THE EFFECTS OF MORPHOLOGY STRUCTURE FOR COPPER PHTHALOCYANINE SENSORS DETECT TO ORGANIC ACID

2009 ◽  
Vol 21 (06) ◽  
pp. 467-470 ◽  
Author(s):  
Jin-Chi Hsieh

The copper phthalocyanine ( CuPc ) thin film gas sensors detect to organic acids that its detection behaviors will be affected morphology with quartz crystal microbalance (QCM) method. The amorphous structure has looser surface and finer particles; therefore, it has smaller surface area. Although it has more active sites to adsorb acid molecular, it gets smaller value of frequency change (Δf) than α-phase morphology. The β-phase morphology has the largest surface area, so it gets the smallest value of Δf. The response behavior is more rapid than recovery behavior with any morphology CuPc thin film gas sensors. The film surface of amorphous structure has more porous, it has faster response time and recovery time than other structures. The β-phase morphology can get slowest response and recovery time. The results show that the CuPc thin film gas sensors detect to organic acid behavior, for example methyl acid and ethyl acid, etc.; it was affected to its surface morphology change.

2007 ◽  
Vol 62 (12) ◽  
pp. 761-768
Author(s):  
Chao-Chen Yang ◽  
Min-Fong Shu

We have utilized ZnCl2-dimethylsulfone (DMSO2) as the electrolyte with added GdCl3, FeCl2, and CoCl2, for electrodepositing a perpendicular GdFeCo magnetic thin film. The reaction at the electrode surface and the electrical conductivity of the ionic substance at different ionic concentrations were studied by cyclic voltammetry and a computerized direct current method. Moreover, the electrodeposition of the GdFeCo thin film was determined by a pulse potential method. Relation between the composition of the deposited thin film and control parameters including applied potentials was determined by EDS analysis. An amorphous structure and the thickness of the thin film were obtained by TEM analysis. Its roughness and uniformity were determined by AFM analysis. Meanwhile, a perpendicular magnetic property and pinning magnetic domain of the thin film were analyzed from results of AGM and MFM.


2000 ◽  
Vol 657 ◽  
Author(s):  
Youngman Kim ◽  
Sung-Ho Choo

ABSTRACTThe mechanical properties of thin film materials are known to be different from those of bulk materials, which are generally overlooked in practice. The difference in mechanical properties can be misleading in the estimation of residual stress states in micro-gas sensors with multi-layer structures during manufacturing and in service.In this study the residual stress of each film layer in a micro-gas sensor was measured according to the five difference sets of film stacking structure used for the sensor. The Pt thin film layer was found to have the highest tensile residual stress, which may affect the reliability of the micro-gas sensor. For the Pt layer the changes in residual stress were measured as a function of processing variables and thermal cycling.


2000 ◽  
Vol 375 (1-2) ◽  
pp. 142-146 ◽  
Author(s):  
Dae-Sik Lee ◽  
Ki-Hong Nam ◽  
Duk-Dong Lee

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