Microwave annealing, a low-thermal-budget process for dopant activation in phosphorus-implanted MOSFET devices

2016 ◽  
Vol 69 (5) ◽  
pp. 762-766
Author(s):  
Cheol-Min Lim ◽  
Won-Ju Cho
2013 ◽  
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Author(s):  
Chur-Shyang Fuh ◽  
Po-Tsun Liu ◽  
Li-Feng Teng ◽  
Sih-Wei Huang ◽  
Yao-Jen Lee ◽  
...  

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Hiroshi Ikenoue ◽  
Mitsuo Sakashita ◽  
Osamu Nakatsuka ◽  
Shigeaki Zaima ◽  
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1988 ◽  
Vol 131 ◽  
Author(s):  
J. W. Rogers ◽  
D. S. Blair ◽  
C. H. F. Peden

ABSTRACTThin silicon nitride films on a Si(100) substrate have been oxidized using potassium in a low thermal budget process. The presence of potassium on the SisN4 surface greatly lowers the temperature-time requirements for oxidation as compared with direct thermal oxidation.


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