phase Stability under Thermal Drifts in Photodiode-Conditioning Transimpedance Amplifiers for Distance Metrology

Sensors ◽  
2021 ◽  
Vol 21 (10) ◽  
pp. 3455
Author(s):  
Francisco Javier Meca Meca ◽  
Ernesto Martín-Gorostiza ◽  
Miguel Ángel García-Garrido ◽  
David Salido-Monzú
Keyword(s):  
Delay Time ◽  
Measurement Errors ◽  
Continuous Wave ◽  
Signal To Noise Ratio ◽  
Circuit Board ◽  
Transimpedance Amplifiers ◽  
Optical Distance ◽  
High Measurement ◽  
Analytic Expressions ◽  
Measured Distance

Transimpedance amplifiers (TIA) are widely used for front-end signal conditioning in many optical distance measuring applications in which high accuracy is often required. Small effects due to the real characteristics of the components and the parasitic elements in the circuit board may cause the error to rise to unacceptable levels. In this work we study these effects on the TIA delay time error and deduce analytic expressions, taking into account the trade-off between the uncertainties caused by the delay time instability and by the signal-to-noise ratio. A specific continuous-wave phase-shift case study is shown to illustrate the analysis, and further compared with real measurements. General strategies and conclusions, useful for designers of this kind of system, are extracted too. The study and results show that the delay time thermal stability is a key determinant factor in the measured distance accuracy and, without an adequate design, moderate temperature variations of the TIA can cause extremely high measurement errors.

Dynamic interferometry method for measuring wavelength

2021 ◽  
Author(s):  
Mykhajlo Sakhnovskyj ◽  
Miroslav Strinadko ◽  
Mickolay M. Dominikov ◽  
Bogdan Tymochko
Keyword(s):  
Interferometry Method ◽  
Dynamic Interferometry
Sign in / Sign up

Export Citation Format

Share Document