Characterization of Titanium Oxide Thin Films Produced by Plasma Immersion Ion Implantation for Biomedical Implants

2007 ◽  
pp. 673-676
Author(s):  
E.T. Uzumaki ◽  
C.S. Lambert
Keyword(s):  
Thin Films ◽  
Ion Implantation ◽  
Titanium Oxide ◽  
Biomedical Implants ◽  
Oxide Thin Films ◽  
Plasma Immersion Ion Implantation

X-ray, optical and electrical characterization of doped nanocrystalline titanium oxide thin films

2004 ◽  
Vol 109 (1-3) ◽  
pp. 249-251 ◽  
Author(s):  
J Domaradzki ◽  
E.L Prociow ◽  
D Kaczmarek ◽  
T Berlicki ◽  
A Podhorodecki ◽  
...  
Keyword(s):  
Thin Films ◽  
Titanium Oxide ◽  
Electrical Characterization ◽  
Oxide Thin Films ◽  
X Ray ◽  
Nanocrystalline Titanium

Characterization of Titanium Oxide Thin Films Produced by Plasma Immersion Ion Implantation for Biomedical Implants

2007 ◽  
Vol 361-363 ◽  
pp. 673-676
Author(s):  
E.T. Uzumaki ◽  
C.S. Lambert
Keyword(s):  
Thin Films ◽  
Ion Implantation ◽  
Titanium Oxide ◽  
Biological Properties ◽  
X Ray Diffraction ◽  
Tio2 Thin Films ◽  
Hip Joints ◽  
Force Microscopy ◽  
Atomic Force ◽  
Plasma Immersion Ion Implantation

Plasma immersion ion implantation (PIII) is a very attractive method for the surface treatment of titanium hard tissue replacements such as hip joints and enhancement of the mechanical, chemical and biological properties of titanium. It has been considered as an alternative to form protective and hard oxide films on titanium and titanium-based implants. In this study, titanium oxide (TiO2) thin films were formed on titanium using PIII, which produces films with adhesion superior to those prepared with conventional techniques. The films were analysed by atomic force microscopy (AFM), X-ray diffraction (XRD) and pull test.

scholarly journals Characterization of Birefringent Titanium-Oxide Thin Films Deposited by DC Sputtering

2017 ◽  
Vol 12 (1) ◽  
pp. 42-46
Author(s):  
H. P. De Araújo ◽  
S. G. Dos Santos Filho
Keyword(s):  
Thin Films ◽  
Titanium Oxide ◽  
Narrow Band ◽  
Polarized Light ◽  
Oxide Thin Films ◽  
Tio2 Thin Films ◽  
Dc Sputtering ◽  
Fabry Perot ◽  
Light Beams

This work presents the characterization of birefringent properties of titanium-oxide thin films using spectrophotometry and double-cavity Fabry-Perot structures. All films were deposited by DC sputtering over tilted substrates and the birefringence was characterized as a function of the deposition angle by the numerical difference between the refractive indexes for s- and p-polarized light beams. As a result, the highest value of birefringence (0.03) was obtained for samples tilted at 21º (having the normal axis as reference). A polarizing narrow-band Fabry-Perot filter centered at 400 and 700nm was designed by means of numerical simulations of the multilayer structures using a MATLAB© toolbox to solve the classical optical equations. Using this designed double-cavity Fabry-Perot structure [Ag(40nm) / TiO2(160nm) / Ag(40nm) / TiO2(164nm) / Ag(40nm)], transmittance ratios (Tp/Ts) for p- and s-polarized light beams resulted 1.70 at a wavelength of 699nm and 1.36 at another wavelength of 393nm (centers of the two narrow-band peaks), which corroborated the birefringent characteristics of the nearly-stoichiometric titania (TiO2) thin films.

Spray pyrolysis deposition and characterization of titanium oxide thin films

2003 ◽  
Vol 77 (3) ◽  
pp. 938-944 ◽  
Author(s):  
L Castañeda ◽  
J.C Alonso ◽  
A Ortiz ◽  
E Andrade ◽  
J.M Saniger ◽  
...  
Keyword(s):  
Thin Films ◽  
Spray Pyrolysis ◽  
Titanium Oxide ◽  
Oxide Thin Films ◽  
Spray Pyrolysis Deposition

Characterization of titanium oxide thin films anodically grown in phosphoric acid

2004 ◽  
Vol 29 (4) ◽  
pp. 105-114-103
Author(s):  
Mohy-eddine Khadiri ◽  
Abdelaziz Benyaïch ◽  
Amane Oueriagli ◽  
Abdelkhader Outzourhit ◽  
El Hassani Lahcen Ameziane
Keyword(s):  
Thin Films ◽  
Phosphoric Acid ◽  
Titanium Oxide ◽  
Oxide Thin Films

Structural and dielectric characterization of sputtered Tantalum Titanium Oxide thin films for high temperature capacitor applications

2016 ◽  
Vol 606 ◽  
pp. 127-132 ◽  
Author(s):  
A. Rouahi ◽  
F. Challali ◽  
I. Dakhlaoui ◽  
C. Vallée ◽  
S. Salimy ◽  
...  
Keyword(s):  
Thin Films ◽  
High Temperature ◽  
Titanium Oxide ◽  
Oxide Thin Films ◽  
Dielectric Characterization

Synthesis and characterization of tin (IV) oxide thin films

2021 ◽  
Vol 53 (5) ◽  
Author(s):  
M. Rahayi ◽  
M. H. Ehsani ◽  
Agnes C. Nkele ◽  
M. M. Shahidi ◽  
Fabian I. Ezema
Keyword(s):  
Thin Films ◽  
Synthesis And Characterization ◽  
Oxide Thin Films
Sign in / Sign up

Export Citation Format

Share Document