A study on the radiation resistance of CdWO4 thin-film scintillators deposited by using an electron-beam physical vapor deposition method

2016 ◽  
Vol 69 (5) ◽  
pp. 734-738
Author(s):  
Seyong Park ◽  
Young Soo Yoon
2006 ◽  
Vol 38 (6) ◽  
pp. 651-658 ◽  
Author(s):  
O. N. Gerasimchuk ◽  
G. A. Sergienko ◽  
V. I. Bondarchuk ◽  
A. V. Terukov ◽  
Yu. S. Nalimov ◽  
...  

2017 ◽  
Vol 52 (12) ◽  
pp. 1700229 ◽  
Author(s):  
Zhixian Wei ◽  
Hui Song ◽  
Chenghu Dai ◽  
Zhen Chen ◽  
Xueyu Yan ◽  
...  

2011 ◽  
Vol 25 (19) ◽  
pp. 2567-2574 ◽  
Author(s):  
M. YEGANEH ◽  
M. SAREMI

Electron beam physical vapor deposition (EBPVD) is being used in coating components for many applications such as for producing nanostructures and integrated circuits (ICs) coating in electronic industry. In this work, copper was deposited on the SiO 2/p-type Si (100). Thin film characteristics are investigated by scanning electron microscopy and X-ray diffraction (XRD). Then oxidation behavior of deposits was evaluated by Dektak Surface Profiler and weight gain method at 200 and 300°C. Results showed that thin film copper deposited by EBPVD has better oxidation characteristics in comparison with copper foil.


2007 ◽  
Vol 121-123 ◽  
pp. 287-290 ◽  
Author(s):  
Ke Feng Cai ◽  
Q. Lei ◽  
C. Yan ◽  
L.C. Zhang

Te nanomaterials, with different morphologies, such as nanospheres, micro- and nanobranches, and microtrees with tubular nanobranches were prepared by physical vapor deposition method, using elemental Te powder as starting material. The composition and morphology of the nanomaterials were characterized by XRD, SEM/EDX and TEM. The formation mechanism of the above mentioned nanostructures was proposed.


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